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Index by Author: Volume 63, Issue 3 (March 1997) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Åberg, Torkel [Full Text]; Abolhoda, Amir [Abstract] [Full Text]; Adelhard, Klaus [Abstract] [Full Text]; Aguggini, Giovanni [Abstract] [Full Text]; Aldea, Gabriel S. [Abstract] [Full Text]; Alimadadian, Hossein [Abstract] [Full Text]; Allaire, Eric [Abstract] [Full Text]; Altermatt, Hans J. [Abstract] [Full Text]; Amanzio, Martina [Abstract] [Full Text]; Ambrogi, Vincenzo [Abstract] [Full Text]; Amsel, Bram J. [Full Text]; Anderson, Betty J. [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Arani, Djavad T. [Abstract] [Full Text]; Arnold, Phillip G. [Full Text]; Ascione, Raimondo [Abstract] [Full Text]; Ashraf, Saeed [Abstract] [Full Text]; Austin, Erle H., III [Abstract] [Full Text]
B: Balakrishnan, K. R. [Full Text]; Bannan, Sally [Abstract] [Full Text]; Barajon, Isabella [Abstract] [Full Text]; Baratz, Robert A. [Abstract] [Full Text]; Barlow, John B. [Full Text]; Baumann, Gert [Abstract] [Full Text]; Becker, Ronald M. [Full Text]; Beggs, Martin L. [Abstract] [Full Text]; Bell, Timothy J. [Abstract] [Full Text]; Benedetti, Fabrizio [Abstract] [Full Text]; Bergsland, Jacob [Abstract] [Full Text]; Bero, Joseph [Abstract] [Full Text]; Berti, Ferruccio [Abstract] [Full Text]; Beyens, Thierry [Abstract] [Full Text]; Bidouard, Jean-Pierre [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Birdi, Inderpaul [Abstract] [Full Text]; Biscardi, Frank H. [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Bjessmo, Staffan [Abstract] [Full Text]; Blow, Osbert [Abstract] [Full Text]; Böhm, Jürgen O. [Abstract] [Full Text]; Booth, Steven [Full Text]; Borges, Adrian C. [Abstract] [Full Text]; Botha, Cornelius A. [Abstract] [Full Text]; Boyle, Edward M., Jr [Abstract] [Full Text]; Brodsky, Jay B. [Full Text]; Broka, Serge [Abstract] [Full Text]; Brooks, Ari [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Bryan, Alan J. [Abstract] [Full Text]; Buche, Michel [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Butler, Michael D. [Abstract] [Full Text]
C: Caruso, Alessandro [Full Text]; Casadio, Caterina [Abstract] [Full Text]; Cavalletti, Cristina [Full Text]; Cavallo, Antonio [Abstract] [Full Text]; Cetta, Frank [Abstract] [Full Text]; Chang, Dehua [Abstract] [Full Text]; Chello, Massimo [Abstract] [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Full Text]; Cianci, Roberto [Abstract] [Full Text]; Clapp, Sandra K. [Abstract] [Full Text]; Clowes, Alexander W. [Abstract] [Full Text]; Cohn, Lawrence H. [Full Text]; Coles, John G. [Abstract] [Full Text]; Conant, Patricia [Abstract] [Full Text]; Conroy, Brendan P. [Abstract] [Full Text]; Cook, David J. [Abstract] [Full Text]; Cowan, Dahlia [Abstract] [Full Text]; Craig, Damian M. [Abstract] [Full Text]
D: d'Udekem, Yves [Abstract] [Full Text]; Dahabreh, Djebril [Abstract] [Full Text]; Dahan, Marcel [Abstract] [Full Text]; Daly, Richard C. [Abstract] [Full Text]; Danby, Amanda [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; Davidoff, Ravin [Abstract] [Full Text]; Davis, R. Duane, Jr [Abstract] [Full Text]; Davis, R. Duane, Jr [Abstract] [Full Text]; De Amicis, Vincenzo [Abstract] [Full Text]; DeLeon, Maryann M. [Abstract] [Full Text]; DeLeon, Serafin Y. [Abstract] [Full Text]; Demanet, Hélène [Abstract] [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Deyo, Donald J. [Abstract] [Full Text]; Dietel, Manfred [Abstract] [Full Text]; Duarte, Ignacio G. [Abstract] [Full Text]
