ATS -- Index by Author (67 [2])

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Index by Author: Volume 67, Issue 2 (February 1999) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tomio [Full Text]; Agarwal, Ravi [Abstract] [Full Text]; Ajit, Mullasari [Abstract] [Full Text]; Akhter, Mohammed [Abstract] [Full Text]; Alavi, Mosen [Full Text]; Albers, Jörg [Abstract] [Full Text]; Allen, Keith B. [Abstract] [Full Text]; Allred, Bryce D. [Abstract] [Full Text]; Alonso, Anselmo [Abstract] [Full Text]; Andou, Akio [Abstract] [Full Text]; Angelini, Gianni D. [Full Text]; Annanata, Madhu [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Apostolidou, Ioanna A. [Abstract] [Full Text]; Arumugam, Sarasa B. [Abstract] [Full Text]; Ash, Arlene S. [Abstract] [Full Text]; Atassi, Wassim [Abstract] [Full Text]
B: Bîrsan, Tudor [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Bandyopadhyay, Ashok [Full Text]; Bao, Yusheng [Abstract] [Full Text]; Barner, Hendrick B. [Full Text]; Baskett, Roger J.F. [Abstract] [Full Text]; Batirel, Hasan F. [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Benge, William [Abstract] [Full Text]; Bergs, Peter [Abstract] [Full Text]; Birks, Eric K. [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Borger, Michael A. [Abstract] [Full Text]; Bortolotti, Uberto [Abstract] [Full Text]; Bourke, John P. [Abstract] [Full Text]; Bousamra, Michael, II [Abstract] [Full Text]; Brasil, Luiz A. [Full Text]; Bril, Vera [Full Text]; Brizard, Christian P.R. [Abstract] [Full Text]; Brock, Malcolm V. [Abstract] [Full Text]; Brodman, Richard F. [Full Text]; Broekhuis, Eli [Abstract] [Full Text]; Brooks, Maria Mori [Abstract] [Full Text]; Brunelli, Alessandro [Abstract] [Full Text]; Buffolo, Enio [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Campbell, Ronald W.F. [Abstract] [Full Text]; Carle, Flavia [Abstract] [Full Text]; Carrier, Michel [Abstract] [Full Text]; Cartier, Raymond [Abstract] [Full Text]; Cartier, Paul C. [Abstract] [Full Text]; Casselman, Filip P. [Abstract] [Full Text]; Castedo, Evaristo [Full Text]; Cetta, Frank [Abstract] [Full Text]; Chammas, Joseph H. [Abstract] [Full Text]; Chandler, Brian M. [Full Text]; Cherian, Kottoorathu M. [Abstract] [Full Text]; Choo, Suk Jung [Full Text]; Cihan, Hasan B. [Abstract] [Full Text]; Classen, David C. [Abstract] [Full Text]; Clubb, Fred J., Jr [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Coffin, Olivier [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Cohen, Allen J. [Abstract] [Full Text]; Cohn, William E. [Abstract] [Full Text]; Conger, Jeff L. [Abstract] [Full Text]; Connolly, Heidi M. [Abstract] [Full Text]; Cooper, Joel D. [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Cowley, Cris G. [Abstract] [Full Text]; Culver, Bruce [Abstract] [Full Text]
D: Date, Hiroshi [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; De Carlo, Marco [Abstract] [Full Text]; De Simone, Raffaele [Abstract] [Full Text]; DeLeon, Serafin Y. [Abstract] [Full Text]; Desaulniers, Denis [Abstract] [Full Text]; Despotis, George J. [Abstract] [Full Text]; Detre, Katherine M. [Abstract] [Full Text]; Di Giammarco, Gabriele [Abstract] [Full Text]; Dion, Robert A. [Abstract] [Full Text]; Doyle, Daniel P. [Abstract] [Full Text]; DuBroff, Robert [Abstract] [Full Text]; Dumesnil, Jean G. [Abstract] [Full Text]; Duran, Carlos M.G. [Full Text]
E: Eidem, Benjamin W. [Abstract] [Full Text]; El Khoury, Gebrin A. [Abstract] [Full Text]; Elkins, Ronald C. [Full Text]
