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Index by Author: Volume 69, Issue 4 (April 2000) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aaberge, Lars [Abstract] [Full Text]; Acikel, Unal [Abstract] [Full Text]; Ad, Niv [Full Text]; Adlakha, Harkiran [Abstract] [Full Text]; Agrawal, Rajiv [Abstract] [Full Text]; Ahmed, Ishtiaq [Abstract] [Full Text]; Akazawa, Kenji [Abstract] [Full Text]; Al-Sofyani, Medhat [Abstract] [Full Text]; Alamanni, Francesco [Abstract] [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Allen, Nechol L. [Abstract] [Full Text]; Almdahl, Sven M. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Andreani, Stefano M. [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Arén, Claes [Abstract] [Full Text]; Arnold, John R. [Abstract] [Full Text]; Arnold, Scott [Abstract] [Full Text]; Ascione, Raimondo [Abstract] [Full Text]; Asher, Craig R. [Abstract] [Full Text]; Asimakopoulos, George [Abstract] [Full Text]; Augostini, Ralph S. [Abstract] [Full Text]
B: Baciewicz, Frank A., Jr [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Bafi, Ammar S. [Abstract] [Full Text]; Bailey, Leonard L. [Abstract] [Full Text]; Bakhshay, Shahroukh A. [Full Text]; Bank, Alan J. [Abstract] [Full Text]; Bardan, Eytan [Abstract] [Full Text]; Barker, Geoffrey A. [Abstract] [Full Text]; Bashi, Velayudhan V. [Abstract] [Full Text]; Batista, Randas V. [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bedini, Amedeo V. [Abstract] [Full Text]; Beierlein, Wolfram [Full Text]; Benfield, John R. [Full Text]; Bergsland, Jacob [Full Text]; Bhan, Anil [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Bilfinger, Thomas V. [Abstract] [Full Text]; Bitkover, Catarina Y. [Abstract] [Full Text]; Blaffart, Francine [Abstract] [Full Text]; Blomström, Per [Abstract] [Full Text]; Blomström-Lundqvist, Carina [Abstract] [Full Text]; Boehle, Arnd S. [Abstract] [Full Text]; Boehm, Dieter H. [Abstract] [Full Text]; Bohn, Desmond J. [Abstract] [Full Text]; Bolman, R. Morton, III [Abstract] [Full Text]; Bond, Brian R. [Abstract] [Full Text]; Borges, Michael F. [Full Text]; Boston, Umar S. [Abstract] [Full Text]; Bousamra, Michael, II [Abstract] [Full Text]; Boyce, Steven W. [Abstract] [Full Text]; Brady, Peter W. [Abstract] [Full Text]; Bridges, Nancy D. [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Bruschi, Giuseppe [Abstract] [Full Text]; Buche, Michel [Full Text]; Buehner, Susan M. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]
C: Cameron, Duke E. [Abstract] [Full Text]; Cameron, Duke E. [Abstract] [Full Text]; Campanella, Ciro [Abstract] [Full Text]; Cannata, Aldo [Abstract] [Full Text]; Cao, Zhi-Li [Abstract] [Full Text]; Cerfolio, Robert J. [Full Text]; Chamberlain, Martin H. [Abstract] [Full Text]; Chandrasekaran, Venkatachalam [Abstract] [Full Text]; Charlson, Mary E. [Full Text]; Chitwood, W. Randolph, Jr [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Choudhary, Shiv Kumar [Abstract] [Full Text]; Chu, Victor F. [Abstract] [Full Text]; Chung, Mina K. [Abstract] [Full Text]; Clements, Scott [Abstract] [Full Text]; Coady, Michael A. [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Cook, David J. [Abstract] [Full Text]; Cornel, Garry [Abstract] [Full Text]; Corno, Antonio F. [Full Text]; Corso, Paul J. [Abstract] [Full Text]; Coulson, Alan S. [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Crawford, Fred A., Jr [Abstract] [Full Text]; Crowell, Richard E. [Abstract] [Full Text]; Crumbley, Arthur J., III [Abstract] [Full Text]; Cryer, Colin W. [Abstract] [Full Text]
