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Index by Author: Volume 67, Issue 1 (January 1999) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: A. LaPierre, Robert [Abstract] [Full Text]; Abraham, Conny [Abstract] [Full Text]; Albanese, Sonia B. [Abstract] [Full Text]; Aleksic, Ivan [Abstract] [Full Text]; Ando, Motomi [Abstract] [Full Text]; Andrew, Marie J. [Full Text]; Aris, Alejandro [Full Text]; Arjomand, Heidar [Full Text]; Arpesella, Giorgio [Abstract] [Full Text]; Atkins, B. Zane [Abstract] [Full Text]; Austin, Conal [Abstract] [Full Text]
B: Baker, Robert A. [Full Text]; Ban, Toshihiko [Abstract] [Full Text]; Bandypadhyay, Ashok [Full Text]; Barner, Hendrick B. [Full Text]; Basenau, Daniela [Abstract] [Full Text]; Bauer, Erwin P. [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bayliff, Charles D. [Abstract] [Full Text]; Becker, Randy M. [Abstract] [Full Text]; Berger, Stuart [Abstract] [Full Text]; Black, Michael D. [Full Text]; Blanche, Carlos [Abstract] [Full Text]; Bleiweis, Mark S. [Abstract] [Full Text]; Blue, Mary E. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Borst, Cornelius [Abstract] [Full Text]; Bosek, Voytek [Abstract] [Full Text]; Boyer, Joseph H., Jr [Abstract] [Full Text]; Breuer, Christopher K. [Abstract] [Full Text]; Brizard, Christian P.R. [Abstract] [Full Text]; Brock, Malcolm V. [Abstract] [Full Text]; Bruggemans, Eline F. [Full Text]; Buffolo, Enio [Full Text]; Burdon, Thomas A. [Abstract] [Full Text]; Burnett, Clay M. [Abstract] [Full Text]; Burr, Lawrence H. [Abstract] [Full Text]; Busch, Thomas [Abstract] [Full Text]
C: Cameron, Duke E. [Abstract] [Full Text]; Canavy, Isabelle [Abstract] [Full Text]; Canter, Charles E. [Abstract] [Full Text]; Carnstam, Bo [Abstract] [Full Text]; Casimir-Ahn, Henrik [Abstract] [Full Text]; Caus, Thierry [Abstract] [Full Text]; Chan, Carmen S.Y. [Abstract] [Full Text]; Chang, H. Jewel [Abstract] [Full Text]; Chang, Byung-Chul [Abstract] [Full Text]; Chauvaud, Sylvain M. [Full Text]; Chaux, Aurelio [Abstract] [Full Text]; Check, William [Abstract] [Full Text]; Chen, Chih-Yi [Abstract] [Full Text]; Cherington, Michael [Full Text]; Chiu, Ray C.-J. [Full Text]; Cho, Sang-Ho [Abstract] [Full Text]; Choh, Joong H. [Full Text]; Chow, Louis T.C. [Abstract] [Full Text]; Chung, Namsik [Abstract] [Full Text]; Cipriani, Adriano [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Collard, Charles D. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Conhaim, Robert L. [Abstract] [Full Text]; Conklin, Lori D. [Abstract] [Full Text]; Corno, Antonio F. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Craig, Stewart R. [Full Text]; Crane, Charles R. [Full Text]; Cremer, Jochen [Abstract] [Full Text]
D: D’Agostino, Richard S. [Full Text]; Döring, Volker [Full Text]; Dalichau, Harald [Abstract] [Full Text]; Dark, John H. [Abstract] [Full Text]; Defauw, Jo J.A.M. [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Demertzis, Stefanos [Abstract] [Full Text]; Denton, Timothy A. [Abstract] [Full Text]; Doty, John R. [Abstract] [Full Text]; Duarte, Ignacio G. [Abstract] [Full Text]; Duncan, Brian W. [Abstract] [Full Text]; Dyke, Cornelius M. [Full Text]
E: Eberle, Balthasar [Abstract] [Full Text]; Echeverri, Alberto [Abstract] [Full Text]; Egan, Thomas M. [Abstract] [Full Text]; Eimoto, Tadaaki [Abstract] [Full Text]; Elenbaas, Theodoor W.O. [Abstract] [Full Text]; Elkins, Craig [Abstract] [Full Text]; Elmaci, Turkan [Abstract] [Full Text]; Erikson, John M. [Abstract] [Full Text]; Espada, Raphael [Abstract] [Full Text]; Ettedgui, José A. [Abstract] [Full Text]; Exil, Vernat [Abstract] [Full Text]