E: Ede, Mauricio [Abstract] [Full Text]; Edwards, Fred H. [Abstract] [Full Text]; Eng, Jibah [Abstract] [Full Text]; Engelman, Richard M. [Full Text]; Enon, Bernard [Abstract] [Full Text]; Esposito, Rick A. [Full Text]; Eucher, Philippe M. [Abstract] [Full Text]
F: Fabiani, Jean-Noel [Full Text]; Faggian, Giuseppe [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Falk, Volkmar [Abstract] [Full Text]; Federico, John A. [Abstract] [Full Text]; Fenton, Kathleen N. [Abstract] [Full Text]; Ferson, David Z. [Abstract] [Full Text]; Filaire, Marc [Abstract] [Full Text]; Fischer, Adam P. [Abstract] [Full Text]; Fischlein, Teddy [Abstract] [Full Text]; Fisher, Elizabeth A. [Abstract] [Full Text]; Fitzgerald, Carmel A. [Abstract] [Full Text]; Flege, John B., Jr [Abstract] [Full Text]; Follette, David M. [Abstract] [Full Text]; Fonger, James D. [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Frenz, Martin [Abstract] [Full Text]; Frolkis, Inna [Abstract] [Full Text]
G: Gellert, Klaus [Abstract] [Full Text]; Genton, Claude Y. [Abstract] [Full Text]; Ghosh, Sudip [Full Text]; Giobbe, Roberto [Abstract] [Full Text]; Gödje, Oliver L. [Abstract] [Full Text]; Goldstraw, Peter [Abstract] [Full Text]; Gonzalez, Emmanuel [Abstract] [Full Text]; Gordon, Paul [Full Text]; Gregorash, Lori [Abstract] [Full Text]; Grinda, Jean-Michel [Full Text]; Grover, Frederick L. [Abstract] [Full Text]; Grunenwald, Dominique [Abstract] [Full Text]; Guarino, Anna [Abstract] [Full Text]; Gupta, C. Mallikarjuna [Full Text]; Gurevitch, Jacob [Abstract] [Full Text]; Gutfinger, Dan E. [Abstract] [Full Text]
H: Haenen, Luc [Full Text]; Hakimi, Mehdi [Abstract] [Full Text]; Hanai, Makoto [Abstract] [Full Text]; Hasegawa, Takashi [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Hentz, Jean-Gustave [Full Text]; Herman, Steven [Abstract] [Full Text]; Hibi, Michiaki [Abstract] [Full Text]; Hilkert, Robert J. [Abstract] [Full Text]; Hiramatsu, Takeshi [Abstract] [Full Text]; Horii, Taiko [Abstract] [Full Text]; Hoshino, Shuichi [Abstract] [Full Text]; Humphries, John E. [Abstract] [Full Text]; Hurni, Michel [Abstract] [Full Text]
I: Ilstrup, Duane M. [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Imaizumi, Munehisa [Abstract] [Full Text]; Ishii, Shinichi [Abstract] [Full Text]; Isom, O. Wayne [Abstract] [Full Text]; Ivert, Torbjörn [Abstract] [Full Text]
J: Jacquemin, Christine [Abstract] [Full Text]; Jagannath, Byalal Raghavendra [Full Text]; Jain, Sanjay M. [Full Text]; Jamart, Jacques [Abstract] [Full Text]; Jansen, E. Duco [Abstract] [Full Text]; Jaquiss, Robert D. B. [Abstract] [Full Text]; Jeanfaivre, Thierry [Abstract] [Full Text]; Jessen, Michael E. [Abstract] [Full Text]; Jha, Neerod K. [Full Text]; Johansen, Mary J. [Abstract] [Full Text]; Johnston, Michael R. [Full Text]; Johnston, William E. [Abstract] [Full Text]; Jones, Robert L. [Abstract] [Full Text]
K: Kadipasaoglu, Kamuran A. [Abstract] [Full Text]; Kaiser, George C. [Full Text]; Kawamura, Mitsuo [Abstract] [Full Text]; Kayhan, Cem [Abstract] [Full Text]; Keshavjee, Shafique H. [Abstract] [Full Text]; Kessler, Romain [Full Text]; Khaghani, Asghar [Abstract] [Full Text]; Kinsley, Robin H. [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Klinner, Werner [Abstract] [Full Text]; Kole, Shrikant D. [Full Text]; Konishi, Yutaka [Abstract] [Full Text]; Kontrus, Manfred [Abstract] [Full Text]; Koppula, Adarsh Subrahmanyam [Full Text]; Kurosawa, Hiromi [Abstract] [Full Text]; Kvernebo, Knut [Abstract] [Full Text]
