ATS -- Index by Author (65 [6])

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Index by Author: Volume 65, Issue 6 (June 1998) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tomio [Abstract] [Full Text]; Abe, Tomio [Abstract] [Full Text]; Adatia, Ian [Abstract] [Full Text]; Akasaki, Mituru [Abstract] [Full Text]; Akins, Cary W. [Abstract] [Full Text]; Alcocer, Julian J. [Abstract] [Full Text]; Alling, Christer [Abstract] [Full Text]; Alonso, Sergio [Abstract] [Full Text]; Altermatt, Hans-Jörg [Abstract] [Full Text]; Althaus, Ulrich [Abstract] [Full Text]; Amory, David W. [Abstract] [Full Text]; Ansley, David M. [Abstract] [Full Text]; Antretter, Herwig [Abstract] [Full Text]; Aoki, Teruhiro [Abstract] [Full Text]; Armengod, A. Cantó. [Full Text]
B: Backer, Carl L. [Abstract] [Full Text]; Bailey, Warren W. [Abstract] [Full Text]; Baird, Douglas K. [Abstract] [Full Text]; Barbut, Denise [Abstract] [Full Text]; Barner, Hendrick B. [Abstract] [Full Text]; Bartels, Claus [Abstract] [Full Text]; Bartram, Ulrike [Abstract] [Full Text]; Bashore, Thomas M. [Abstract] [Full Text]; Bassano, Carlo [Abstract] [Full Text]; Bechtel, J.F. Matthias [Abstract] [Full Text]; Benson, Lee N. [Abstract] [Full Text]; Bentley, Michael J. [Abstract] [Full Text]; Betticher, Daniel [Abstract] [Full Text]; Black, Michael D. [Abstract] [Full Text]; Blomquist, Sten [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Bonatti, Johannes [Abstract] [Full Text]; Bove, Kevin E. [Abstract] [Full Text]; Braden, Hal [Abstract] [Full Text]; Branicki, Frank J. [Abstract] [Full Text]; Bril, Vera [Abstract] [Full Text]; Brockman, Stanley K. [Abstract] [Full Text]; Brooker, Robert F. [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Brown, William R. [Abstract] [Full Text]; Buchman, Steven R. [Abstract] [Full Text]; Buckley, Mortimer J. [Abstract] [Full Text]; Burke, Allen [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Cameron, Evan W.J. [Abstract] [Full Text]; Canver, Charles C. [Abstract] [Full Text]; Caravajal, J.M. Galbis [Full Text]; Carbognani, Paolo [Full Text]; Carbognani, Paolo [Full Text]; Casarotto, Dino Carlo [Abstract] [Full Text]; Casillas, Juan A. [Abstract] [Full Text]; Casimir-Ahn, Henrik [Abstract] [Full Text]; Caspi, Joseph [Abstract] [Full Text]; Cassese, Mauro [Full Text]; Chaikhouni, Amer [Full Text]; Chang, Jen-Ping [Abstract] [Full Text]; Cheema-Dhadli, Surinder [Abstract] [Full Text]; Chen, Mien-Cheng [Abstract] [Full Text]; Cheng, Tsung O. [Full Text]; Chester, Adrian H. [Abstract] [Full Text]; Chiariello, Luigi [Abstract] [Full Text]; Choh, Joong H. [Full Text]; Chu, Kent-Man [Abstract] [Full Text]; Chung, Hee-Nam [Abstract] [Full Text]; Cohn, Lawrence H. [Full Text]; Colagrande, Luisa [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Cook, Daniel J. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Coselli, Joseph S. [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Cox, James L. [Full Text]; Craig, Stewart R. [Abstract] [Full Text]; Craig, Stewart R. [Abstract] [Full Text]; Croughwell, Narda D. [Abstract] [Full Text]
