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Index by Author: Volume 72, Issue 4 (October 2001) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tomio [Abstract] [Full Text]; Abolhoda, Amir [Abstract] [Full Text]; Aitouche, Abdelouahab [Abstract] [Full Text]; Alamanni, Francesco [Abstract] [Full Text]; Alfieri, Ottavio [Abstract] [Full Text]; Alhan, H. Cem [Abstract] [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Aloia, Thomas A. [Abstract] [Full Text]; Andreasen, Anne Sofie [Abstract] [Full Text]; Asamura, Hisao [Full Text]; Aston, William J. [Abstract] [Full Text]; Azakie, Anthony [Abstract] [Full Text]
B: Bachmann, Georg [Abstract] [Full Text]; Baden, Winfried [Abstract] [Full Text]; Bains, Manjit S. [Abstract] [Full Text]; Baksh, Fabien K. [Abstract] [Full Text]; Baldwin, John C. [Abstract] [Full Text]; Bando, Ko [Abstract] [Full Text]; Barajon, Isabella [Abstract] [Full Text]; Bauer, Erwin P. [Abstract] [Full Text]; Bauer, Erwin P. [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bder, Othman [Abstract] [Full Text]; Beaver, Thomas M. [Abstract] [Full Text]; Benson, Lee N. [Abstract] [Full Text]; Bhan, Anil [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Bitran, Dani [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Böhm, Ádám [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Bolman, R. Morton, III [Abstract] [Full Text]; Bonacchi, Massimo [Abstract] [Full Text]; Bonhoeffer, Philipp [Abstract] [Full Text]; Borowicz, Louis M. [Abstract] [Full Text]; Bosk, Axel [Abstract] [Full Text]; Boston, Umar S. [Abstract] [Full Text]; Brandt, Roland R. [Abstract] [Full Text]; Brown, Karen M. [Abstract] [Full Text]; Brügemann, Johan [Abstract] [Full Text]; Brühlmann, Werner F. [Full Text]; Brunner-La Rocca, Hans-Peter [Abstract] [Full Text]; Buchan, Keith G. [Abstract] [Full Text]; Buenaventura, Percival O. [Abstract] [Full Text]
C: Calhoon, John H. [Full Text]; Cameron, Charles Robert [Abstract] [Full Text]; Cartwright, Anthony J. [Abstract] [Full Text]; Cassada, David C. [Abstract] [Full Text]; Cesario, Alfredo [Full Text]; Chamberlain, Martin H. [Full Text]; Chang, YuChiao [Abstract] [Full Text]; Chard, Richard B. [Abstract] [Full Text]; Chavanon, Olivier [Full Text]; Chekanov, Valeri S. [Full Text]; Chen, Anita Y. [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Choudhary, Shiv Kumar [Abstract] [Full Text]; Chula, Eduardo D. [Abstract] [Full Text]; Cleveland, Joseph C., Jr [Abstract] [Full Text]; Cohen, Amram J. [Abstract] [Full Text]; Cohen, Cynthia [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Conlon, Debbi H. [Abstract] [Full Text]; Cook, David J. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]
D: D’Amico, Thomas A. [Abstract] [Full Text]; Dagdelen, Sinan [Abstract] [Full Text]; Dahlberg, Peter S. [Abstract] [Full Text]; Damiano, Ralph J., Jr [Abstract] [Full Text]; de Boer, Willem J. [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; Deeb, G. Michael [Abstract] [Full Text]; DeMeester, Tom R. [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Deslauriers, Jean [Full Text]; DeWeese, James A. [Full Text]; Doelling, Nancy R. [Abstract] [Full Text]; Dollner, Ralph [Abstract] [Full Text]; Doty, John R. [Abstract] [Full Text]; Downey, Robert J. [Abstract] [Full Text]; Duarte, Ignacio G. [Abstract] [Full Text]; Dumouchel, Justin P. [Abstract] [Full Text]; Durenberger, David F. [Full Text]
