ATS -- Index by Author (64 [2])

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Index by Author: Volume 64, Issue 2 (August 1997) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adamick, Richard D. [Full Text]; Adams, Phillip R. [Abstract] [Full Text]; Afifi, Hazem Y. [Abstract] [Full Text]; Aguirre, Douglas E. [Abstract] [Full Text]; Akçali, Yigit [Abstract] [Full Text]; Alekseev, Alexey E. [Full Text]; Alfieri, Ottavio [Abstract] [Full Text]; Alimadadian, Hossein [Abstract] [Full Text]; Ambrogi, Vincenzo [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anes, Nanning [Abstract] [Full Text]; Aomi, Shigeyuki [Abstract] [Full Text]; Argenziano, Michael [Abstract] [Full Text]; Aronson, Solomon [Abstract] [Full Text]; Arsiwala, Saify S. [Abstract] [Full Text]
B: Barbut, Denise [Abstract] [Full Text]; Bartolozzi, Silvia [Abstract] [Full Text]; Bastien, Olivier H. [Abstract] [Full Text]; Bayazit, Kemal [Full Text]; Becker, Anton E. [Abstract] [Full Text]; Becker, Anton E. [Abstract] [Full Text]; Berg, Geoffrey A. [Full Text]; Bergandi, Gianluigi [Abstract] [Full Text]; Bergström, Reinhold [Abstract] [Full Text]; Berreklouw, Eric [Abstract] [Full Text]; Bessho, Ryuzo [Abstract] [Full Text]; Bilgin, Mehmet [Abstract] [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Bitran, Dani [Full Text]; Bloch, Konrad E. [Abstract] [Full Text]; Bobbio, Marco [Abstract] [Full Text]; Boley, Theresa M. [Abstract] [Full Text]; Bosl, George J. [Abstract] [Full Text]; Bove, Edward L. [Abstract] [Full Text]; Bové, Thierry [Abstract] [Full Text]; Brink, Lela W. [Abstract] [Full Text]; Brizard, Christian P. [Abstract] [Full Text]; Brown, David L. [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Bürge, Markus [Abstract] [Full Text]; Burkhoff, Daniel [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Cabrero, Emilio Larrú [Full Text]; Caccavale, Robert J. [Full Text]; Cameron, Duke E. [Abstract] [Full Text]; Carrier, Michel [Abstract] [Full Text]; Chambers, John S. [Full Text]; Chan, K. Chen [Abstract] [Full Text]; Chassignolle, Jean-Francois [Abstract] [Full Text]; Chello, Massimo [Full Text]; Chen, Ying-Fu [Full Text]; Chen, Ying-Fu [Full Text]; Cheng, Tsung O. [Full Text]; Clapp, Sandra K. [Abstract] [Full Text]; Clausnizer, Bernd [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Codini, Michele A. [Abstract] [Full Text]; Cohn, Lawrence H. [Full Text]; Coles, John G. [Abstract] [Full Text]; Cope, Jeffery T. [Abstract] [Full Text]; Cote, Richard J. [Full Text]; Cowgill, L. Douglas [Full Text]; Cruzzavala, Jose L. [Full Text]
D: De Francesca, Francesco [Full Text]; DeLeon, Maryann M. [Abstract] [Full Text]; DeLeon, Serafin Y. [Abstract] [Full Text]; DeLima, Nuno F. [Abstract] [Full Text]; DeRosa, Carolyn M. [Abstract] [Full Text]; desJardins, Susan E. [Abstract] [Full Text]; DeSmet, Jean-Marie [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Dev, K. Kesava [Abstract] [Full Text]; Dhaliwal, Rajinder S. [Abstract] [Full Text]; Doi, Osamu [Abstract] [Full Text]; Domínguez, Jaime [Full Text]; Draaisma, Anjo M. [Abstract] [Full Text]; Dupuis, Jocelyn [Abstract] [Full Text]; Durand de Gevigney, Guy M. [Abstract] [Full Text]; Durham, Lucian A, III [Abstract] [Full Text]