D: D’Ancona, Giuseppe [Full Text]; Daddi, Giuliano [Abstract] [Full Text]; Daddi, Niccolò [Abstract] [Full Text]; Dangas, George [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; de Graaf, Ruud [Abstract] [Full Text]; de Mol, Bas A.J.M. [Abstract] [Full Text]; Deal, Barbara J. [Abstract] [Full Text]; Dearani, Joseph A. [Abstract] [Full Text]; Defraigne, Jean-Olivier [Abstract] [Full Text]; Del Campo, Carlos [Full Text]; Delius, Ralph E. [Abstract] [Full Text]; Della Pona, Claudio [Abstract] [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Detter, Christian [Abstract] [Full Text]; Dewald, Oliver [Abstract] [Full Text]; Di Meo, Antonio [Abstract] [Full Text]; Diegeler, Anno [Abstract] [Full Text]; Dodge-Khatami, Ali [Abstract] [Full Text]; Dohrmann, Peter [Abstract] [Full Text]; Dorman, B. Hugh [Abstract] [Full Text]; Dox, Hector A. [Abstract] [Full Text]; Dragsund, Morten [Abstract] [Full Text]; Dullum, Mercedes K.C. [Abstract] [Full Text]; Durham, Samuel J. [Abstract] [Full Text]; Dyamenahalli, Umesh [Abstract] [Full Text]
E: Easterling, Caryn S. [Abstract] [Full Text]; Elami, Amir [Full Text]; Elbeery, Joseph R. [Abstract] [Full Text]; Elefteriades, John A. [Abstract] [Full Text]; Ellis, William J. [Full Text]; Endo, Shunsuke [Full Text]; Engoren, Milo [Abstract] [Full Text]; Eucher, Philippe M. [Full Text]
F: Falk, Volkmar [Abstract] [Full Text]; Farabi, Raffaele [Abstract] [Full Text]; Ferraro, Pasquale [Abstract] [Full Text]; Flameng, Willem J. [Abstract] [Full Text]; Fosse, Erik [Full Text]; Francalancia, Nicola A. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Fujii, Susumu [Abstract] [Full Text]
G: Garcia, Jorge M. [Abstract] [Full Text]; Gatzoulis, Michael A. [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Gebhard, Florian [Abstract] [Full Text]; Gherli, Tiziano [Abstract] [Full Text]; Gialletti, Rodolfo [Abstract] [Full Text]; Girardi, Leonard [Abstract] [Full Text]; Goh, Kazutomo [Abstract] [Full Text]; Gold, Jeffrey P. [Full Text]; Goldman, Scott M. [Abstract] [Full Text]; Goldman, Scott M. [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Grady, Thomas A. [Abstract] [Full Text]; Greenberg, Joel D. [Abstract] [Full Text]; Grocott, Hilary P. [Abstract] [Full Text]; Gulbins, Helmut [Abstract] [Full Text]; Gundry, Steven R. [Abstract] [Full Text]; Gusberg, Richard J. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Habib, Robert H. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hansell, Peter [Abstract] [Full Text]; Hara, Takuo [Abstract] [Full Text]; Harringer, Wolfgang [Abstract] [Full Text]; Hartman, Gregg S. [Full Text]; Haruna, Masaki [Abstract] [Full Text]; Hasegawa, Tsuyoshi [Full Text]; Hasegawa, Tsuyoshi [Abstract] [Full Text]; Haskard, Dorian O. [Abstract] [Full Text]; Hata, Atsushi [Full Text]; Haverich, Axel [Abstract] [Full Text]; Henne-Bruns, Doris [Abstract] [Full Text]; Herlong, J. René [Abstract] [Full Text]; Herlong, J. René [Abstract] [Full Text]; Hill, Steven E. [Abstract] [Full Text]; Hill, Steven E. [Abstract] [Full Text]; Hiramatsu, Takeshi [Abstract] [Full Text]; Hirooka, Eiji [Abstract] [Full Text]; Hirsch, Robert [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Horan, Thomas A. [Full Text]
I: Iacono, Aldo T. [Abstract] [Full Text]; Iguro, Yoshifumi [Full Text]; Ikeda, Masahiro [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Iseki, Hiroyoshi [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]; Itoh, Tsuyoshi [Abstract] [Full Text]; Ivry, Simon [Abstract] [Full Text]
J: Jackson, Kenneth [Full Text]; Jacobs, Jeffrey P. [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Marshall L. [Abstract] [Full Text]; Jacobs, Marshall L. [Abstract] [Full Text]; Jacobs, Marshall L. [Abstract] [Full Text]; Jacobs, Marshall L. [Abstract] [Full Text]; Jacobs, Marshall L. [Abstract] [Full Text]; Jaggers, James J. [Abstract] [Full Text]; Jaggers, James J. [Abstract] [Full Text]; Jamart, Jacques [Full Text]; Jidéus, Lena [Abstract] [Full Text]; Joffs, Cassandra [Abstract] [Full Text]; John, Colin N. [Abstract] [Full Text]; John, Stanley [Abstract] [Full Text]; Jones, Ellis L. [Abstract] [Full Text]; Joste, Nancy E. [Abstract] [Full Text]
K: Kalangos, Afksendiyos [Full Text]; Kalthoff, Holger [Abstract] [Full Text]; Kanter, Kirk R. [Full Text]; Karabay, Ozalp [Abstract] [Full Text]; Karamanoukian, Hratch L. [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Kato, Hiroshi [Abstract] [Full Text]; Kawasuji, Michio [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kern, Mark K. [Abstract] [Full Text]; Khaitan, Leena [Abstract] [Full Text]; Kim, Peter Y. [Abstract] [Full Text]; Kimball, Thomas R. [Abstract] [Full Text]; Kjaergard, Henrik K. [Abstract] [Full Text]; Klima, Uwe [Abstract] [Full Text]; Kline, David G. [Full Text]; Kloek, Jaap J. [Abstract] [Full Text]; Kohn, Alejandro [Abstract] [Full Text]; Kopf, Gary S. [Abstract] [Full Text]; Koutlas, Theodore C. [Abstract] [Full Text]; Koyama, Isamu [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Koyanagi, Toshiya [Abstract] [Full Text]; Kozlik-Feldmann, Rainer [Abstract] [Full Text]; Kratz, John M. [Abstract] [Full Text]; Krukenkamp, Irvin B. [Abstract] [Full Text]; Kyo, Shunei [Abstract] [Full Text]
L: Lacour-Gayet, François [Abstract] [Full Text]; Lacour-Gayet, François [Abstract] [Full Text]; Lamberti, John J. [Abstract] [Full Text]; Landis, R. Clive [Abstract] [Full Text]; Lanfranconi, Marco [Abstract] [Full Text]; Lang, Ivan M. [Abstract] [Full Text]; Larbuisson, Robert [Abstract] [Full Text]; Lardenoye, Jan-Willem H. [Abstract] [Full Text]; Lardenoye, Jan-Willem H. [Abstract] [Full Text]; Larsen, Ranae L. [Abstract] [Full Text]; Leuschner, Ivo [Abstract] [Full Text]; Lichtenberg, Artur [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Limet, Raymond [Abstract] [Full Text]; Lloyd, Clinton T. [Abstract] [Full Text]; Lodi, Renzo [Abstract] [Full Text]; Lotto, Attilio A. [Abstract] [Full Text]; Louagie, Yves A.G. [Full Text]; Lunkenheimer, Paul P. [Abstract] [Full Text]
