ATS -- Index by Author (66 [1])

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Index by Author: Volume 66, Issue 1 (July 1998) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbruzzese, Pietro A. [Full Text]; Akçar, Murat [Full Text]; Akins, Cary W. [Abstract] [Full Text]; Aldousany, Abdulwahab [Abstract] [Full Text]; Allen, Keith B. [Abstract] [Full Text]; Almeida, Dirceu R. [Abstract] [Full Text]; Amado-Cattaneo, Roberto [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Ando, Motomi [Abstract] [Full Text]; Andou, Akio [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Attar, Safuh [Abstract] [Full Text]
B: Babatasi, Gerard [Abstract] [Full Text]; Bacha, Emile A. [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Baldeyrou, Pierre [Abstract] [Full Text]; Balzer, David T. [Abstract] [Full Text]; Baribeau, Yvon R. [Abstract] [Full Text]; Barr, Mark L. [Abstract] [Full Text]; Barrera, Rafael [Abstract] [Full Text]; Baumgartner, Fritz J. [Abstract] [Full Text]; Beghetti, Maurice [Abstract] [Full Text]; Bel, Alain [Abstract] [Full Text]; Bero, Joseph W. [Abstract] [Full Text]; Berrebi, Alain J. [Abstract] [Full Text]; Bhoyroo, Satar [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Bocage, Jean-Philippe [Full Text]; Bodian, Carol A. [Abstract] [Full Text]; Bogers, Ad J.J.C. [Abstract] [Full Text]; Bolys, Ramunas [Abstract] [Full Text]; Brasil, Luiz A. [Abstract] [Full Text]; Brasil, Luiz A. [Abstract] [Full Text]; Brawn, William J. [Full Text]; Brook, Michael M. [Abstract] [Full Text]; Brown, Philip M. [Abstract] [Full Text]; Bruneval, Patrick [Abstract] [Full Text]; Buckberg, Gerald D. [Abstract] [Full Text]; Buckley, Mortimer J. [Abstract] [Full Text]; Budrikis, Algimantas [Abstract] [Full Text]; Buffolo, Enio [Abstract] [Full Text]; Buffolo, Enio [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]; Burke, Redmond P. [Abstract] [Full Text]
C: Cable, David G. [Abstract] [Full Text]; Caccavale, Robert J. [Full Text]; Canver, Charles C. [Abstract] [Full Text]; Carbognani, Paolo [Full Text]; Carey, Joseph N. [Abstract] [Full Text]; Carey, Joseph S. [Abstract] [Full Text]; Caron, Claire [Abstract] [Full Text]; Carpentier, Alain F. [Abstract] [Full Text]; Carrel, Thierry P. [Abstract] [Full Text]; Carrier, Michel [Abstract] [Full Text]; Cartes-Zumelzu, Fabiola [Abstract] [Full Text]; Carvalho, Antonio C. [Abstract] [Full Text]; Cascarano, Maria Teresa [Full Text]; Chang, Anthony C. [Abstract] [Full Text]; Chang, Anthony C. [Abstract] [Full Text]; Chang, Jerry Y. [Abstract] [Full Text]; Chapelier, Alain R. [Abstract] [Full Text]; Chapelier, Alain R. [Full Text]; Charlesworth, David C. [Abstract] [Full Text]; Chauvaud, Sylvain M. [Abstract] [Full Text]; Chiariello, Luigi [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Chiu, Ray C.-J. [Abstract] [Full Text]; Chukwuemeka, Andrew [Abstract] [Full Text]; Codispoti, Massimiliano [Abstract] [Full Text]; Cohen, Alan H. [Abstract] [Full Text]; Cook, David J. [Abstract] [Full Text]; Coste, Philippe [Abstract] [Full Text]