F: Faber, L. Penfield [Abstract] [Full Text]; Falaschi, Fabio [Abstract] [Full Text]; Farinas, Jean-Marc [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Fianchini, Aroldo [Abstract] [Full Text]; Fox, Antony D. [Abstract] [Full Text]; Frazier, O.H. [Abstract] [Full Text]; Frye, Robert L. [Abstract] [Full Text]; Fukuda, Tomonobu [Full Text]; Furnary, Anthony P. [Abstract] [Full Text]; Furniss, Stephen S. [Abstract] [Full Text]
G: Gan D, Mohan [Full Text]; Gardner, Scott C. [Abstract] [Full Text]; Gatzoulis, Michael A. [Abstract] [Full Text]; Gay, William A., Jr [Abstract] [Full Text]; Gazzaniga, Alan B. [Abstract] [Full Text]; Genoni, Michele [Abstract] [Full Text]; Georgiade, Gregory [Abstract] [Full Text]; Germann, Reinhard [Abstract] [Full Text]; Gesuita, Rosaria [Abstract] [Full Text]; Ghali, William A. [Abstract] [Full Text]; Gillinov, A. Marc [Abstract] [Full Text]; Glombitza, Gerald [Abstract] [Full Text]; Goenen, Martin J. [Abstract] [Full Text]; Gomes, Walter J. [Full Text]; Goto, Tomoko [Abstract] [Full Text]; Graham, Lynn C. [Abstract] [Full Text]; Gray, William A. [Abstract] [Full Text]; Gray, Janine [Abstract] [Full Text]; Grillo, Hermes C. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]
H: Hébert, Yves [Abstract] [Full Text]; Hagl, Siegfried [Abstract] [Full Text]; Hake, Ulrich [Full Text]; Hall, Ruth E. [Abstract] [Full Text]; Hartz, Renée S. [Full Text]; Hauptmann, Edward L. [Abstract] [Full Text]; Hauser, Markus [Abstract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Hawes, Robert H. [Abstract] [Full Text]; Hayashi, Jun-ichi [Full Text]; Hechter, Sloane [Abstract] [Full Text]; Hennig, Ewald [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hilker, Michael [Full Text]; Hill, Gary E. [Abstract] [Full Text]; Hilton, Colin J. [Abstract] [Full Text]; Hirata, Nobuaki [Abstract] [Full Text]; Hodin, Richard A. [Abstract] [Full Text]; Hoenig, Stephen J. [Abstract] [Full Text]; Hoffman, Brenda J. [Abstract] [Full Text]; Hogue, Charles W., Jr [Abstract] [Full Text]; Hosoda, Yasuyuki [Full Text]
I: Ichiba, Shingo [Abstract] [Full Text]; Iida, Hiroshi [Abstract] [Full Text]; Ilse, Werner K. [Full Text]; Immerman, Steven C. [Abstract] [Full Text]; Itano, Hideki [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: Jackson, Hollie A. [Abstract] [Full Text]; Jacobs, Elizabeth R. [Abstract] [Full Text]; Jacquet, Luc M. [Abstract] [Full Text]; Jamieson, Stuart W. [Abstract] [Full Text]; Jaretzki, Alfred, III [Full Text]; Javorski, Joseph J. [Abstract] [Full Text]; Jenni, Rolf [Abstract] [Full Text]; Jenni, Rolf [Abstract] [Full Text]; Jensen, Robert T. [Abstract] [Full Text]; Jin, Xu Y. [Abstract] [Full Text]; Johnston, Michael V. [Abstract] [Full Text]
K: Kadipasaoglu, Kamuran A. [Abstract] [Full Text]; Kapoor, Lalit [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Karmy-Jones, Riyad [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Keller, Norma M. [Abstract] [Full Text]; Kells, Catherine [Full Text]; Kelsey, Sheryl F. [Abstract] [Full Text]; Khan, Shahi [Abstract] [Full Text]; Kidwell, Francis E. [Abstract] [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Kojic, Jasna [Full Text]; Kole, Shrikant D. [Full Text]; Komeda, Masashi [Abstract] [Full Text]; Koshino, Tokuo [Full Text]; Kouchoukos, Nicholas T. [Full Text]; Krellenstein, Daniel J. [Abstract] [Full Text]; Kuo, Elbert Y. [Abstract] [Full Text]; Kupilik, Natascha [Abstract] [Full Text]; Kurian, Valikapathalil M. [Abstract] [Full Text]; Kwon, Christopher C. [Abstract] [Full Text]
