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Index by Author: Volume 71, Issue 2 (February 2001) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tomio [Abstract] [Full Text]; Abegaz, Belay [Abstract] [Full Text]; Abella, Raul F. [Abstract] [Full Text]; Actis Dato, Guglielmo M. [Full Text]; Aeba, Ryo [Abstract] [Full Text]; Ahn, Jae Ho [Abstract] [Full Text]; Akalin, Hakki [Abstract] [Full Text]; Akan, Hamdi [Abstract] [Full Text]; Al-Khaddour, Ahmed [Abstract] [Full Text]; Alexiou, Christos [Abstract] [Full Text]; Alexiou, Christos [Abstract] [Full Text]; Alzetani, Aiman [Abstract] [Full Text]; Amrani, Mohamed [Abstract] [Full Text]; Anai, Hirofumi [Abstract] [Full Text]; Anyanwu, Ani C. [Abstract] [Full Text]; Aoki, Mitsuru [Abstract] [Full Text]; Aoki, Tadashi [Abstract] [Full Text]; Aouifi, Abdellah [Abstract] [Full Text]; Argenziano, Michael [Abstract] [Full Text]; Asamura, Hisao [Abstract] [Full Text]; Avery, G. James, II [Abstract] [Full Text]
B: Bacha, Emile A. [Abstract] [Full Text]; Barber, Graeme G. [Abstract] [Full Text]; Baribeau, Yvon R. [Abstract] [Full Text]; Bartley, Susan [Abstract] [Full Text]; Bastien, Olivier H. [Abstract] [Full Text]; Baumer, Harald [Abstract] [Full Text]; Baur, Leo H.B. [Abstract] [Full Text]; Bedard, Pierre [Abstract] [Full Text]; Behrendt, Douglas M. [Full Text]; Berdat, Pascal A. [Abstract] [Full Text]; Bernard, Alain [Abstract] [Full Text]; Bernstein, Alan D. [Abstract] [Full Text]; Bichell, David P. [Abstract] [Full Text]; Bielefeld, Mark R. [Abstract] [Full Text]; Bilsky, Mark H. [Abstract] [Full Text]; Bishop, Deborah A. [Abstract] [Full Text]; Bitran, Dani [Full Text]; Blanc, Pascale [Abstract] [Full Text]; Blauth, Christopher I. [Abstract] [Full Text]; Bloomstein, Larry Z. [Abstract] [Full Text]; Boushey, Robin P. [Abstract] [Full Text]; Bove, Thierry [Abstract] [Full Text]; Braun, Jerry [Abstract] [Full Text]; Brenot, Roger [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Bustami, Mahmoud [Abstract] [Full Text]; Byrne, John G. [Abstract] [Full Text]
C: Campbell, David N. [Abstract] [Full Text]; Capuani, Athos [Abstract] [Full Text]; Carrel, Thierry P. [Abstract] [Full Text]; Casselman, Filip P. [Abstract] [Full Text]; Catarino, Pedro A. [Abstract] [Full Text]; Chan, Patrick [Abstract] [Full Text]; Chang, Chunfang [Abstract] [Full Text]; Chehab, Antoine [Abstract] [Full Text]; Chen, Shenxi [Abstract] [Full Text]; Chen, Shenxi [Abstract] [Full Text]; Christiansen, Stefan [Full Text]; Ciccone, Anna Maria [Full Text]; Cipriani, Adriano [Abstract] [Full Text]; Ciubotaru, Antol [Abstract] [Full Text]; Clarke, Peter [Abstract] [Full Text]; Clarke, David R. [Abstract] [Full Text]; Cohen, Laurence [Abstract] [Full Text]; Cohen, Amram J. [Abstract] [Full Text]; Cole, F. Hammond, Jr [Full Text]; Coloni, G. Furio [Full Text]; Condoluci, Claudia [Abstract] [Full Text]; Corapcioglu, Tumer [Abstract] [Full Text]; Costa, Robert [Abstract] [Full Text]; Costa, Kevin D. [Abstract] [Full Text]; Couper, Gregory S. [Abstract] [Full Text]; Crouch, Jill [Abstract] [Full Text]; Czerny, Martin [Abstract] [Full Text]