D: D’Agostino, Richard S. [Abstract] [Full Text]; Dalrymple-Hay, Malcolm J.R. [Full Text]; Daly, Richard C. [Abstract] [Full Text]; Daly, Richard C. [Abstract] [Full Text]; Darbinian, Sevak H. [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; Davies, Mark J. [Abstract] [Full Text]; de Boer, Johan H. [Abstract] [Full Text]; De Paulis, Ruggero [Abstract] [Full Text]; Dearani, Joseph A. [Abstract] [Full Text]; Debauchez, Matthieu [Abstract] [Full Text]; DeCamp, Malcolm M., Jr [Abstract] [Full Text]; Demirtas, M. Murat [Full Text]; Demmy, Todd L. [Abstract] [Full Text]; Detterbeck, Frank C. [Abstract] [Full Text]; DiBernardo, Louis R. [Abstract] [Full Text]; Dieter, Raymond A., Jr [Full Text]; Dor, Vincent [Abstract] [Full Text]; Dorfman, Julia [Abstract] [Full Text]; Dorman, B. Hugh [Abstract] [Full Text]; Ducreux, Michel [Abstract] [Full Text]
E: Ebels, Tjark [Abstract] [Full Text]; Edwards, Fred H. [Abstract] [Full Text]; Ehrlich, Marek [Abstract] [Full Text]; Einhorn, Lawrence H. [Full Text]; El Gamel, Ahmed [Full Text]; El Gamel, Ahmed [Full Text]; Elbeery, Joseph R. [Abstract] [Full Text]; Elefteriades, John A. [Full Text]; Elias, Dominique [Abstract] [Full Text]; Entrup, Michael H. [Abstract] [Full Text]
F: Faber, L. Penfield [Full Text]; Fadel, Elie [Abstract] [Full Text]; Faris, Bouchaib [Abstract] [Full Text]; Farnsworth, Alan E. [Abstract] [Full Text]; Federico, John A. [Full Text]; Fieguth, Hans Gerd [Full Text]; Fitzgerald, Edward B. [Abstract] [Full Text]; Fornes, Paul [Abstract] [Full Text]; Fujino, Shozo [Abstract] [Full Text]; Fukushima, Kanae [Abstract] [Full Text]; Furuse, Akira [Abstract] [Full Text]; Fuse, Katsuo [Full Text]; Fuzellier, Jean-François G. [Abstract] [Full Text]
G: Gagliardotto, Piervincenzo [Abstract] [Full Text]; Gaultier, Yvon M. [Full Text]; Gay, William A., Jr [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Giaid, Adel [Abstract] [Full Text]; Ginzton, Leonard [Abstract] [Full Text]; Giordano, Frank J. [Abstract] [Full Text]; Girard, Philippe [Abstract] [Full Text]; Gomes, Walter J. [Abstract] [Full Text]; Gomes, Walter J. [Abstract] [Full Text]; Gott, Vincent L. [Full Text]; Grabenwoeger, Martin [Abstract] [Full Text]; Griepp, Randall B. [Abstract] [Full Text]; Griffith, Gary L. [Abstract] [Full Text]; Grimm, Michael [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Grunenwald, Dominique [Full Text]; Grunenwald, Dominique [Abstract] [Full Text]; Gu, Y. John [Abstract] [Full Text]; Guesnier, Laurent [Abstract] [Full Text]
H: Hahn, Chiwon [Abstract] [Full Text]; Hankins, John R. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hartz, Renee S. [Abstract] [Full Text]; Hashizume, Kohei [Abstract] [Full Text]; Havel, Michael [Abstract] [Full Text]; Heimansohn, David A. [Abstract] [Full Text]; Hess, Kenneth R. [Abstract] [Full Text]; Hilgenberg, Alan D. [Abstract] [Full Text]; Hillion, Marie-Line [Abstract] [Full Text]; Hirai, Toshikazu [Abstract] [Full Text]; Hirose, Kunihiko [Abstract] [Full Text]; Horsley, W. Stewart [Abstract] [Full Text]; Hreib, Kinan [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Huisman, Jean-Paul D. [Full Text]