F: Fedderly, Raymond T. [Abstract] [Full Text]; Ferguson, Tom [Full Text]; Fradet, Guy J. [Abstract] [Full Text]; Fransen, Erik J. [Abstract] [Full Text]; Fujii, Yoshitaka [Abstract] [Full Text]; Fukai, Ichiro [Abstract] [Full Text]; Fulton, James O. [Abstract] [Full Text]; Furuse, Akira [Abstract] [Full Text]; Fuse, Katsuo [Abstract] [Full Text]
G: Gaissert, Henning A. [Abstract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Gammie, James S. [Full Text]; Garcia, Eric [Abstract] [Full Text]; Ghanayem, Nancy S. [Abstract] [Full Text]; Gibson, Derek G. [Abstract] [Full Text]; Gil Jaurena, Juan Miguel [Full Text]; Ginns, Leo C. [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Goh, Tiow H. [Abstract] [Full Text]; Gründeman, Paul F. [Abstract] [Full Text]; Grünenfelder, Jürg [Abstract] [Full Text]; Graeter, Thomas [Abstract] [Full Text]; Groh, Mark A. [Abstract] [Full Text]
H: Håkanson, Erik [Full Text]; Ha, Jong-Won [Abstract] [Full Text]; Hackert, Thilo [Abstract] [Full Text]; Hagl, Siegfried [Abstract] [Full Text]; Harris, Kevin M. [Abstract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Hayden, Robert I. [Abstract] [Full Text]; Hazama, Kenji [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Heijmen, Robin H. [Abstract] [Full Text]; Hetzer, Roland [Full Text]; Hiebert, Clement A. [Abstract] [Full Text]; Ho, Kenny C.H. [Abstract] [Full Text]; Hoffman, George M. [Abstract] [Full Text]; Hoffmann, Steven C. [Abstract] [Full Text]; Horio, Hirotoshi [Abstract] [Full Text]; Hsia, Jiun-Yi [Abstract] [Full Text]; Hsu, Chung-Ping [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Hurni, Michel [Abstract] [Full Text]; Hutcheson, Kelley A. [Abstract] [Full Text]; Huth, Ralf G. [Abstract] [Full Text]; Huysmans, Hans A. [Full Text]
I: Ikonomidis, John. S. [Abstract] [Full Text]; Inculet, Richard I. [Abstract] [Full Text]; Inoue, Youichi [Abstract] [Full Text]; Iorio, Fiore S. [Abstract] [Full Text]; Iwasa, Hideaki [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: Jamieson, W.R. Eric [Abstract] [Full Text]; Janusz, Michael T. [Abstract] [Full Text]; Jin, Xu Y. [Abstract] [Full Text]; Johnston, Michael V. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jones, David R. [Abstract] [Full Text]
K: Kageyama, Yoshihiko [Full Text]; Kampmann, Christoph [Abstract] [Full Text]; Kapoor, Lalit [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Karl, Tom R. [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Kavinsky, Clifford J. [Abstract] [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kawahito, Koji [Abstract] [Full Text]; Kazama, Shigeru [Full Text]; Kennedy, Renee S. [Abstract] [Full Text]; Kennedy, Jan C. [Abstract] [Full Text]; Kessel, Maryanne W. [Abstract] [Full Text]; Khan, Steven S. [Abstract] [Full Text]; Kido, Tetsuo [Abstract] [Full Text]; Kim, Jung-Taek [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Klövekorn, Wolf-Peter [Abstract] [Full Text]; Kneebone, Anthony C. [Full Text]; Knight, John L. [Full Text]; Kobayashi, Eiji [Abstract] [Full Text]; Komai, Hiroyoshi [Full Text]; Koshiji, Takaaki [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Kraus, William E. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Adam M. [Abstract] [Full Text]; Kuntz, Richard E. [Abstract] [Full Text]