D: Dalrymple-Hay, Malcolm J.R. [Abstract] [Full Text]; Dalrymple-Hay, Malcolm J.R. [Abstract] [Full Text]; Dalva, Klara [Abstract] [Full Text]; Daniel, Freddy J. [Abstract] [Full Text]; Darling, Edward M. [Abstract] [Full Text]; David, Michel [Abstract] [Full Text]; De Giacomo, Tiziano [Full Text]; Del Campo, Carlos [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Demanet, Hélène [Abstract] [Full Text]; Dessy, Hughes [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Dhar, Dipok Kumar [Abstract] [Full Text]; Dick, Stuart E. [Abstract] [Full Text]; DiSesa, Verdi J. [Abstract] [Full Text]; DiSesa, Verdi J. [Full Text]; Downey, Robert J. [Abstract] [Full Text]; Duff, James A. [Abstract] [Full Text]; Durham, Samuel J. [Abstract] [Full Text]; Dzigivker, Ilya [Full Text]
E: Elowitz, Eric H. [Abstract] [Full Text]; Engoren, Milo [Abstract] [Full Text]
F: Fahimi, Hossein [Abstract] [Full Text]; Falkowski, George [Full Text]; Faure, Eric [Abstract] [Full Text]; Ffrench, Patrick [Abstract] [Full Text]; Fillinger, Mary P. [Abstract] [Full Text]; Floten, H. Storm [Abstract] [Full Text]; Floten, H. Storm [Abstract] [Full Text]; Fontes, Manuel [Abstract] [Full Text]; Fuentes, Pierre [Full Text]; Fujii, Masahiro [Abstract] [Full Text]; Fujii, Yoshitaka [Abstract] [Full Text]; Fukuda, Sachito [Abstract] [Full Text]; Fukushima, Norihide [Abstract] [Full Text]; Furnary, Anthony P. [Abstract] [Full Text]; Furnary, Anthony P. [Abstract] [Full Text]
G: Güvener, Murat [Full Text]; Gabbay, Shlomo [Abstract] [Full Text]; Gardner, Timothy J. [Full Text]; Gaskin, Peter R. [Abstract] [Full Text]; Genyk, Igor [Abstract] [Full Text]; Giaid, Adel [Abstract] [Full Text]; Gielchinsky, Isaac [Abstract] [Full Text]; Gilad, Eli [Abstract] [Full Text]; Gilbert, Sébastien [Full Text]; Gilfeather, Michael S. [Abstract] [Full Text]; Gnanapragasam, James [Abstract] [Full Text]; Gorman, Robert C. [Full Text]; Gorman, Joseph H., III [Full Text]; Grannis, Frederic W., Jr [Abstract] [Full Text]; Graves, Bette [Abstract] [Full Text]; Grimm, Michael [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Guccione, Julius M. [Abstract] [Full Text]; Gurevitch, Jacob [Abstract] [Full Text]
H: Habib, Robert H. [Abstract] [Full Text]; Hachiro, Yoshikazu [Abstract] [Full Text]; Hachiya, Takashi [Abstract] [Full Text]; Hadama, Tetsuo [Abstract] [Full Text]; Halligan, Peter W. [Abstract] [Full Text]; Hammel, Dieter [Full Text]; Han, Jae Jin [Abstract] [Full Text]; Hanaoka, Nobuharu [Abstract] [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hanss, Michel [Abstract] [Full Text]; Hartz, Renee S. [Abstract] [Full Text]; Hashimoto, Takehisa [Abstract] [Full Text]; Hashimoto, Kazuhiro [Abstract] [Full Text]; Hassinen, Ilmo E. [Abstract] [Full Text]; Hattori, Koji [Abstract] [Full Text]; Haw, Marcus