M: Maier, Alfred [Abstract] [Full Text]; Manning, Peter B. [Abstract] [Full Text]; Marcusson, Eva [Abstract] [Full Text]; Marsh, Christopher L. [Full Text]; Massera, Fabio [Abstract] [Full Text]; Mathur, Alok [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Maziak, Donna E. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; Mehta, Sanjay M. [Abstract] [Full Text]; Mehta, Sanjay M. [Abstract] [Full Text]; Mehta, Sanjay M. [Abstract] [Full Text]; Merchant, Naeem [Abstract] [Full Text]; Meyns, Bart P. [Abstract] [Full Text]; Mitruka, Surindra N. [Abstract] [Full Text]; Miyaji, Kagami [Abstract] [Full Text]; Moelstad, Per [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Moore, Phillip [Abstract] [Full Text]; Moran, Jon F. [Abstract] [Full Text]; Morgan, Ian S. [Abstract] [Full Text]; Moriyama, Yukinori [Full Text]; Mossad, Sherif B. [Full Text]; Multani, Marlina M. [Abstract] [Full Text]; Munk, Marc-David [Abstract] [Full Text]; Muscolino, Giuseppe [Abstract] [Full Text]; Myers, John L. [Abstract] [Full Text]; Myers, John L. [Abstract] [Full Text]; Myers, John L. [Abstract] [Full Text]
N: Nadolny, Edward [Full Text]; Nagamine, Hiroshi [Abstract] [Full Text]; Naito, Kozo [Abstract] [Full Text]; Nashef, Samer A.M. [Abstract] [Full Text]; Natsuaki, Masafumi [Abstract] [Full Text]; Netz, Heinrich [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Ngaage, Dumbor L. [Abstract] [Full Text]; Nguyen, Duc Q. [Abstract] [Full Text]; Nguyen, Khanh H. [Abstract] [Full Text]; Niinami, Hiroshi [Abstract] [Full Text]; Nikas, Dimitri J. [Abstract] [Full Text]; Nilsson, Leif [Abstract] [Full Text]; Nishimori, Hideaki [Full Text]; Nitschke, Terilynn [Abstract] [Full Text]; Nordstrand, Kenneth [Abstract] [Full Text]
O: Oda, Makoto [Abstract] [Full Text]; Ogawa, Kyoichi [Abstract] [Full Text]; Ohkubo, Nobukazu [Abstract] [Full Text]; Öhman, Lena [Abstract] [Full Text]; Ohta, Yasuhiko [Abstract] [Full Text]; Ojito, Jorge W. [Abstract] [Full Text]; Oka, Shigeteru [Abstract] [Full Text]; Okazaki, Yukio [Abstract] [Full Text]; Omoto, Ryozo [Abstract] [Full Text]; Ootaki, Yoshio [Abstract] [Full Text]; Ormaza, Sofia [Abstract] [Full Text]; Orons, Philip D. [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Oto, Oztekin [Abstract] [Full Text]; Oxorn, Donald C. [Full Text]; Ozaki, Shigeyuki [Abstract] [Full Text]
P: Pairolero, Peter C. [Abstract] [Full Text]; Parenteau, Gary L. [Abstract] [Full Text]; Park, Soon J. [Abstract] [Full Text]; Parolari, Alessandro [Abstract] [Full Text]; Petrossian, Edwin [Abstract] [Full Text]; Pfaffendorf, Martin [Abstract] [Full Text]; Pfister, Albert J. [Abstract] [Full Text]; Phillips-Bute, Barbara [Abstract] [Full Text]; Phillips-Bute, Barbara [Abstract] [Full Text]; Pincemail, Joël [Abstract] [Full Text]; Pitsis, Antonis A. [Abstract] [Full Text]; Polvani, GianLuca [Abstract] [Full Text]; Pontefract, David R. [Abstract] [Full Text]; Pool, Duane P. [Abstract] [Full Text]; Porat, Eyal [Abstract] [Full Text]; Prior, Jeff J. [Full Text]; Prough, Donald S. [Full Text]; Puma, Francesco [Abstract] [Full Text]; Puskas, John D. [Abstract] [Full Text]