I: Ihnken, Kai [Abstract] [Full Text]; Imanaka, Kazuhito [Abstract] [Full Text]; Imazeki, Takao [Abstract] [Full Text]; Ingemansson, Richard [Abstract] [Full Text]; Inoue, Shuhei [Abstract] [Full Text]; Irie, Yoshihito [Abstract] [Full Text]
J: Jacobs, Jeffrey P. [Abstract] [Full Text]; Jacobs, Jeffrey P. [Abstract] [Full Text]; Jamieson, Stuart W. [Abstract] [Full Text]; John, Lindsay [Abstract] [Full Text]; Johnson, Ronald L. [Abstract] [Full Text]; Juvonen, Tatu [Abstract] [Full Text]
K: Kalangos, Afksendiyos [Abstract] [Full Text]; Kamiyoshihara, Mitsuhiro [Abstract] [Full Text]; Katayama, Yasushi [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Katsuyama, Kazuhiko [Abstract] [Full Text]; Kawashima, Osamu [Abstract] [Full Text]; Keats, Arthur S. [Full Text]; Keogh, Bruce E. [Full Text]; Kessler, Romain [Full Text]; Khadra, Wiam Z. [Full Text]; Khayat, Andre [Abstract] [Full Text]; Kim, Jong D. [Abstract] [Full Text]; Kimmel, Wendy A. [Abstract] [Full Text]; Kirk, C. Richard [Abstract] [Full Text]; Kirsch, Matthias [Abstract] [Full Text]; Kirshbom, Paul M. [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Kiyama, Hiroshi [Abstract] [Full Text]; Kline, Gary G. [Abstract] [Full Text]; Kohman, Leslie J. [Abstract] [Full Text]; Komatsu, Hikotaro [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Kribbs, Scott B. [Abstract] [Full Text]; Kroncke, George M. [Abstract] [Full Text]; Kshettry, Vibhu R. [Abstract] [Full Text]; Kubota, Hiroshi [Abstract] [Full Text]; Kuntze, Carl E.E. [Abstract] [Full Text]; Kurashima, Atsuyuki [Abstract] [Full Text]; Kushibe, Keiji [Abstract] [Full Text]
L: Lajos, Paul S. [Abstract] [Full Text]; Lammer, Johannes [Abstract] [Full Text]; Lazreg, Mokhtar [Abstract] [Full Text]; Le Page, Olivier [Abstract] [Full Text]; LeBesnerais, Paul [Abstract] [Full Text]; Levasseur, Philippe [Abstract] [Full Text]; Levine, Adrian J. [Full Text]; Lewis, Ralph J. [Full Text]; Li, Carlos M. [Abstract] [Full Text]; Liao, Quiming [Abstract] [Full Text]; Livesey, Steve A. [Full Text]; Loisance, Daniel Y. [Abstract] [Full Text]
M: Maas, Hans C. [Full Text]; Macchiarini, Paolo [Abstract] [Full Text]; Mallory, George B., Jr [Abstract] [Full Text]; Maloney, Christopher T. [Abstract] [Full Text]; Mankad, Pankaj S. [Abstract] [Full Text]; Martineau, Raymond [Abstract] [Full Text]; Massard, Gilbert [Full Text]; Massetti, Massimo [Abstract] [Full Text]; Matheny, Robert G. [Abstract] [Full Text]; Matsukawa, Ritsu [Abstract] [Full Text]; Matsumoto, Jun [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mazza, Ida L. [Abstract] [Full Text]; McCullough, Jock N. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McGuigan, James A. [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; McManus, Kieran G. [Full Text]; Melendez, Jose A. [Abstract] [Full Text]; Menasché, Philippe [Abstract] [Full Text]; Mendeloff, Eric N. [Abstract] [Full Text]; Meyns, Bart P. [Abstract] [Full Text]; Mignosa, Carmelo [Abstract] [Full Text]; Milliken, Jeffrey C. [Abstract] [Full Text]; Misawa, Yoshio [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Molina, J. Ernesto [Full Text]; Monro, James L. [Full Text]; Montemurro, Donato [Full Text]; Moores, Darroch W.O. [Full Text]; Mori, Atsumi [Abstract] [Full Text]; Morishita, Yasuo [Abstract] [Full Text]; Morita, Kiyozo [Abstract] [Full Text]; Moriyama, Shigeharu [Abstract] [Full Text]; Morota, Tetsuro [Abstract] [Full Text]; Mouas, Christian [Abstract] [Full Text]; Mukaida, Takahiro [Abstract] [Full Text]; Müller-Schenker, Beatrice [Abstract] [Full Text]; Musumeci, Francesco [Abstract] [Full Text]
N: Nader-Djalal, Nader [Full Text]; Nadolny, Edward [Abstract] [Full Text]; Nesbitt, Jonathan C. [Full Text]; Nezu, Kunimoto [Abstract] [Full Text]; Nichols, Ronald D. [Abstract] [Full Text]; Nikas, Dimitri J. [Full Text]; Nishanian, Garabed P. [Abstract] [Full Text]; Nishimori, Hideaki [Abstract] [Full Text]; Niwaya, Kazuo [Abstract] [Full Text]; Northrup, William F., III [Abstract] [Full Text]
O: Oda, Katsushi [Abstract] [Full Text]; Ogoshi, Shohei [Abstract] [Full Text]; Okita, Yutaka [Abstract] [Full Text]; Omari, Bassam O. [Abstract] [Full Text]; Opie, John C. [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]
P: Pagé, Pierre L. [Abstract] [Full Text]; Pagni, Sebastian [Abstract] [Full Text]; Palma, J. Honório [Abstract] [Full Text]; Panos, Anthony L. [Full Text]; Pellerin, Michel [Abstract] [Full Text]; Pelletier, L. Conrad [Abstract] [Full Text]; Pelletier, Marc P. [Abstract] [Full Text]; Penta de Peppo, Alfonso [Abstract] [Full Text]; Perrault, Louis P. [Abstract] [Full Text]; Petzl, Dietmar [Abstract] [Full Text]; Pfeifer, Eric A. [Abstract] [Full Text]; Philip, Anie [Abstract] [Full Text]; Piccione, William J., Jr [Full Text]; Plöchl, Walter [Abstract] [Full Text]; Ponn, Ronald B. [Full Text]
Q: Quarterman, Renee L. [Abstract] [Full Text]
R: Reddy, V. Mohan [Abstract] [Full Text]; Regnard, Jean-Francois [Abstract] [Full Text]; Rimensberger, Peter C. [Abstract] [Full Text]; Roberts, Randall F. [Abstract] [Full Text]; Robison, Robert J. [Abstract] [Full Text]; Rusca, Michele [Full Text]
S: Sakamaki, Yasushi [Abstract] [Full Text]; Salloum, Ellis J. [Abstract] [Full Text]; Salomão, Reinaldo [Abstract] [Full Text]; Sami, Shahid A. [Full Text]; Sankar, N. Madhu [Abstract] [Full Text]; Sarikaya, Sabit [Full Text]; Sato, Koji [Abstract] [Full Text]; Sawabata, Noriyoshi [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schier, John J. [Abstract] [Full Text]; Schreurs, Hedi H. [Abstract] [Full Text]; Schwanda, Mike [Abstract] [Full Text]; Searle, Norman R. [Abstract] [Full Text]; Seguin, Jacques [Abstract] [Full Text]; Sergeant, Paul T. [Abstract] [Full Text]; Sethia, Babulal [Full Text]; Shaar, Carl J. [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Shapiro, Shelly [Abstract] [Full Text]; Shiang, Howard