E: Edlund, Bo [Abstract] [Full Text]; Emirogullari, Naci [Abstract] [Full Text]; England, Gregory J. [Full Text]; Esato, Kensuke [Abstract] [Full Text]; Esper, Eduardo [Full Text]
F: Ferdinand, Francis D. [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Fink, Daniel [Full Text]; Fisher, Peter E. [Abstract] [Full Text]; Frank, Michael [Abstract] [Full Text]; Frantz, Elman G. [Abstract] [Full Text]; Frazier, O. H. [Abstract] [Full Text]; Fredi, Joseph L. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Fris, John [Abstract] [Full Text]; Frostfeldt, Gunnar [Abstract] [Full Text]; Fujii, Yoshitaka [Abstract] [Full Text]; Fujimura, Yoshihiko [Abstract] [Full Text]; Funai, Hiroko [Abstract] [Full Text]
G: Giammaria, Massimo [Abstract] [Full Text]; Gibson, Derek G. [Abstract] [Full Text]; Gillinov, A. Marc [Abstract] [Full Text]; Ginsburg, Mark E. [Abstract] [Full Text]; Girard, Philippe [Full Text]; Gohra, Hidenori [Abstract] [Full Text]; Gold, Jeffrey P. [Abstract] [Full Text]; Goldstein, Jacques P. [Abstract] [Full Text]; Gorenstein, Lyall A. [Abstract] [Full Text]; Götz, Christian [Abstract] [Full Text]; Graham, Lynn [Abstract] [Full Text]; Grillo, Hermes C. [Abstract] [Full Text]; Grunenwald, Dominique [Full Text]; Gude, Vicente Díaz-Hellín [Full Text]; Gurevitch, Jacob [Abstract] [Full Text]; Gutfinger, Dan E. [Abstract] [Full Text]
H: Hacker, Robert [Abstract] [Full Text]; Hager, David N. [Abstract] [Full Text]; Hakimi, Mehdi [Abstract] [Full Text]; Hamano, Kimikazu [Abstract] [Full Text]; Hanada, Tomoki [Abstract] [Full Text]; Hanagiri, Takeshi [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hansson, Hans Erik [Abstract] [Full Text]; Harrison, David A. [Abstract] [Full Text]; Hartman, Gregg S. [Abstract] [Full Text]; Hashimoto, Akimasa [Abstract] [Full Text]; Hashimoto, Mitsunori [Abstract] [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; Hazelrigg, Stephen R. [Abstract] [Full Text]; He, Guo-Wei [Full Text]; Heller, Israel [Abstract] [Full Text]; Henry, G. William [Abstract] [Full Text]; Hickey, Mark St.J. [Abstract] [Full Text]; Higashiyama, Masahiko [Abstract] [Full Text]; Hinton, Robert B. [Abstract] [Full Text]; Hirai, Shinnji [Abstract] [Full Text]; Hiramori, Katsuhiko [Abstract] [Full Text]; Hruban, Ralph H. [Abstract] [Full Text]; Hutchins, Grover M. [Abstract] [Full Text]; Huysmans, Hans A. [Abstract] [Full Text]
I: Imura, Hajime [Abstract] [Full Text]; Isakov, Aharon [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]; Izumoto, Hiroshi [Abstract] [Full Text]; Izzat, M. Bashar [Abstract] [Full Text]
J: Jackimovicz, Jack [Abstract] [Full Text]; Jamieson, Stuart W. [Abstract] [Full Text]; Jayakrishnan, Aylliath G. [Full Text]; Jellen, Patricia A. [Abstract] [Full Text]; Jin, Xu Y. [Abstract] [Full Text]; Johnson, Robert G. [Abstract] [Full Text]; Jones, David R. [Abstract] [Full Text]; Jovanovic, Aleksandar [Full Text]