L: Lachat, Mario L. [Abstract] [Full Text]; Lajos, Thomas Z. [Abstract] [Full Text]; Lammle, W. Greg [Abstract] [Full Text]; Lange, Mary S. [Abstract] [Full Text]; Lappas, Demetrios G. [Abstract] [Full Text]; Laudito, Antonio [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Lazzara, Robert R. [Abstract] [Full Text]; Lemieux, Michel D. [Abstract] [Full Text]; Lenner, Roberta [Abstract] [Full Text]; Lin, Jeffrey C. [Abstract] [Full Text]; Loebe, Matthias [Abstract] [Full Text]; Long, James W. [Abstract] [Full Text]; Loop, Floyd D. [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Métras, Jacques [Abstract] [Full Text]; MacDougall, Carolyn E. [Abstract] [Full Text]; Maddestra, Nicola [Abstract] [Full Text]; March, Robert J. [Full Text]; Mares, Peter [Abstract] [Full Text]; Markewitz, Andreas [Full Text]; Marks, John D. [Abstract] [Full Text]; Masai, Takafumi [Abstract] [Full Text]; Massetti, Massimo [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Matta, Amin J. [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mazzei, Valerio [Abstract] [Full Text]; McCawley, Colleen A. [Abstract] [Full Text]; McComb, Janet M. [Abstract] [Full Text]; McDonald, Monica L. [Abstract] [Full Text]; McKellar, Stephen H. [Abstract] [Full Text]; McKeown, Peter P. [Full Text]; McLean, Ronald H. [Abstract] [Full Text]; Mee, Roger B.B. [Abstract] [Full Text]; Meinzer, Hans-Peter [Abstract] [Full Text]; Miki, Shigehito [Abstract] [Full Text]; Milano, Carmelo A. [Abstract] [Full Text]; Milano, Aldo [Abstract] [Full Text]; Miller, Daniel L. [Abstract] [Full Text]; Mishra, Girish [Abstract] [Full Text]; Miyamoto, Tadaomi-Alfonso [Abstract] [Full Text]; Mochizuki, Yoshihiko [Abstract] [Full Text]; Mock, Michael B. [Abstract] [Full Text]; Moncure, Ashby C. [Abstract] [Full Text]; Montero, Carlos Garcia [Full Text]; Mori, Hideaki [Abstract] [Full Text]; Morioka, Koichi [Abstract] [Full Text]; Morishita, Kiyofumi [Full Text]; Moro, Hisanaga [Full Text]; Morris, Steven F. [Abstract] [Full Text]; Moskowitz, Mark A. [Abstract] [Full Text]; Muhlbaier, Lawrence H. [Abstract] [Full Text]; Mullany, Charles J. [Abstract] [Full Text]; Murphy, David A. [Full Text]; Mussi, Alfredo [Abstract] [Full Text]
N: Nagorney, David M. [Abstract] [Full Text]; Nakayama, Yoshihiro [Abstract] [Full Text]; Nam, Myung H. [Abstract] [Full Text]; Neis, Pat [Abstract] [Full Text]; Nelin, Leif D. [Abstract] [Full Text]; Neri, Eugenio [Abstract] [Full Text]; Newman, Roxanne V. [Abstract] [Full Text]; Nishimura, Rick A. [Abstract] [Full Text]; Noda, Seiichi [Abstract] [Full Text]; Noirhomme, Philippe H. [Abstract] [Full Text]; Norton, Jeffrey A. [Abstract] [Full Text]; Novak, Gordon [Abstract] [Full Text]
O: Ogino, Hitoshi [Abstract] [Full Text]; Ohtake, Shigeaki [Abstract] [Full Text]; Okamura, Yoshitaka [Abstract] [Full Text]; Olearchyk, Andrew S. [Full Text]; Orringer, Mark B. [Full Text]; Oswal, Dilip [Full Text]
P: Pagni, Sebastian [Full Text]; Palafox, Brian A. [Abstract] [Full Text]; Paloscia, Leonardo [Abstract] [Full Text]; Parandian, Bahman B. [Abstract] [Full Text]; Parsons, Eric M. [Abstract] [Full Text]; Parviz, Maryam [Abstract] [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Pellerin, Michel [Abstract] [Full Text]; Pelletier, L. Conrad [Abstract] [Full Text]; Perrault, Louis P. [Abstract] [Full Text]; Perryman, Richard A. [Abstract] [Full Text]; Peter, Sanjeeth [Abstract] [Full Text]; Peterson, Richard J. [Abstract] [Full Text]; Phillips-Hughes, Jane [Abstract] [Full Text]; Pillai, Ravi [Abstract] [Full Text]; Pitsis, Antonis A. [Full Text]; Prêtre, René [Full Text]; Presberg, Kenneth W. [Abstract] [Full Text]