H. [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Shimizu, Susumu [Abstract] [Full Text]; Shinfeld, Amihay [Abstract] [Full Text]; Shiraishi, Yuji [Abstract] [Full Text]; Silverman, Norman H. [Abstract] [Full Text]; Sisler, Glenn E. [Full Text]; Sivaraman, Sujith [Abstract] [Full Text]; Sjöberg, Trygve [Abstract] [Full Text]; Skaryak, Lynne A. [Abstract] [Full Text]; Slawson, Robert G. [Abstract] [Full Text]; Solli, Piergiorgio [Full Text]; Solymoss, B. Charles [Abstract] [Full Text]; Sonett, Joshua R. [Abstract] [Full Text]; Spaggiari, Lorenzo [Full Text]; Spaggiari, Lorenzo [Full Text]; Spaggiari, Lorenzo [Abstract] [Full Text]; Spaulding, Wendy [Full Text]; Spence, Gary M. [Full Text]; Spence, Paul A. [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Stanger, Paul [Abstract] [Full Text]; Starnes, Vaughn A. [Abstract] [Full Text]; Stchepinsky, Olivier A. [Full Text]; Steen, Stig [Abstract] [Full Text]; Stoneback, Keith [Full Text]; Sundt, Thoralf M., III [Full Text]; Suter, Charles M. [Abstract] [Full Text]; Sutter, Francis P. [Full Text]; Svensson, Lars G. [Abstract] [Full Text]; Sweet, Stuart C. [Abstract] [Full Text]; Symbas, Panagiotis N. [Abstract] [Full Text]; Symbas, Peter J. [Abstract] [Full Text]
T: Takamoto, Shinichi [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takemura, Tamiko [Abstract] [Full Text]; Takeshita, Mika [Abstract] [Full Text]; Tam, Stanley K.C. [Abstract] [Full Text]; Taniguchi, Sigeki [Abstract] [Full Text]; Tarazi, Riyad Y. [Abstract] [Full Text]; Tezuka, Noriaki [Abstract] [Full Text]; Theodose, Yves V. [Full Text]; Thistlethwaite, Patricia A. [Abstract] [Full Text]; Thurnher, Siegfried [Abstract] [Full Text]; Tobin, Gordon R. [Abstract] [Full Text]; Tojo, Takashi [Abstract] [Full Text]; Tsuchiya, Keiji [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]
U: Ungerleider, Ross M. [Abstract] [Full Text]
V: van Domburg, Ron T. [Abstract] [Full Text]; van Oeveren, Wim [Abstract] [Full Text]; van Son, Jacques A.M. [Abstract] [Full Text]; VanHimbergen, Daniel J. [Abstract] [Full Text]; Veeragandham, Ramesh S. [Abstract] [Full Text]; Vilaine, Jean-Paul [Abstract] [Full Text]; Vlahakes, Gus J. [Abstract] [Full Text]; Vogt, Paul R. [Abstract] [Full Text]
W: Wain, John C. [Abstract] [Full Text]; Warren, William H. [Full Text]; Watarida, Shoji [Abstract] [Full Text]; Weinstein, Gerald S. [Full Text]; Weisz, Donald J. [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Westbrook, Benjamin M. [Abstract] [Full Text]; Whitlark, Joseph D. [Full Text]; Wihlm, Jean-Marie [Full Text]; Wijers, Marianne J. [Abstract] [Full Text]; Wilson, Allen D. [Abstract] [Full Text]; Wilson, Dirk G. [Abstract] [Full Text]; Wolfe, David [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wood, Andrew [Abstract] [Full Text]
Y: Yamada, Takashi [Abstract] [Full Text]; Yamashiro, Toshiyuki [Abstract] [Full Text]
Z: Zahn, Evan M. [Abstract] [Full Text]; Zeitani, Jacob [Abstract] [Full Text]; Zellner, James L. [Abstract] [Full Text]; Zhang, Ning [Abstract] [Full Text]