P. [Abstract] [Full Text]; Hayashi, Ichiro [Abstract] [Full Text]; Hayashi, Jun-ichi [Abstract] [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Hemmer, Wolfgang B. [Full Text]; Hernandez, Felix, Jr [Abstract] [Full Text]; Hershon, James J. [Abstract] [Full Text]; Hiesmayr, Michael J. [Abstract] [Full Text]; Higashi, Shigeki [Abstract] [Full Text]; Hill, J. Donald [Abstract] [Full Text]; Hosoda, Yasuyuki [Abstract] [Full Text]; Houri, Sion [Abstract] [Full Text]; Howe, J. Greg [Abstract] [Full Text]; Hulin, Sylvie [Abstract] [Full Text]; Hunter, David W. [Abstract] [Full Text]; Hunter, Timothy J. [Abstract] [Full Text]; Huysmans, Hans A. [Abstract] [Full Text]; Hynes, Mark [Abstract] [Full Text]
I: Iacona, Gabriele M. [Abstract] [Full Text]; Ichikawa, Hajime [Abstract] [Full Text]; Ilsley, Charles [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Imai, Katsuhiko [Abstract] [Full Text]; Imai, Katsuhiko [Abstract] [Full Text]; Imoto, Yutaka [Abstract] [Full Text]; Iorio, Fiore S. [Abstract] [Full Text]; Ishii, Yosuke [Abstract] [Full Text]; Ito, Tsutomu [Abstract] [Full Text]; Ito, Masayoshi [Abstract] [Full Text]; Iwaki, Hideyuki [Abstract] [Full Text]
J: Jackson, Joseph H. [Abstract] [Full Text]; Jaggers, James J. [Abstract] [Full Text]; Jaggers, James J. [Abstract] [Full Text]; Johnston, Troy A. [Abstract] [Full Text]; Jungbluth, Britta [Abstract] [Full Text]
K: Kado, Hideaki [Abstract] [Full Text]; Kaemmer, David [Abstract] [Full Text]; Kalangos, Afksendiyos [Abstract] [Full Text]; Kaneda, Yasufumi [Abstract] [Full Text]; Kaneko, Masahiro [Abstract] [Full Text]; Kanter, Kirk R. [Abstract] [Full Text]; Kaplitt, Michael G. [Abstract] [Full Text]; Kappetein, A. Pieter [Abstract] [Full Text]; Karanam, Ravi [Abstract] [Full Text]; Kashima, Ichiro [Abstract] [Full Text]; Katogi, Toshiyuki [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Kaukoranta, Päivi K. [Abstract] [Full Text]; Kawada, Shiaki [Abstract] [Full Text]; Kawada, Shiaki [Abstract] [Full Text]; Keeton, Barry R. [Abstract] [Full Text]; Keeton, Barry R. [Abstract] [Full Text]; Kelly, Rosemary F. [Abstract] [Full Text]; Khazin, Vadim [Abstract] [Full Text]; Kigawa, Ikutaro [Abstract] [Full Text]; Kikuchi, Seiya [Abstract] [Full Text]; Kilo, Juliane [Abstract] [Full Text]; Kim, Hae Soon [Abstract] [Full Text]; Kinugasa, Shoichi [Abstract] [Full Text]; Kiviluoma, Kai T. [Abstract] [Full Text]; Kiziltepe, Ugursay [Abstract] [Full Text]; Kjaergard, Henrik K. [Full Text]; Knaepen, Paul J. [Abstract] [Full Text]; Knight, Simon R. [Abstract] [Full Text]; Kobayashi, Toshiaki [Abstract] [Full Text]; Kondo, Haruhiko [Abstract] [Full Text]; Kotsis, Lajos [Full Text]; Kraatz, Ernst-Guenter [Abstract] [Full Text]; Kramer, Amir [Abstract] [Full Text]; Krishnadasan, Baiya [Full Text]; Kuang, Jin-Qiang [Abstract] [Full Text]; Kubota, Hirofumi [Abstract] [Full Text]; Kudoh, Kazunori [Abstract] [Full Text]; Kumamaru, Hiroya [Abstract] [Full Text]; Kuwabara, Yoshiyuki [Abstract] [Full Text]