D: Daggett, Willard M. [Abstract] [Full Text]; Dangel, Markus [Abstract] [Full Text]; Dapunt, Otto E. [Abstract] [Full Text]; Dávila, Julio C. [Abstract] [Full Text]; Davis, Robert D. [Abstract] [Full Text]; Day, Ronald W. [Abstract] [Full Text]; De Paulis, Ruggero [Abstract] [Full Text]; de Peppo, Alfonso Penta [Abstract] [Full Text]; Deal, Dwight D. [Abstract] [Full Text]; Deeik, Ramzi K. [Abstract] [Full Text]; Deng, Mario C. [Abstract] [Full Text]; Dichtl, Wolfgang [Abstract] [Full Text]; Diena, Marco [Full Text]; Dion, Robert A. [Full Text]; Duarte, Ignacio G. [Abstract] [Full Text]; Duckworth, John K. [Abstract] [Full Text]; Duncan, Brian W. [Abstract] [Full Text]; Duranni, Aurangzeb K. [Full Text]; Dworzak, Erika A. [Abstract] [Full Text]
E: Edelman, Elazer R. [Abstract] [Full Text]; English, John C. [Abstract] [Full Text]; Epstein, Michael R. [Abstract] [Full Text]
F: Fernández-Latorre, Francisco [Abstract] [Full Text]; Fiore, Andrew C. [Abstract] [Full Text]; Fleming, Lynn [Abstract] [Full Text]; Frank, Michael W. [Abstract] [Full Text]; Frankenburg, Elizabeth P. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Fu, Morgan [Abstract] [Full Text]; Fukada, Johji [Abstract] [Full Text]; Fukada, Johji [Abstract] [Full Text]; Fukae, Kouji [Abstract] [Full Text]; Fukueda, Mikio [Abstract] [Full Text]; Furrer, Markus [Abstract] [Full Text]
G: Gentile, Jorge A. [Abstract] [Full Text]; Georges, Anthony J. [Abstract] [Full Text]; Gerdes, Anja [Abstract] [Full Text]; Ghazi-Birry, Hani S. [Abstract] [Full Text]; Gill, Inderjit S. [Full Text]; Girardi, Leonard N. [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Godin, David V. [Abstract] [Full Text]; Goormastic, Marlene [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Granfeldt, Hans [Abstract] [Full Text]; Granja, Miguel A. [Abstract] [Full Text]; Grassineau, Dominique [Abstract] [Full Text]; Grignani, Robert T. [Full Text]; Grocott, Hilary P. [Abstract] [Full Text]; Grünenfelder, Jürg [Abstract] [Full Text]; Guijarro Jorge, R. [Full Text]; Gulielmos, Vassilios [Abstract] [Full Text]; Guo, G. Bih-Fang [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Halperin, Mitchell L. [Abstract] [Full Text]; Hammel, Dieter [Abstract] [Full Text]; Hammon, John W., Jr [Abstract] [Full Text]; Hanley, Frank L. [Full Text]; Harada, Atsushi [Abstract] [Full Text]; Harada, Yukio [Abstract] [Full Text]; Harrington, O. Brewster [Abstract] [Full Text]; Harrison, John K. [Abstract] [Full Text]; Hartman, Gregg S. [Abstract] [Full Text]; Hattler, Brack G. [Abstract] [Full Text]; Hawkins, John A. [Abstract] [Full Text]; Hawkins, John A. [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; Heier, Linda [Abstract] [Full Text]; Hendrickson, Steven C. [Abstract] [Full Text]; Hentz, Jean-Gustave [Full Text]; Hilgenberg, Alan D. [Abstract] [Full Text]; Hoercher, Kathy [Abstract] [Full Text]; Hosenpud, Jeffrey D. [Full Text]; Hovaguimian, Hagop [Abstract] [Full Text]; Hughes, Clifford F. [Abstract] [Full Text]; Hugli, Tony E. [Abstract] [Full Text]; Hurlé, Aquilino [Abstract] [Full Text]; Huysmans, Hans A. [Abstract] [Full Text]