R: Raghu, Ganesh [Abstract] [Full Text]; Rajan, Sethuratnam [Abstract] [Full Text]; Rao, Vivek [Abstract] [Full Text]; Raymond, Gilles [Abstract] [Full Text]; Reed, Carolyn E. [Abstract] [Full Text]; Reed, Carolyn E. [Full Text]; Rivers, Samuel [Abstract] [Full Text]; Roake, Justin [Abstract] [Full Text]; Roberts, Andrew M. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Ross, David B. [Abstract] [Full Text]; Roughneen, Patrick T. [Abstract] [Full Text]
S: Sahai, Anand V. [Abstract] [Full Text]; Sakaguchi, Taichi [Abstract] [Full Text]; Sakata, Ryuzo [Abstract] [Full Text]; Salomão, Reinaldo [Full Text]; Sartori, Michele [Abstract] [Full Text]; Sasaguri, Shiro [Full Text]; Sassi, Carlo [Abstract] [Full Text]; Sawa, Yoshiki [Abstract] [Full Text]; Schüpbach, Rolf W. [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schmidlin, Daniel [Abstract] [Full Text]; Schwarz, Urs [Abstract] [Full Text]; Shaar, Carl J. [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shields, Thomas W. [Abstract] [Full Text]; Shimada, Koichiro [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Skubas, Nikolaos J. [Abstract] [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Sogawa, Masakazu [Full Text]; Spence, Paul A. [Full Text]; Starr, Albert [Abstract] [Full Text]; Sullivan, John A. [Full Text]; Sutton-Tyrrell, Kim [Abstract] [Full Text]; Svensson, Lars G. [Full Text]
T: Taghavi, Shahrokh [Abstract] [Full Text]; Tahata, Takafumi [Abstract] [Full Text]; Takkenberg, Johanna J.M. [Abstract] [Full Text]; Teirstein, Alvin S. [Abstract] [Full Text]; Teodori, Giovanni [Abstract] [Full Text]; Thistlethwaite, Patricia A. [Abstract] [Full Text]; Thubrikar, Mano [Full Text]; Treanor, Patrick R. [Abstract] [Full Text]; Troncoso, Juan C. [Abstract] [Full Text]; Tseng, Elaine E. [Abstract] [Full Text]; Tsuchiya, Ryosuke [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]
U: Ueda, Yuichi [Abstract] [Full Text]; Ugarte, Juan [Full Text]; Ura, Masashi [Abstract] [Full Text]
V: Vahl, Christian-Friedrich [Abstract] [Full Text]; Vallieres, Eric [Abstract] [Full Text]; Van Dyck, Michel J. [Abstract] [Full Text]; van Herwerden, Lex A. [Abstract] [Full Text]; Vaughn, Cecil C. [Abstract] [Full Text]; Vitolla, Giuseppe [Abstract] [Full Text]; Vitullo, Dolores A. [Abstract] [Full Text]; Vogt, Paul R. [Abstract] [Full Text]; Vogt, Paul R. [Abstract] [Full Text]
W: Wain, John C. [Abstract] [Full Text]; Walia, Abhay Singh [Full Text]; Walji, Salim [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Warren, William H. [Abstract] [Full Text]; Webb, Gary D. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weng, Yuguo [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Whiteley, Mark S. [Abstract] [Full Text]; Whitten, Charles W. [Abstract] [Full Text]; Wilkins, Earle W., Jr [Abstract] [Full Text]; Willekes, Charles L. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Wisser, Wilfried [Abstract] [Full Text]; Wolfe, Walter G. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wood, Douglas E. [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]
Y: Yamashita, Motohiro [Abstract] [Full Text]; Yang, Daping [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]
Z: Zünd, Gregor [Abstract] [Full Text]; Zerr, Kathryn J. [Abstract] [Full Text]; Zimarino, Marco [Abstract] [Full Text]; Zondervan, Pieter E. [Abstract] [Full Text]