L: Lahey, Stephen J. [Abstract] [Full Text]; Lamm, Peter [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Langley, Stephen M. [Abstract] [Full Text]; Lawson, Dale Scott [Abstract] [Full Text]; Lazzara, Robert R. [Full Text]; Le Pimpec Barthes, Françoise [Abstract] [Full Text]; Lecompte, Yves [Abstract] [Full Text]; Lehot, Jean-Jacques [Abstract] [Full Text]; Lepojärvi, Martti V.K. [Abstract] [Full Text]; Levy, Jerrold H. [Abstract] [Full Text]; Lewis, Joseph W., Jr [Abstract] [Full Text]; Ley, S. Jill [Abstract] [Full Text]; Li, Guohu [Abstract] [Full Text]; Liu, Ming-Hui [Abstract] [Full Text]; Lorelli, David R. [Abstract] [Full Text]; Lu, Erxiong [Abstract] [Full Text]; Luo, Wanjun [Abstract] [Full Text]; Luo, Wanjun [Abstract] [Full Text]
M: Macherey, Robin S. [Abstract] [Full Text]; Maddaus, Michael A. [Abstract] [Full Text]; Magee, Alan G. [Abstract] [Full Text]; Magovern, James A. [Abstract] [Full Text]; Mahmoud, Hyam [Abstract] [Full Text]; Mair, Helmut [Full Text]; Malenka, David J. [Abstract] [Full Text]; Maley, Richard H. [Abstract] [Full Text]; Mann, Gary N. [Abstract] [Full Text]; Marcelletti, Carlo F. [Abstract] [Full Text]; Marianeschi, Stefano M. [Abstract] [Full Text]; Mariani, Massimo A. [Abstract] [Full Text]; Masunaga, Reiko [Abstract] [Full Text]; Mathew, Joseph P. [Abstract] [Full Text]; Mathisen, Douglas J. [Full Text]; Matsa, Menachem [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Matsuoka, Katsunari [Abstract] [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Meunier, Jean-Pierre [Abstract] [Full Text]; Miller, Joseph I., Jr [Abstract] [Full Text]; Misfeld, Martin [Abstract] [Full Text]; Misumi, Takahiko [Abstract] [Full Text]; Mitani, Masami [Abstract] [Full Text]; Mitchell, Max B. [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Miyamoto, Shinji [Abstract] [Full Text]; Mohiuddin, Muhammad M. [Abstract] [Full Text]; Mohr, Rephael [Abstract] [Full Text]; Mojcik, Christopher F. [Abstract] [Full Text]; Monro, James L. [Abstract] [Full Text]; Monro, James L. [Abstract] [Full Text]; Moonly, Scott M. [Abstract] [Full Text]; Morales, J. Mark [Abstract] [Full Text]; Morash, Christopher G. [Abstract] [Full Text]; Moro, Katsumi [Abstract] [Full Text]; Morris, Cullen D. [Abstract] [Full Text]; Morris, David E. [Abstract] [Full Text]; Moulton, Michael J. [Abstract] [Full Text]; Moustakidis, Pavlos [Abstract] [Full Text]; Muro, Kotaro [Abstract] [Full Text]
N: Nagasue, Naofumi [Abstract] [Full Text]; Naka, Yoshifumi [Abstract] [Full Text]; Nemoto, Shintaro [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Nicholson, Ian A. [Abstract] [Full Text]; Nishikawa, Kuni [Abstract] [Full Text]; Nishimura, Motonobu [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]; Norotsky, Mitchell [Abstract] [Full Text]; Nurozler, Feza [Abstract] [Full Text]