Q: Quintessenza, James A. [Abstract] [Full Text]; Quintessenza, James A. [Abstract] [Full Text]; Quintessenza, James A. [Abstract] [Full Text]; Quintessenza, James A. [Abstract] [Full Text]
R: Ransjö, Ulrika [Abstract] [Full Text]; Rauch, Thomas [Abstract] [Full Text]; Ravikumar, Edwin [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Redmann, Klaus [Abstract] [Full Text]; Redmond, J. Mark [Full Text]; Redmond, J. Mark [Abstract] [Full Text]; Reed, Carolyn E. [Full Text]; Rehak, Peter [Abstract] [Full Text]; Reichart, Bruno [Abstract] [Full Text]; Reichart, Bruno [Abstract] [Full Text]; Reichenspurner, Hermann [Abstract] [Full Text]; Reid, Craig W. [Abstract] [Full Text]; Reves, Joseph G. [Abstract] [Full Text]; Reves, Joseph G. [Abstract] [Full Text]; Rialas, Christos M. [Abstract] [Full Text]; Ricci, Marco [Full Text]; Ring, W. Steves [Abstract] [Full Text]; Rinia-Feenstra, Myra [Abstract] [Full Text]; Riordan, Christopher J. [Abstract] [Full Text]; Rizzi, Adriano [Abstract] [Full Text]; Roberts, Charles S. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robustellini, Mario [Abstract] [Full Text]; Rocchini, Albert P. [Abstract] [Full Text]; Rocco, Gaetano [Abstract] [Full Text]; Rodriguez, Rosendo A. [Abstract] [Full Text]; Ross, Donald E. [Abstract] [Full Text]; Rossi, Gerolamo [Abstract] [Full Text]; Roy, Nathalie [Abstract] [Full Text]; Rubini, Patrizia [Abstract] [Full Text]; Russo, Claudio [Abstract] [Full Text]
S: Saatvedt, Kjell [Abstract] [Full Text]; Sade, Robert M. [Abstract] [Full Text]; Sadoff, John D. [Abstract] [Full Text]; Sahoo, Manoranjan [Abstract] [Full Text]; Sakakibara, Naoki [Abstract] [Full Text]; Salaymeh, Khaled J. [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Sánchez-Quintana, Damian [Abstract] [Full Text]; Santoprete, Stefano [Abstract] [Full Text]; Santos, Gil Hauer [Abstract] [Full Text]; Sasaguri, Shiro [Full Text]; Sasajima, Tadahiro [Abstract] [Full Text]; Schepens, Marc A.A.M. [Full Text]; Scheule, Albertus M. [Full Text]; Schilling, Lars-Oliver [Abstract] [Full Text]; Schmitz, Christoph [Abstract] [Full Text]; Schneider, Felix [Abstract] [Full Text]; Schoevaerdts, Jean-Claude [Full Text]; Schulze, Costas [Abstract] [Full Text]; Schwann, Thomas A. [Abstract] [Full Text]; Sellke, Frank W. [Full Text]; Shaker, Reza [Abstract] [Full Text]; Shamji, Farid M. [Abstract] [Full Text]; Shapira, Oz M. [Full Text]; Sharma, Rajesh [Abstract] [Full Text]; Sharony, Ram [Abstract] [Full Text]; Sherman, Jon R. [Full Text]; Shimizu, Junzo [Abstract] [Full Text]; Shimokawa, Shinji [Full Text]; Silistreli, Erdem [Abstract] [Full Text]; Slim, Michel S. [Full Text]; Sloan, Timothy J. [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Smolle, Josef [Abstract] [Full Text]; Smolle-Jüttner, Freyja M. [Abstract] [Full Text]; Sohara, Yasunori [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Splinter, William M. [Abstract] [Full Text]; Spray, Thomas L. [Abstract] [Full Text]; Spray, Thomas L. [Abstract] [Full Text]; Stamenkovic, Steven A. [Abstract] [Full Text]; Stamou, Sotiris C. [Abstract] [Full Text]; Stefani, Alessandro [Abstract] [Full Text]; Stefano, George B. [Abstract] [Full Text]; Stefanou, Demetrios C. [Abstract] [Full Text]; Stooker, Wim [Abstract] [Full Text]; Stridsberg, Mats [Abstract] [Full Text]; Sungurtekin, Hulya [Abstract] [Full Text]; Sutter, Francis P. [Abstract] [Full Text]; Sutter, Francis P. [Abstract] [Full Text]; Svensson, Lars G. [Full Text]