L: Lönn, Urban [Abstract] [Full Text]; Lange, Mary S. [Abstract] [Full Text]; Lee, Richard [Abstract] [Full Text]; Lee, Richard [Abstract] [Full Text]; Letsou, George V. [Abstract] [Full Text]; Lewis, Cleveland W. [Abstract] [Full Text]; Li, Jian [Abstract] [Full Text]; Lichtenstein, Samuel V. [Abstract] [Full Text]; Liebermann-Meffert, Dorothea M.I. [Abstract] [Full Text]; Ling, Hilton [Abstract] [Full Text]; Litwin, S. Bert [Abstract] [Full Text]; Lombardi, Pierluca [Abstract] [Full Text]; Long, Robert F. [Abstract] [Full Text]; Lopukhin, Serguei Y. [Abstract] [Full Text]; Love, Robert B. [Abstract] [Full Text]; Lowenstein, Charles J. [Abstract] [Full Text]; Lytle, Bruce W. [Full Text]
M: Maessen, Jos G. [Abstract] [Full Text]; Malthaner, Richard A. [Abstract] [Full Text]; Marcelletti, Carlo F. [Abstract] [Full Text]; Marianeschi, Stefano M. [Abstract] [Full Text]; Marinelli, Giuseppe [Abstract] [Full Text]; Mas, Carlos [Abstract] [Full Text]; Masaoka, Akira [Abstract] [Full Text]; Mascarenhas, Daniel A.N. [Full Text]; Masetti, Paolo [Abstract] [Full Text]; Massel, David R. [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; Matsuda, Katsuhiko [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Mendeloff, Eric N. [Abstract] [Full Text]; Mermel, Leonard [Abstract] [Full Text]; Mesana, Thierry [Abstract] [Full Text]; Metais, Caroline [Abstract] [Full Text]; Metzdorff, Mark T. [Full Text]; Mikus, Piero M. [Abstract] [Full Text]; Miller, Joseph I., Jr [Abstract] [Full Text]; Minatoya, Kenji [Abstract] [Full Text]; Misawa, Yoshio [Abstract] [Full Text]; Miyagishima, Robert T. [Abstract] [Full Text]; Miyoshi, Yutaka [Full Text]; Mizuhara, Hisao [Abstract] [Full Text]; Mohr, Friedrich W. [Full Text]; Morgan, Richard J. [Full Text]; Morinaga, Shojiroh [Abstract] [Full Text]; Morita, Shigeki [Abstract] [Full Text]; Morse, David S. [Abstract] [Full Text]; Morshuis, Wim J. [Full Text]; Mouës, Chantal M. [Abstract] [Full Text]; Mukhopadhyay, Sushan [Full Text]; Munro, A. Ian [Abstract] [Full Text]; Murase, Takayuki [Abstract] [Full Text]; Myers, John L. [Abstract] [Full Text]
N: Naito, Yasuaki [Full Text]; Najafi, Hassan [Abstract] [Full Text]; Nakajima, Nobuyuki [Abstract] [Full Text]; Nelson, David P. [Abstract] [Full Text]; Ni’e, Masaki [Full Text]; Nischelsky, Johannes [Abstract] [Full Text]; Nishimura, Kazunobu [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]; Noda, Seiichi [Full Text]; Nomori, Hiroaki [Abstract] [Full Text]; Nomoto, Shin-ichi [Abstract] [Full Text]
O: Ochiai, Yoshie [Abstract] [Full Text]; Oelert, Helmut [Abstract] [Full Text]; Okita, Yutaka [Abstract] [Full Text]; Olearchyk, Renata M. [Abstract] [Full Text]; Olearchyk, Andrew S. [Abstract] [Full Text]; Onsager, David R. [Abstract] [Full Text]; Overman, David [Abstract] [Full Text]
P: Park, Soon J. [Full Text]; Parrino, Patrick E. [Abstract] [Full Text]; Pasic, Miralem [Full Text]; Pasterkamp, Gerard [Abstract] [Full Text]; Payot, Maurice [Abstract] [Full Text]; Pepper, John R. [Abstract] [Full Text]; Peterzén, Bengt [Abstract] [Full Text]; Philo, Ron [Abstract] [Full Text]; Pierangeli, Angelo [Abstract] [Full Text]; Pirolo, John S. [Abstract] [Full Text]; Powell, Frank S. [Abstract] [Full Text]
Q: Quinton, Susan D. [Abstract] [Full Text]