O: O’Connor, Gerald T. [Abstract] [Full Text]; O’Laughlin, Martin P. [Abstract] [Full Text]; O’Rourke, Daniel J. [Abstract] [Full Text]; Odell, John A. [Abstract] [Full Text]; Ogasawara, Hidetsugu [Abstract] [Full Text]; Ohata, Toshihiro [Abstract] [Full Text]; Ohkubo, Naoko [Abstract] [Full Text]; Ohno, Satoshi [Abstract] [Full Text]; Ohri, Sunil K. [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Okumura, Takehiro [Abstract] [Full Text]; Olmstead, Elaine M. [Abstract] [Full Text]; Omohkdion, Samuel [Abstract] [Full Text]; Onoguchi, Katsuhisa [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Oshiumi, Motohiro [Abstract] [Full Text]; Ouaknine, Ruth [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Parenteau, Gary L. [Abstract] [Full Text]; Parsonnet, Victor [Abstract] [Full Text]; Pasque, Michael K. [Abstract] [Full Text]; Pate, James W. [Full Text]; Patel, Sanjeet G. [Abstract] [Full Text]; Paz, Yosef [Abstract] [Full Text]; Peels, Katinka [Abstract] [Full Text]; Penttilä, Hannu J. [Abstract] [Full Text]; Petsikas, Dimtri [Full Text]; Peuhkurinen, Keijo J. [Abstract] [Full Text]; Pevni, Dimitri [Abstract] [Full Text]; Pezzella, A. Thomas [Full Text]; Pfammatter, Jean-Pierre [Abstract] [Full Text]; Phillips-Bute, Barbara [Abstract] [Full Text]; Piriou, Vincent [Abstract] [Full Text]; Plomondon, Mary E. [Abstract] [Full Text]; Ploner, Meinhard [Abstract] [Full Text]; Prat, Alain [Abstract] [Full Text]
Q: Quinn, Reed D. [Abstract] [Full Text]; Quinton, Hebe B. [Abstract] [Full Text]; Qureshi, Shakeel A. [Abstract] [Full Text]
R: Rainer, W. Gerald [Full Text]; Rao, Anuradha V. [Abstract] [Full Text]; Ratcliffe, Mark B. [Abstract] [Full Text]; Reardon, Michael J. [Full Text]; Reed, Carolyn E. [Full Text]; Reichart, Bruno [Full Text]; Reid, Kenneth R. [Full Text]; Ren, Zhen [Abstract] [Full Text]; Rendina, Erino A. [Full Text]; Rinder, Christine S. [Abstract] [Full Text]; Riordan, Christopher J. [Abstract] [Full Text]; Riquet, Marc [Abstract] [Full Text]; Ruel, Marc [Abstract] [Full Text]; Ruffini, Enrico [Full Text]; Rusch, Valerie W. [Abstract] [Full Text]
S: Saatvedt, Kjell [Abstract] [Full Text]; Saeed, Imran [Abstract] [Full Text]; Sager, Kenneth [Abstract] [Full Text]; Sakaguchi, Taichi [Abstract] [Full Text]; Sakamoto, Takahiko [Abstract] [Full Text]; Sako, Hidenori [Abstract] [Full Text]; Salmon, Anthony P. [Abstract] [Full Text]; Salmon, Anthony P. [Abstract] [Full Text]; Sanders, John H., Jr [Abstract] [Full Text]; Santucci, Tibetha [Abstract] [Full Text]; Sasaki, Tatsuumi [Abstract] [Full Text]; Sato, Atsushi [Abstract] [Full Text]; Saunders, Craig [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Schütz, Albert [Full Text]; Schachner, Arie [Abstract] [Full Text]; Scheld, Hans H. [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Schwann, Thomas A. [Abstract] [Full Text]; Scott, Rosalyn P. [Full Text]; Seddio, Francesco [Abstract] [Full Text]; Seevanayagam, Siven [Abstract] [Full Text]; Shahriari, Ali [Abstract] [Full Text]; Shapira, Itzhak [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shi, Qun [Full Text]; Shibakita, Muneaki [Abstract] [Full Text]; Shigemitsu, Osamu [Abstract] [Full Text]; Shikata, Hiroo [Abstract] [Full Text]; Shin, Hankei [Abstract] [Full Text]; Shinoda, Noriyuki [Abstract] [Full Text]; Shinohara, Hirohiko [Abstract] [Full Text]; Shiokawa, Yuichi [Abstract] [Full Text]; Shroyer, A. Laurie W. [Abstract] [Full Text]; Sievers, Hans-Hinrich [Abstract] [Full Text]; Silvestri, Gerard A. [Full Text]; Simpson, James W. [Abstract] [Full Text]; Singh, Deepak [Abstract] [Full Text]; Singhal, Arun K. [Full Text]; Smith, Brian R. [Abstract] [Full Text]; Sohn, Sejung [Abstract] [Full Text]; Sola, Olav M. [Full Text]; Souilamas, Redha [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sundt, Thoralf M., III [Full Text]; Suzuki, Kenji [Abstract] [Full Text]; Suzuki, Tomotaka [Abstract] [Full Text]; Suzuki, Takaaki [Abstract] [Full Text]
T: Tachibana, Mitsuo [Abstract] [Full Text]; Takahashi, Etsuro [Abstract] [Full Text]; Takakura, Hiromitsu [Abstract] [Full Text]; Takazawa, Kenji [Abstract] [Full Text]; Takeuchi, Shigeyuki [Abstract] [Full Text]; Tamir, Akiva [Abstract] [Full Text]; Tanaka, Masashi [Abstract] [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tatou, Etienne [Abstract] [Full Text]; Tatoulis, James [Full Text]; Toda, Katsunori [Abstract] [Full Text]; Todd, Thomas R.J. [Abstract] [Full Text]; Tokunaga, Shigehiko [Abstract] [Full Text]; Tsuchida, Masanori [Abstract] [Full Text]; Tsuchiya, Ryosuke [Abstract] [Full Text]
U: Unger, Felix [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Uysalel, Adnan [Abstract] [Full Text]
V: van Boven, Wim J. [Abstract] [Full Text]; van Oeveren, Willem [Abstract] [Full Text]; van Swieten, Henry A. [Abstract] [Full Text]; Venuta, Federico [Full Text]; Vernon, Robert B. [Full Text]; Verrier, Edward D. [Full Text]; Viart, Pierre [Abstract] [Full Text]
W: Wan, Song [Full Text]; Wanibuchi, Yasuhiko [Abstract] [Full Text]; Watanabe, Takehiro [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Weiman, Darryl [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Weyant, Robert J. [Abstract] [Full Text]; White, Samantha [Abstract] [Full Text]; Wilczynski, Sharon P. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Won, Tae Hee [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yamamoto, Taira [Abstract] [Full Text]; Yamamoto, Shin [Abstract] [Full Text]; Yamasaki, Motoshige [Abstract] [Full Text]; Yamashita, Yoichi [Abstract] [Full Text]; Yamato, Yasushi [Abstract] [Full Text]; Yanagihara, Kazuhiro [Abstract] [Full Text]; Yang, Qin [Abstract] [Full Text]; Yasudo, Mikito [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yim, Anthony P.C. [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yoon, Pyongsoo D. [Abstract] [Full Text]; Yoshimura, Hiroshi [Abstract] [Full Text]; Yozu, Ryohei [Abstract] [Full Text]
Z: Zabeeda, Deeb [Abstract] [Full Text]; Zacharias, Anoar [Abstract] [Full Text]; Zahn, Evan M. [Abstract] [Full Text]