I: Iannettoni, Mark D. [Abstract] [Full Text]; Ida, Takao [Abstract] [Full Text]; Iguidbashian, John P. [Abstract] [Full Text]; Ikeshita, Masatoshi [Abstract] [Full Text]; Ilse, Werner K. [Abstract] [Full Text]; Imanaka-Yoshida, Kyoko [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]; Itoh, Tsuyoshi [Abstract] [Full Text]; Izumoto, Hiroshi [Full Text]
J: Jaggers, James [Abstract] [Full Text]; Johnsson, Per [Abstract] [Full Text]; Jones, Michael W. [Abstract] [Full Text]; Jönsson, Henrik [Abstract] [Full Text]; Joubert-Hübner, Elrina [Abstract] [Full Text]; Judd, Victoria E. [Abstract] [Full Text]
K: Kado, Hideaki [Abstract] [Full Text]; Kageyama, Yoshihiko [Abstract] [Full Text]; Kamata, Junya [Full Text]; Kaneko, Yukihiro [Abstract] [Full Text]; Kanemoto, Shinya [Abstract] [Full Text]; Kashem, Mohammed Abul [Abstract] [Full Text]; Kasirajan, Vigneshwar [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Katz, William E. [Abstract] [Full Text]; Kawazoe, Kohei [Full Text]; Kazui, Teruhisa [Abstract] [Full Text]; Kilgore, Kenneth S. [Abstract] [Full Text]; Kim, Cei-Whan [Abstract] [Full Text]; Kinjyo, Tamahiro [Abstract] [Full Text]; Kirchner, Jerry L. [Abstract] [Full Text]; Kobayashi, Jotaro [Abstract] [Full Text]; Koenig, Peter R. [Abstract] [Full Text]; Koja, Kageharu [Abstract] [Full Text]; Kojic, Jasna [Abstract] [Full Text]; Komatsu, Kanshi [Abstract] [Full Text]; Kosolcharoen, Peter [Abstract] [Full Text]; Kotoh, Keijyu [Abstract] [Full Text]; Koul, Bansi [Abstract] [Full Text]; Koutlas, Theodore C. [Abstract] [Full Text]; Kritchevsky, Stephen B. [Abstract] [Full Text]; Kudaka, Manabu [Abstract] [Full Text]; Kumar, Vijay [Abstract] [Full Text]; Kumon, Keiji [Full Text]; Kuniyoshi, Yukio [Abstract] [Full Text]; Kunze, Jörg [Abstract] [Full Text]
L: Laham, Roger J. [Abstract] [Full Text]; Lamberti, John J. [Abstract] [Full Text]; Lardinois, Didier [Abstract] [Full Text]; Law, Simon Y.K. [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Lee, John U. [Abstract] [Full Text]; LeMaire, Scott A. [Abstract] [Full Text]; Leyh, Rainer G. [Abstract] [Full Text]; Li, Xiao-Kang [Abstract] [Full Text]; Lis, Eric [Abstract] [Full Text]; Llamas, Patricio [Abstract] [Full Text]; Lönn, Urban J. [Abstract] [Full Text]; Loucks, Eric B. [Abstract] [Full Text]; Lowe, Val J. [Abstract] [Full Text]
M: MacDonald, Malcolm J. [Abstract] [Full Text]; Madsen, Joren C. [Abstract] [Full Text]; Magrath, Robert A. [Abstract] [Full Text]; Mainwaring, Richard D. [Abstract] [Full Text]; Martinelli, Gian Luca [Full Text]; Massad, Malek G. [Abstract] [Full Text]; Massard, Gilbert [Full Text]; Masuda, Munetaka [Abstract] [Full Text]; Mattox, Kenneth L. [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Mazer, C. David [Abstract] [Full Text]; McCarthy, James F. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McCormick, John R. [Full Text]; McGough, Edwin C. [Abstract] [Full Text]; McIrvin, David M. [Abstract] [Full Text]; McKnight, David J. [Abstract] [Full Text]; Mediratta, Neeraj [Full Text]; Memon, Muhammed Ashraf [Abstract] [Full Text]; Mengo, Gustavo [Abstract] [Full Text]; Meseguer, Juan [Abstract] [Full Text]; Mettler, Daniel [Abstract] [Full Text]; Meyer, Richard A. [Abstract] [Full Text]; Michielon, Guido [Abstract] [Full Text]; Minich, L. LuAnn [Abstract] [Full Text]; Misaki, Takuro [Abstract] [Full Text]; Miyagi, Kazufumi [Abstract] [Full Text]; Moody, Dixon M. [Abstract] [Full Text]; Morishita, Kiyofumi [Abstract] [Full Text]; Morishita, Kiyofumi [Abstract] [Full Text]; Morris, Rohinton J. [Abstract] [Full Text]; Morrison, Karen J.M. [Abstract] [Full Text]; Mosca, Ralph S. [Full Text]; Mukai, Tomoichiro [Abstract] [Full Text]; Mullen, John C. [Abstract] [Full Text]; Murakami, Eiji [Abstract] [Full Text]; Muraki, Satoshi [Abstract] [Full Text]; Murphy, David P. [Full Text]
N: Nabavi, Darius G. [Abstract] [Full Text]; Nagata, Nobuhiro [Abstract] [Full Text]; Naito, Kozo [Abstract] [Full Text]; Natsuaki, Masafumi [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Navia, José L. [Abstract] [Full Text]; Nevett, Robert [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]
O: Ogawa, Kyoichi [Abstract] [Full Text]; Ohashi, Hidetaka [Abstract] [Full Text]; Ohri, Sunil K. [Full Text]; Okabe, Hideo [Abstract] [Full Text]; Okada, Masayoshi [Abstract] [Full Text]; Onoda, Koji [Abstract] [Full Text]; Orringer, Mark B. [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Ott, Richard A. [Full Text]; Oyarzun, J. Rodrigo [Full Text]; Ozaki, Wayne [Abstract] [Full Text]; Ozeki, Yuichi [Abstract] [Full Text]
P: Patel, Ashvin K. [Abstract] [Full Text]; Paterson, Hugh S. [Abstract] [Full Text]; Peachell, John L. [Abstract] [Full Text]; Pearlman, Justin D. [Abstract] [Full Text]; Perez, Angel R. [Abstract] [Full Text]; Pfister, Gerd [Abstract] [Full Text]; Piciché, Marco [Abstract] [Full Text]; Pickering, Rexann [Abstract] [Full Text]; Poon, Ronnie T.P. [Abstract] [Full Text]; Prêtre, René [Abstract] [Full Text]; Puga, Francisco J. [Full Text]; Puschendorf, Bernd [Abstract] [Full Text]
Q: Qayumi, A. Karim [Abstract] [Full Text]
R: Rainer, W. Gerald [Full Text]; Rannzini, Maria E. [Abstract] [Full Text]; Reboussin, David M. [Abstract] [Full Text]; Ringelstein, Erich B. [Abstract] [Full Text]; Ris, Hans-Beat [Abstract] [Full Text]; Rocchini, Albert P. [Abstract] [Full Text]; Rohs, Thomas J. [Abstract] [Full Text]; Rusca, Michele [Full Text]; Rusca, Michele [Full Text]
S: Sabik, Joseph F. [Abstract] [Full Text]; Samuels, Louis E. [Abstract] [Full Text]; Sato, Hiroki [Abstract] [Full Text]; Sato, Hiroki [Abstract] [Full Text]; Scheld, Hans H. [Abstract] [Full Text]; Schmid, Christof [Abstract] [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Schüler, Stephan [Abstract] [Full Text]; Schwartz, David C. [Abstract] [Full Text]; Scott, D. John [Abstract] [Full Text]; Seddio, Francesco [Abstract] [Full Text]; Seghaye, Marie-Christine [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Senthilnathan, V. [Abstract] [Full Text]; Shaddy, Robert E. [Abstract] [Full Text]; Shearer, Steven T. [Abstract] [Full Text]; Sherrick, Adam [Abstract] [Full Text]; Shiiku, Chikara [Abstract] [Full Text]; Shiiku, Chikara [Abstract] [Full Text]; Shimoji, Mituyoshi [Abstract] [Full Text]; Shimokawa, Shinji [Abstract] [Full Text]; Shimono, Takatsugu [Abstract] [Full Text]; Shimpo, Hideto [Abstract] [Full Text]; Shinfeld, Amihay [Abstract] [Full Text]; Shiokawa, Yuichi [Abstract] [Full Text]; Sievers, Hans-Hinrich [Abstract] [Full Text]; Sievers, Hans-Hinrich [Abstract] [Full Text]; Sim, Eugene K.W. [Full Text]; Simons, Michael [Abstract] [Full Text]; Singer, William [Abstract] [Full Text]; Slack, Michael C. [Abstract] [Full Text]; Smedira, Nicholas G. [Abstract] [Full Text]; Solem, Jan-Otto [Abstract] [Full Text]; Solli, Piergiorgio [Full Text]; Solli, Piergiorgio [Full Text]; Sorbara, Carlo [Abstract] [Full Text]; Sosnowski, Andrzej W. [Full Text]; Spaggiari, Lorenzo [Full Text]; Spaggiari, Lorenzo [Full Text]; Speziali, Giovanni [Full Text]; Spray, Thomas L. [Abstract] [Full Text]; Starnes, Carey L. [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Steen, Stig [Abstract] [Full Text]; Stump, David A. [Abstract] [Full Text]; Sugimoto, Jeffrey T. [Abstract] [Full Text]; Suzuki, Hidetoshi [Abstract] [Full Text]; Suzuki, Kazuya [Abstract] [Full Text]; Suzuki, Masao [Abstract] [Full Text]; Suzuki, Seiichi [Abstract] [Full Text]; Swartz, Marc T. [Abstract] [Full Text]
T: Taggart, David P. [Full Text]; Taira, Akira [Abstract] [Full Text]; Tanaka, Susumu [Abstract] [Full Text]; Tani, Lloyd Y. [Abstract] [Full Text]; Taylor, Dylan A. [Abstract] [Full Text]; Tenpaku, Hironori [Abstract] [Full Text]; Thormann, Wolfgang [Abstract] [Full Text]; Tomai, Fabrizio [Abstract] [Full Text]; Tomita, Shinji [Abstract] [Full Text]; Torchiana, David F. [Abstract] [Full Text]; Townsend, Edward R. [Full Text]; Toyoda, Yoshiya [Abstract] [Full Text]; Toyoda, Yoshiya [Abstract] [Full Text]; Triller, Jürgen [Abstract] [Full Text]; Tsukamoto, Masaru [Abstract] [Full Text]
U: Ueyama, Katsushi [Abstract] [Full Text]; Uezu, Tooru [Abstract] [Full Text]; Unger, Felix [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]
V: van Krieken, Han H. [Abstract] [Full Text]; Van Praagh, Richard [Abstract] [Full Text]; Vargas, Florentino J. [Abstract] [Full Text]; Vazquez, Juan C. [Abstract] [Full Text]; Vieth, Paul J. [Abstract] [Full Text]; Vinten-Johansen, Jakob [Abstract] [Full Text]; Virmani, Renu [Full Text]; Vlahakes, Gus J. [Abstract] [Full Text]; Voytovich, Marta C. [Abstract] [Full Text]
W: Walker, William S. [Abstract] [Full Text]; Wall, Matthew J., Jr [Abstract] [Full Text]; Wallace, William H.A. [Abstract] [Full Text]; Watanabe, Go [Abstract] [Full Text]; Watanabe, Masazumi [Abstract] [Full Text]; Watanabe, Shun-ichi [Abstract] [Full Text]; Watanabe, Yasuhiko [Full Text]; Weinberg, Paul M. [Abstract] [Full Text]; Wells, Francis C. [Full Text]; Wernovsky, Gil [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Weyand, Michael [Abstract] [Full Text]; White, Patricia [Abstract] [Full Text]; White, William D. [Abstract] [Full Text]; Wihlm, Jean-Marie [Full Text]; Williams, Thomas E., Jr [Abstract] [Full Text]; Wilson, Gregory J. [Abstract] [Full Text]; Wong, John [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yada, Isao [Abstract] [Full Text]; Yahagi, Naoki [Full Text]; Yamaguchi, Masahiro [Abstract] [Full Text]; Yamashita, Akio [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yeh, Kuo-Ho [Abstract] [Full Text]; Yoshida, Toshimichi [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]; Young, James B. [Abstract] [Full Text]