E: Ebels, Tjark [Abstract] [Full Text]; Edgerton, James R. [Abstract] [Full Text]; Edwards, Niloo M. [Abstract] [Full Text]; Elefteriades, John A. [Abstract] [Full Text]; Esato, Kensuke [Abstract] [Full Text]; Estrera, Anthony L. [Abstract] [Full Text]
F: Fang, Dekang [Abstract] [Full Text]; Feins, Richard H. [Full Text]; Felger, Jason E. [Abstract] [Full Text]; Fink, Dani [Abstract] [Full Text]; Finkelstein, Sydney D. [Abstract] [Full Text]; Folliguet, Thierry A. [Abstract] [Full Text]; Fonger, James D. [Full Text]; Foote, Susan Bartlett [Full Text]; Fosse, Gwendolyn R. [Abstract] [Full Text]; Francel, Thomas J. [Abstract] [Full Text]; Francel, Thomas J. [Abstract] [Full Text]; Francischelli, David [Abstract] [Full Text]; Frati, Giacomo [Abstract] [Full Text]; Fukuda, Seijun [Abstract] [Full Text]; Fyfe, Derek A. [Abstract] [Full Text]
G: Gal, Anthony A. [Abstract] [Full Text]; Galetta, Domenico [Full Text]; Gangemi, James J. [Abstract] [Full Text]; Gardner, Timothy J. [Full Text]; Gebhard, Martha Maria [Abstract] [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Giunti, Gabriele [Abstract] [Full Text]; Godfrey, Tony E. [Abstract] [Full Text]; Gooding, William E. [Abstract] [Full Text]; Gott, Vincent L. [Full Text]; Goyal, Mukesh [Abstract] [Full Text]; Grandjean, Jan G. [Full Text]; Grannis, Frederic W., Jr [Full Text]; Granone, Pierluigi [Full Text]; Graper, W. Peter [Abstract] [Full Text]; Grega, Maura A. [Abstract] [Full Text]; Griepp, Randall B. [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Grünenfelder, Jürg [Abstract] [Full Text]
H: Hachiro, Yoshikazu [Abstract] [Full Text]; Hagen, Jeffrey A. [Full Text]; Hagl, Christian [Full Text]; Hagl, Siegfried [Abstract] [Full Text]; Hajdú, László [Full Text]; Harper, Fiona V. [Abstract] [Full Text]; Harpole, David H., Jr [Abstract] [Full Text]; Hashimoto, Kazuhiro [Abstract] [Full Text]; Hauptman, Eli [Abstract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Heinemann, Markus K. [Abstract] [Full Text]; Herndon, James E., II [Abstract] [Full Text]; Hirai, Takashi [Full Text]; Hoerstrup, Simon P. [Abstract] [Full Text]; Hogan, James F. [Abstract] [Full Text]; Hohe, Stephen [Abstract] [Full Text]; Holbert, Don [Abstract] [Full Text]; Hosseinpour, Amir-Reza [Abstract] [Full Text]; Huang, Guojun [Abstract] [Full Text]; Huynh, Tam T.T. [Abstract] [Full Text]; Huyzen, Robert J. [Abstract] [Full Text]
I: Iannettoni, Mark D. [Full Text]; Iliopoulos, Jim [Abstract] [Full Text]; Ina, Hiroshi [Abstract] [Full Text]; Ismeno, Gennaro [Abstract] [Full Text]
J: Jarløv, Jens Otto [Abstract] [Full Text]; Jeon, Hae M. [Abstract] [Full Text]; Jichici, Draga [Abstract] [Full Text]; Johnson, Scott B. [Full Text]; Johnson, W. Dudley [Full Text]