K: Kahraman, Cemal [Abstract] [Full Text]; Kalkat, Maninder S. [Abstract] [Full Text]; Kamata, Junya [Abstract] [Full Text]; Kapusta, Mario O. [Abstract] [Full Text]; Karagöz, Haldun Y. [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Karp, Robert B. [Full Text]; Katoh, Tomoe [Abstract] [Full Text]; Kawazoe, Kohei [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Khomoto, Takushi [Abstract] [Full Text]; King, Robert C. [Abstract] [Full Text]; Kiriyama, Masanobu [Abstract] [Full Text]; Kitahara, Hiroto [Abstract] [Full Text]; Kitano, Tadashi [Abstract] [Full Text]; Kodama, Ken [Abstract] [Full Text]; Koh, Tat W. [Abstract] [Full Text]; Komokata, Teruo [Full Text]; Kotsis, Lajos [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Ku, Kwansong [Abstract] [Full Text]; Kudukis, Theresa M. [Abstract] [Full Text]
L: Lagerquist, Bo [Abstract] [Full Text]; Lakew, Fitsoum [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Landymore, Roderick W. [Abstract] [Full Text]; Lawrence, David R. [Abstract] [Full Text]; LeClerc, Jean-Louis [Abstract] [Full Text]; Lee, Chee-Siong [Full Text]; Lee, Chee-Siong [Full Text]; Lee, Raymond [Abstract] [Full Text]; Lewis, Ralph J. [Full Text]; Licina, Michael [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Lo, Yi-Wen [Abstract] [Full Text]; Lobato, Ramiro D. [Full Text]; Loop, Floyd D. [Abstract] [Full Text]; Lopez, Jose R. [Full Text]; Luketich, James D. [Abstract] [Full Text]; Lyons, Juanita M. [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Macaluso, Stephanie M. [Abstract] [Full Text]; MacArthur, Kenneth J. D. [Full Text]; Machii, Masato [Abstract] [Full Text]; Machii, Masato [Abstract] [Full Text]; Mack, Michael J. [Abstract] [Full Text]; Macris, Michael P. [Abstract] [Full Text]; Maekawa, Tsuyoshi [Abstract] [Full Text]; Magee, Mitchell J. [Abstract] [Full Text]; Magliato, Kathy E. [Abstract] [Full Text]; Maliszewskyj, James D. [Abstract] [Full Text]; Maltese, Giovanni [Full Text]; Martelloni, Yvan A. [Abstract] [Full Text]; Masaoka, Akira [Abstract] [Full Text]; Mastroroberto, Pasquale [Full Text]; Mathieu, Patrick [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Maughan, Robert E. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McLaughlin, Peter R. [Abstract] [Full Text]; Mee, Roger B. B. [Abstract] [Full Text]; Merin, Ofer [Full Text]; Mill, Michael R. [Abstract] [Full Text]; Miller, Mark P. [Abstract] [Full Text]; Minami, Kazuaki [Abstract] [Full Text]; Mineo, Tommaso Claudio [Full Text]; Mitsudomi, Tetsuya [Abstract] [Full Text]; Mitsui, Toshio [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Moncure, Ashby C. [Abstract] [Full Text]; Moore, Phillip [Abstract] [Full Text]; Moriyama, Yukinori [Full Text]; Morrow, W. Robert [Abstract] [Full Text]; Mosca, Ralph S. [Abstract] [Full Text]; Mulay, Anvay V. [Abstract] [Full Text]; Muranaka, Hiroyuki [Abstract] [Full Text]; Murray, Gordon F. [Full Text]