T: Tahta, Stephen A. [Abstract] [Full Text]; Takanashi, Yoshinori [Abstract] [Full Text]; Takemura, Hirofumi [Abstract] [Full Text]; Tanaka, Yoko [Abstract] [Full Text]; Taylor, Kenneth M. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Tegnell, Anders [Abstract] [Full Text]; Tei, Teruo [Abstract] [Full Text]; Temes, R. Thomas [Abstract] [Full Text]; Terada, Masatsugu [Abstract] [Full Text]; Tiziano, Colombo [Abstract] [Full Text]; Tjomsland, Ole [Abstract] [Full Text]; Tocchi, Adriano [Abstract] [Full Text]; Tomaselli, Florian [Abstract] [Full Text]; Toscano, Thomas [Abstract] [Full Text]; Trastek, Victor F. [Abstract] [Full Text]; Trumbull, Horace R. [Abstract] [Full Text]; Tsuda, Naoya [Abstract] [Full Text]; Tsukui, Hiroyuki [Abstract] [Full Text]; Tworetzky, Wayne [Abstract] [Full Text]
U: Ueno, Tetsuya [Abstract] [Full Text]; Ugurlu, Baran S. [Abstract] [Full Text]; Underwood, Malcolm J. [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Urbani, Moira [Abstract] [Full Text]; Uretzky, Gideon [Abstract] [Full Text]
V: Van Arsdell, Glen S. [Abstract] [Full Text]; van Wermeskerken, Gijs K. [Abstract] [Full Text]; van Wermeskerken, Gijs K. [Abstract] [Full Text]; van Zwieten, Pieter A. [Abstract] [Full Text]; Vassileva, Christina M. [Abstract] [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Vidne, Bernardo A. [Full Text]; Vitali, Ettore [Abstract] [Full Text]; Vosswinkel, James A. [Abstract] [Full Text]; Vricella, Luca A. [Abstract] [Full Text]
W: Walters, Henry L., III [Abstract] [Full Text]; Walters, Henry L., III [Abstract] [Full Text]; Watanabe, Shun-ichi [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Webb, Gary D. [Abstract] [Full Text]; Weerasena, Nihal A. [Abstract] [Full Text]; Weinberg, Paul M. [Abstract] [Full Text]; Weinstock, Martin [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Welz, Armin [Abstract] [Full Text]; Welz, Armin [Abstract] [Full Text]; Wernly, Jorge A. [Abstract] [Full Text]; White, David R. [Abstract] [Full Text]; White, Jeffrey A. [Abstract] [Full Text]; Whitlark, Joseph D. [Abstract] [Full Text]; Wildhirt, Stephen [Abstract] [Full Text]; Wilkinson, James L. [Abstract] [Full Text]; Williams, J. Mark [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Winston, A. Daniel [Abstract] [Full Text]; Wright, Carolyn E. [Abstract] [Full Text]
X: Xin, Wang [Abstract] [Full Text]
Y: Yamaguchi, Masahiro [Abstract] [Full Text]; Yamamoto, Hiroshi [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]; Yousem, Samuel A. [Abstract] [Full Text]
Z: Zacharias, Anoar [Abstract] [Full Text]; Zanobini, Marco [Abstract] [Full Text]; Zellner, James L. [Abstract] [Full Text]; Ziemer, Gerhard [Full Text]; Zikri, Magued [Abstract] [Full Text]