K: Kamikubo, Yasuhiro [Abstract] [Full Text]; Kaneda, Yoshikazu [Abstract] [Full Text]; Kanemitsu, Naoki [Abstract] [Full Text]; Kanter, Kirk R. [Abstract] [Full Text]; Karabulut, E. Hasan [Abstract] [Full Text]; Karl, Tom R. [Full Text]; Kawaharada, Nobuyoshi [Abstract] [Full Text]; Kaza, Aditya K. [Abstract] [Full Text]; Kaza, Aditya K. [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kern, John A. [Full Text]; Kinch, Michael S. [Abstract] [Full Text]; Kipshidze, Nicholas [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Kitayama, Hitoshi [Abstract] [Full Text]; Klima, Uwe [Abstract] [Full Text]; Klövekorn, Wolf P. [Abstract] [Full Text]; Klövekorn, Wolf Peter [Abstract] [Full Text]; Kobayashi, Junjiro [Abstract] [Full Text]; Kondo, Kazuya [Abstract] [Full Text]; Konuralp, Cüneyt [Full Text]; Kopman, Ercüment [Full Text]; Kornstein, Michael J. [Abstract] [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Abstract] [Full Text]; Kraus, Bernd [Abstract] [Full Text]; Kris, Mark G. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kunihara, Takashi [Abstract] [Full Text]; Kuo, Elbert Y. [Abstract] [Full Text]; Kwack, Moon S. [Abstract] [Full Text]
L: Laborde, François [Abstract] [Full Text]; Lang-Lazdunski, Loïc [Full Text]; Le Bret, Emmanuel [Abstract] [Full Text]; Le Pimpec-Barthes, Françoise [Full Text]; Leacche, Marzia [Abstract] [Full Text]; Lee, Kyong-Jin [Abstract] [Full Text]; Lee, Sun H. [Abstract] [Full Text]; Lemke, Peter [Abstract] [Full Text]; Letsou, George V. [Abstract] [Full Text]; Li, Sen [Abstract] [Full Text]; Li, Tao-Sheng [Abstract] [Full Text]; Lichtenberg, Artur [Abstract] [Full Text]; Lima, Gilberto A. [Abstract] [Full Text]; Linden, Joel [Abstract] [Full Text]; Liu, Yu [Abstract] [Full Text]; Liviatan-Strauss, Nurit [Abstract] [Full Text]; Long, Stewart M. [Abstract] [Full Text]; Lucchi, Marco [Full Text]; Luketich, James D. [Abstract] [Full Text]
M: Machiraju, V.R. [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Magovern, George J., Jr [Full Text]; Mahmood, Nilofer [Abstract] [Full Text]; Maier, Alfred [Abstract] [Full Text]; Malcolm, Donald D. [Abstract] [Full Text]; Maly, Friedrich E. [Abstract] [Full Text]; Manfredi, Barbara [Abstract] [Full Text]; Manganas, Con [Abstract] [Full Text]; Mansour, Kamal A. [Abstract] [Full Text]; Margaritora, Stefano [Full Text]; Mariani, Massimo A. [Full Text]; Martin, Jocelyne [Abstract] [Full Text]; Martin, Tomas D. [Abstract] [Full Text]; Matloff, Jack M. [Full Text]; Matsumoto, Koshi [Abstract] [Full Text]; Matsumoto, Terufumi [Abstract] [Full Text]; Matsuoka, Takahisa [Abstract] [Full Text]; Matzi, Veronika [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; Medalion, Benjamin [Abstract] [Full Text]; Meharwal, Zile Singh [Full Text]; Menger, Michael D. [Abstract] [Full Text]; Merin, Ofer [Abstract] [Full Text]; Merklinger, Sandra L. [Abstract] [Full Text]; Mesquita, Ariângelo A. [Abstract] [Full Text]; Miller, Charles C., III [Abstract] [Full Text]; Miller, Charles C., III [Abstract] [Full Text]; Miller, Daniel L. [Abstract] [Full Text]; Miller, George E., Jr [Full Text]; Miller, Joseph I. [Abstract] [Full Text]; Miyoshi, Takanori [Abstract] [Full Text]; Monden, Yasumasa [Abstract] [Full Text]; Moore, Mary-Beth H. [Abstract] [Full Text]; Morishita, Yasuo [Abstract] [Full Text]; Morresi-Hauf, Alicia [Abstract] [Full Text]; Mullangi, Chandra [Abstract] [Full Text]; Murphy, Peter M. [Abstract] [Full Text]
N: Naka, Yoshifumi [Abstract] [Full Text]; Nakamura, Takasumi [Abstract] [Full Text]; Nakamura, Takayuki [Abstract] [Full Text]; Nakamura, Tatsuo [Abstract] [Full Text]; Nakatani, Takeshi [Abstract] [Full Text]; Neirotti, Rodolfo A. [Abstract] [Full Text]; Nguyen, Duc Q. [Abstract] [Full Text]; Nichols, Francis C. [Abstract] [Full Text]; Nifong, L. Wiley [Abstract] [Full Text]; Nikolaychik, Victor V. [Full Text]; Nunn, Graham R. [Abstract] [Full Text]