N: Nagami, Haruhiko [Abstract] [Full Text]; Nagashima, Akira [Abstract] [Full Text]; Nagata, Hideyuki [Abstract] [Full Text]; Nair, R. Unnikrishnan [Abstract] [Full Text]; Najafi, Hassan [Abstract] [Full Text]; Nakai, Kenji [Abstract] [Full Text]; Nakanishi, Kozo [Abstract] [Full Text]; Nakanishi, Ryoichi [Abstract] [Full Text]; Nakashima, Ken [Abstract] [Full Text]; Nakata, Hajime [Abstract] [Full Text]; Nakayama, Kengo [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Navia, Jose L. [Abstract] [Full Text]; Negro, Gerardo Del [Full Text]; Nicholson, Ian A. [Abstract] [Full Text]; Ninan, Mathew [Abstract] [Full Text]; Nishida, Kinue [Abstract] [Full Text]; Nishio, Tetsuo [Abstract] [Full Text]; Niwa, Hiroshi [Abstract] [Full Text]; Nosaka, Seishi [Abstract] [Full Text]; Nunn, Graham R. [Abstract] [Full Text]
O: Obadia, Jean-Francois [Abstract] [Full Text]; Oguzkaya, Fahri [Abstract] [Full Text]; Ohgami, Akira [Abstract] [Full Text]; Ohkubo, Takayoshi [Abstract] [Full Text]; Ohri, Sunil K. [Abstract] [Full Text]; Ohtsuka, Goro [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Ono, Minoru [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Osaki, Toshihiro [Abstract] [Full Text]; Osaki, Toshihiro [Abstract] [Full Text]; Ott, Richard A. [Abstract] [Full Text]; Oyama, Tsunehiro [Abstract] [Full Text]
P: Patané, Francesco [Abstract] [Full Text]; Paterson, Hugh S. [Abstract] [Full Text]; Pathi, Vivek L. [Full Text]; Paw, Patrick T. [Abstract] [Full Text]; Peek, Giles J. [Abstract] [Full Text]; Pelletier, L. Conrad [Abstract] [Full Text]; Pepper, John R. [Abstract] [Full Text]; Perier, Patrick [Abstract] [Full Text]; Pfister, Albert J. [Full Text]; Pillai, Gopalakrishnan A. [Full Text]; Pines, Amos [Abstract] [Full Text]; Pinna-Pintor, Plinio [Abstract] [Full Text]; Pirolo, John S. [Abstract] [Full Text]; Pompeo, Eugenio [Full Text]; Prabhakar, Ganga [Full Text]
R: Rameshwara, Talya [Full Text]; Rebeyka, Ivan M. [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Rivas, Juan J. [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Roughneen, Patrick T. [Abstract] [Full Text]; Russi, Erich W. [Abstract] [Full Text]; Ryan, Jim [Abstract] [Full Text]
S: Sahin, Atalay [Abstract] [Full Text]; Saitoh, Yuhei [Abstract] [Full Text]; Sakai, Shuji [Abstract] [Full Text]; Sakomura, Yasunari [Abstract] [Full Text]; Salazar, Jorge D. [Abstract] [Full Text]; Salmons, Stanley [Full Text]; Sandrelli, Luca [Abstract] [Full Text]; Sankaran, Aarthi [Abstract] [Full Text]; Sato, Yoshihiro [Abstract] [Full Text]; Savage, Robert M. [Abstract] [Full Text]; Schneider, André [Abstract] [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Selvan, Arthur [Abstract] [Full Text]; Shapira, Itzhak [Abstract] [Full Text]; Shen, Win K. [Full Text]; Shiina, Yoshitaka [Abstract] [Full Text]; Shimokawa, Shinji [Full Text]; Sholler, Gary F. [Abstract] [Full Text]; Shuman, Todd A. [Abstract] [Full Text]; Silberman, Shuli [Full Text]; Sjögren, Ivar [Abstract] [Full Text]; Smith, Craig R. [Abstract] [Full Text]; Sommers, K. Eric [Abstract] [Full Text]; Spaggiari, Lorenzo [Full Text]; Spotnitz, Henry M. [Abstract] [Full Text]; Ståhle, Elisabeth [Abstract] [Full Text]; Stamler, Alon [Abstract] [Full Text]; Stammberger, Uz [Abstract] [Full Text]; Starr, Norman J. [Abstract] [Full Text]; Steinglass, Kenneth M. [Abstract] [Full Text]; Stewart, William J. [Abstract] [Full Text]; Storm, Waldemar [Abstract] [Full Text]; Stumpf, Jürgen [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sugio, Kenji [Abstract] [Full Text]; Sutherland, Fraser W. H. [Full Text]; Svensson, Lars G. [Abstract] [Full Text]; Sweeney, Michael S. [Abstract] [Full Text]
T: Taira, Akira [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tanner, Teresa M. [Abstract] [Full Text]; Tasdemir, Oguz [Full Text]; Tavilla, Giuseppe [Abstract] [Full Text]; Terada, Yasushi [Abstract] [Full Text]; Terzic, Andre [Full Text]; Thomashow, Byron [Abstract] [Full Text]; Thurnheer, Robert [Abstract] [Full Text]; Tobias, John [Abstract] [Full Text]; Tomizawa, Yasuko [Abstract] [Full Text]; Topilsky, Marcel [Abstract] [Full Text]; Townsend, Edward R. [Abstract] [Full Text]; Toyoshima, Satoshi [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Trifiletti, Rosario R. [Abstract] [Full Text]; Trusler, George A. [Abstract] [Full Text]; Tsuda, Tohru [Abstract] [Full Text]; Tsuji, Ichiro [Abstract] [Full Text]; Tsukui, Hiroyuki [Abstract] [Full Text]
V: Vadász, Pál [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Veeragandham, Ramesh [Abstract] [Full Text]; Viart, Pierre [Abstract] [Full Text]; Villa, Yael [Abstract] [Full Text]; Vincent, Jean-Louis [Abstract] [Full Text]; von Oppell, Ulrich O. [Full Text]; Vural, Kerem M. [Full Text]
W: Waikar, Hemant D. [Full Text]; Wain, John C. [Abstract] [Full Text]; Walters, Henry L., III [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Wang, Steven Y. [Abstract] [Full Text]; Watanabe, Hideyuki [Abstract] [Full Text]; Webb, Gary D. [Abstract] [Full Text]; Weber, David [Abstract] [Full Text]; Weder, Walter [Abstract] [Full Text]; Weintraub, Robert G. [Abstract] [Full Text]; Westaby, Stephen [Full Text]; Weyant, Robert J. [Abstract] [Full Text]; Wilcox, Benson R. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]
Y: Yakirevich, Vladimir [Abstract] [Full Text]; Yaku, Hitoshi [Abstract] [Full Text]; Yamada, Kenichi [Abstract] [Full Text]; Yamada, Kinya [Abstract] [Full Text]; Yamakawa, Yosuke [Abstract] [Full Text]; Yamauchi, Shigeo [Abstract] [Full Text]; Yao, Fun-Sun F. [Abstract] [Full Text]; Yasuda, Takushi [Abstract] [Full Text]; Yasumoto, Kosei [Abstract] [Full Text]; Yasumoto, Kosei [Abstract] [Full Text]; Yemets, Ilya M. [Abstract] [Full Text]; Yim, Anthony P. C. [Full Text]; Yim, Anthony P. C. [Abstract] [Full Text]; Yim, Anthony P. C. [Full Text]; Yokouchi, Hideoki [Abstract] [Full Text]; Yoshimatsu, Takashi [Abstract] [Full Text]; Yoshino, Ichiro [Abstract] [Full Text]; You, John M. [Abstract] [Full Text]; Young, D. Jeffrey [Abstract] [Full Text]
Z: Zehr, Kenton J. [Abstract] [Full Text]; Zempo, Nobuya [Abstract] [Full Text]; Zimmerman, Jerry J. [Abstract] [Full Text]; Zofrea, Saverio [Full Text]; Zubovits, Kornélia [Abstract] [Full Text]