R: Rafferty, Terence [Full Text]; Raoul-Monties, Jean [Abstract] [Full Text]; Razzuk, Maruf A. [Full Text]; Reardon, Michael J. [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Reuthebuch, Oliver T. [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ritter, Jon H. [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robinson, Lary A. [Abstract] [Full Text]; Ross, Scott D. [Abstract] [Full Text]; Roth, Matthias [Abstract] [Full Text]; Ryan, Daniel P. [Abstract] [Full Text]
S: Sîrbu, Horia [Abstract] [Full Text]; Safi, Hazim J. [Abstract] [Full Text]; Saldaña, Federico [Abstract] [Full Text]; Salomon, Neal W. [Abstract] [Full Text]; Saltman, Adam E. [Abstract] [Full Text]; Sandhu, Meenu [Abstract] [Full Text]; Schauer, Alfred [Abstract] [Full Text]; Schepens, Marc A.A.M. [Full Text]; Schmid, Franz X. [Abstract] [Full Text]; Schranz, Dietmar [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Sebening, Christian [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Shai, Sen-Ei [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shuman, Todd A. [Abstract] [Full Text]; Siewers, Ralph D. [Abstract] [Full Text]; Siewert, J. Rüdiger [Abstract] [Full Text]; Simons, Michael [Abstract] [Full Text]; Southard, James H. [Abstract] [Full Text]; Stahl, Gregory L. [Abstract] [Full Text]; Stewart, Keir M. [Abstract] [Full Text]; Strüber, Martin [Abstract] [Full Text]; Sudarshan, Catherine D. [Abstract] [Full Text]; Suemasu, Keiichi [Abstract] [Full Text]; Sunday, Renee [Abstract] [Full Text]; Svedjeholm, Rolf [Full Text]; Svensson, Lars G. [Abstract] [Full Text]; Svensson, Lars G. [Full Text]; Szabó, Gábor [Abstract] [Full Text]
T: Takamoto, Shinichi [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takao, Tetsuto [Abstract] [Full Text]; Takita, Hiroshi [Full Text]; Tanaka, Osamu [Abstract] [Full Text]; Tanaka, Yasuhiro [Abstract] [Full Text]; Tanoue, Yoshihisa [Abstract] [Full Text]; Taylor, Doris A. [Abstract] [Full Text]; Thistlewaite, Patricia A. [Abstract] [Full Text]; Thomas, John P., Jr [Abstract] [Full Text]; Tofukuji, Motohisa [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Towler, Michael A. [Abstract] [Full Text]; Trento, Alfredo [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Troncoso, Juan C. [Abstract] [Full Text]; Tsai, Tsung-Po [Abstract] [Full Text]; Tseng, Elaine E. [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Tweddell, James S. [Abstract] [Full Text]
U: Urschel, Harold C., Jr [Full Text]; Urschel, John D. [Full Text]
V: Vahl, Christian Friedrich [Abstract] [Full Text]; van Aarnhem, Egidius E.H.L. [Abstract] [Full Text]; van de Vijver, Fons J.R. [Full Text]; van der Helm, Yvonne J.M. [Abstract] [Full Text]; van Dieijen-Visser, Marja P. [Abstract] [Full Text]; Vermeulen, Freddy E.E. [Full Text]; Vogt, Paul R. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wagenbreth, Ingrid [Abstract] [Full Text]; Wain, John C. [Abstract] [Full Text]; Walbrun, Birgit [Abstract] [Full Text]; Walker, William S. [Full Text]; Watanabe, Hiroshi [Abstract] [Full Text]; Weil, Robert J. [Full Text]; Weissburg, Alan [Abstract] [Full Text]; Wessel, David L. [Abstract] [Full Text]; Wick, Mark R. [Full Text]; Wilbourn, Asa J. [Full Text]; Wippermann, Carl F. [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yamakawa, Yosuke [Abstract] [Full Text]; Yang, Shyh-Sheng [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yew, David [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yokoyama, Tomoki [Abstract] [Full Text]
Z: Zünd, Gregor [Abstract] [Full Text]; Zorb, Susan L. [Abstract] [Full Text]