O: O’Keefe, Peter A. [Abstract] [Full Text]; Ohki, Akira [Abstract] [Full Text]; Ohwada, Susumu [Abstract] [Full Text]; Okabe, Manabu [Abstract] [Full Text]; Oku, Hidetaka [Abstract] [Full Text]; Olinger, Gordon N. [Full Text]; Onoda, Koji [Abstract] [Full Text]; Onoe, Masahiko [Abstract] [Full Text]; Onoguchi, Katsuhisa [Abstract] [Full Text]; Oriuchi, Noboru [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Oshiumi, Motohiro [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pagani, Francis D. [Abstract] [Full Text]; Pairolero, Peter C. [Abstract] [Full Text]; Paiste, Juhan [Abstract] [Full Text]; Pang, Manhui [Abstract] [Full Text]; Park, Jae K. [Abstract] [Full Text]; Park, Soon J. [Abstract] [Full Text]; Passlick, Bernward [Abstract] [Full Text]; Pecher, Peter [Full Text]; Perrault, Louis P. [Full Text]; Peterson, Eric [Abstract] [Full Text]; Petrofski, Jason A. [Abstract] [Full Text]; Petrucci, Ralph [Abstract] [Full Text]; Pham, Si M. [Abstract] [Full Text]; Pinter, Hans [Abstract] [Full Text]; Pitschner, Heinz F. [Abstract] [Full Text]; Pompilio, Giulio [Abstract] [Full Text]; Porat, Eyal [Abstract] [Full Text]; Prager, Richard L. [Abstract] [Full Text]; Prasad, Sunil M. [Abstract] [Full Text]; Préda, István [Full Text]; Prifti, Edvin [Abstract] [Full Text]; Proietti, Piero [Abstract] [Full Text]
R: Raja, Siva [Abstract] [Full Text]; Raman, Jai S. [Full Text]; Reade, Clifton C. [Abstract] [Full Text]; Rehak, Peter [Abstract] [Full Text]; Reidenbach, Bettina [Abstract] [Full Text]; Rieger, Jayson M. [Abstract] [Full Text]; Riquet, Marc [Full Text]; Ritchie, Andrew J. [Abstract] [Full Text]; Rossoni, Giuseppe [Abstract] [Full Text]; Roth, Matthias [Abstract] [Full Text]; Ruhparwar, Arjang [Abstract] [Full Text]; Rumio, Cristiano [Abstract] [Full Text]; Rusch, Valerie W. [Abstract] [Full Text]
S: Sack, Falk–Udo [Abstract] [Full Text]; Safi, Hazim J. [Abstract] [Full Text]; Safi, Hazim J. [Abstract] [Full Text]; Safran, David B. [Abstract] [Full Text]; Sakiyama, Syouji [Abstract] [Full Text]; Sako, Edward Y. [Full Text]; Salazar, Jorge D. [Abstract] [Full Text]; Sasaki, Tatsuumi [Abstract] [Full Text]; Sasako, Yoshikado [Abstract] [Full Text]; Savitt, Michael A. [Abstract] [Full Text]; Schachner, Arie [Abstract] [Full Text]; Schäfers, Hans-Joachim [Abstract] [Full Text]; Schledt, Alexander [Abstract] [Full Text]; Schmidt, Henrik [Abstract] [Full Text]; Schumacher, Bernd A. [Full Text]; Schurr, Ulrich P. [Abstract] [Full Text]; Schwartzman, Robert J. [Abstract] [Full Text]; Shaheen, Joseph [Abstract] [Full Text]; Shapira, Nadiv [Abstract] [Full Text]; Sharma, Sanjeev [Abstract] [Full Text]; Sharma, Shiva [Abstract] [Full Text]; Shiiya, Norihiko [Abstract] [Full Text]; Shimizu, Yasuhiko [Abstract] [Full Text]; Shimono, Takatsugu [Abstract] [Full Text]; Shimosato, Yukio [Abstract] [Full Text]; Shimpo, Hideto [Abstract] [Full Text]; Shiraga, Kazuko [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shroyer, A. Laurie W. [Abstract] [Full Text]; Sidi, Daniel [Abstract] [Full Text]; Sienel, Wulf [Abstract] [Full Text]; Silberman, Shuli [Abstract] [Full Text]; Sim, Sung B. [Abstract] [Full Text]; Sitar, Ivan [Abstract] [Full Text]; Skov, Robert [Abstract] [Full Text]; Slater, Jared M. [Abstract] [Full Text]; Smolens, Iva A. [Abstract] [Full Text]; Smolle-Jüttner, Freyja M. [Abstract] [Full Text]; Sonnad, Seema S. [Abstract] [Full Text]; Souza, Liberato S.S. [Abstract] [Full Text]; Strindberg, Gail [Abstract] [Full Text]; Sugimoto, Satoru [Abstract] [Full Text]; Sugiyama, George T. [Abstract] [Full Text]; Sullivan, William G. [Abstract] [Full Text]; Sunose, Yutaka [Abstract] [Full Text]; Swalsky, Patricia A. [Abstract] [Full Text]; Szalay, Zoltan A. [Abstract] [Full Text]
T: Taams, Karel O. [Abstract] [Full Text]; Tabaie, Harold A. [Abstract] [Full Text]; Taggart, David P. [Full Text]; Takagi, Nobuyuki [Abstract] [Full Text]; Takakura, Hiromitsu [Abstract] [Full Text]; Takami, Yoshiyuki [Abstract] [Full Text]; Takeyoshi, Izumi [Abstract] [Full Text]; Talwar, Sachin [Abstract] [Full Text]; Tam, Vincent K.H. [Abstract] [Full Text]; Tanaka, Kuniyoshi [Abstract] [Full Text]; Tanaka, Toshiki [Abstract] [Full Text]; Tarcan, Sümer [Abstract] [Full Text]; Tartara, Paolo [Abstract] [Full Text]; Tenpaku, Hironori [Abstract] [Full Text]; Thanikachalam, Mohan [Abstract] [Full Text]; Thetter, Olaf [Abstract] [Full Text]; Thomas, Carole E. [Abstract] [Full Text]; Tio, René A. [Abstract] [Full Text]; Toba, Toshinari [Abstract] [Full Text]; Tomaselli, Florian [Abstract] [Full Text]; Tomaske, Maren [Abstract] [Full Text]; Toraman, Fevzi [Abstract] [Full Text]; Torracca, Lucia [Abstract] [Full Text]; Trefz, Friedrich K. [Abstract] [Full Text]; Trehan, Naresh [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Trumble, Dennis R. [Full Text]; Tsutsumi, Hirofumi [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]
U: Ueda, Hiroki [Abstract] [Full Text]; Ueda, Mitsuomi [Abstract] [Full Text]; Ünal, Mustafa [Full Text]; Unsworth-White, M. Jonathan [Abstract] [Full Text]; Urrutia, Victor C. [Abstract] [Full Text]
V: Van Arsdell, Glen S. [Abstract] [Full Text]; van der Bij, Wim [Abstract] [Full Text]; Venkatraman, Ennapadam S. [Abstract] [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Vinten-Johansen, Jakob [Full Text]; Vogt, Paul R. [Abstract] [Full Text]; Vollmar, Brigitte [Abstract] [Full Text]; Vouhé, Pascal [Abstract] [Full Text]
W: Walles, Thorsten [Abstract] [Full Text]; Wang, Liangjun [Abstract] [Full Text]; Wariishi, Seiichiro [Abstract] [Full Text]; Waterbolk, Tjalling W. [Abstract] [Full Text]; Weaver, James P. [Full Text]; Weigel, Tracey L. [Abstract] [Full Text]; Williams, John P. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Wilson, Robert F. [Abstract] [Full Text]; Winning, Johannes [Abstract] [Full Text]; Wityk, Robert J. [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]; Wu, Qing-yu [Abstract] [Full Text]
Y: Yada, Isao [Abstract] [Full Text]; Yagihara, Toshikatsu [Abstract] [Full Text]; Yamanaka, Akira [Full Text]; Yang, Xiu-bin [Abstract] [Full Text]; Yasuda, Keishu [Abstract] [Full Text]; Yoshitani, Makoto [Abstract] [Full Text]; Yuasa, Uhito [Abstract] [Full Text]
Z: Zempo, Nobuya [Abstract] [Full Text]; Zenati, Marco A. [Abstract] [Full Text]; Zhang, Dawei [Abstract] [Full Text]; Zhang, Dechao [Abstract] [Full Text]; Zhang, Rugang [Abstract] [Full Text]; Ziemer, Gerhard [Abstract] [Full Text]; Zünd, Gregor [Abstract] [Full Text]