L: L'Hoste, Philippe [Abstract] [Full Text]; Lagamayo, Lynn [Abstract] [Full Text]; LeHouerou, Daniel [Abstract] [Full Text]; Lerut, Toni E. [Full Text]; Lessana, Arrigo [Abstract] [Full Text]; Lille, Sean T. [Abstract] [Full Text]; Lin, Cheng Y. [Abstract] [Full Text]; Lobdell, Kevin W. [Abstract] [Full Text]; Locher, James P., Jr [Abstract] [Full Text]; Lonsdorfer, Jean [Full Text]; Louagie, Yves A. G. [Abstract] [Full Text]
M: Mack, Michael J. [Full Text]; MacVeigh, Ian [Abstract] [Full Text]; Maggi, Giuliano [Abstract] [Full Text]; Malhomme, Brigitte [Abstract] [Full Text]; Mancuso, Maurizio [Abstract] [Full Text]; Marath, Aubyn [Abstract] [Full Text]; Mark, James B. D. [Full Text]; Martin, Paul G. [Abstract] [Full Text]; Massard, Gilbert [Full Text]; Mastroroberto, Pasquale [Abstract] [Full Text]; Matsa, Menachem [Abstract] [Full Text]; Matsumoto, Masahiko [Abstract] [Full Text]; Matsuura, Akio [Abstract] [Full Text]; Mayer, John E., Jr [Full Text]; Mazzucco, Alessandro [Full Text]; McBride, Lawrence R. [Full Text]; McCarthy, Patrick M. [Full Text]; McKenna, Robert J., Jr [Full Text]; McKeown, Peter P. [Abstract] [Full Text]; McMahon, John [Abstract] [Full Text]; Menasché, Philippe [Abstract] [Full Text]; Mercogliano, Domenico [Full Text]; Mermillod, Bernadette [Abstract] [Full Text]; Meyer, Dan M. [Abstract] [Full Text]; Meyers, Frederick J. [Abstract] [Full Text]; Middlemost, Shirley J. [Full Text]; Miller, Mark P. [Abstract] [Full Text]; Minakata, Kenji [Abstract] [Full Text]; Minale, Carmine [Full Text]; Miwa, Senri [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Mohr, Rephael [Abstract] [Full Text]; Morita, Kiyozo [Abstract] [Full Text]; Motamedi, Massoud [Abstract] [Full Text]; Moulijn, Adrian C. [Full Text]; Mravunac, Marcel [Abstract] [Full Text]; Mueller, Richard L. [Abstract] [Full Text]; Mueller, Xavier M. [Abstract] [Full Text]; Mullany, Charles J. [Abstract] [Full Text]; Munnikhuysen, Dorothy E. [Abstract] [Full Text]; Murakami, Fumihiko [Abstract] [Full Text]; Murase, Mitsuya [Abstract] [Full Text]; Myers, John L. [Full Text]
N: Najafi, Hassan [Full Text]; Najm, Hani K. [Abstract] [Full Text]; Nakazawa, Makoto [Abstract] [Full Text]; Nawata, Sumihiko [Abstract] [Full Text]; Nease, Blaine [Abstract] [Full Text]; Nesbitt, Jonathan C. [Abstract] [Full Text]; Nesbitt, Kimberly Kenfield [Abstract] [Full Text]; Nollert, Georg [Abstract] [Full Text]; Nykamp, Verlyn J. [Abstract] [Full Text]
O: O'Dwyer, Catherine [Abstract] [Full Text]; Ohshima, Hideki [Abstract] [Full Text]; Ohtake, Hiroshi [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Oswald, Monique [Full Text]; Ott, Richard A. [Abstract] [Full Text]
P: Pagni, Sebastian [Abstract] [Full Text]; Pairolero, Peter C. [Full Text]; Paley, Michael [Abstract] [Full Text]; Pantaleo, Donato [Abstract] [Full Text]; Pargaonkar, Shirish [Abstract] [Full Text]; Parsonnet, Victor [Full Text]; Paz, Yosi [Abstract] [Full Text]; Pearson, F. Griffith [Abstract] [Full Text]; Pennington, D. Glenn [Full Text]; Perrault, Louis P. [Abstract] [Full Text]; Perryman, Richard A. [Abstract] [Full Text]; Pessotto, Renzo [Full Text]; Petruccioli, Maria Grazia [Abstract] [Full Text]; Pevni, Dimitri [Abstract] [Full Text]; Pfefer, T. Joshua [Abstract] [Full Text]; Polvani, Gian Luca [Abstract] [Full Text]; Pomini, Francesco [Full Text]; Pomini, Paolo [Full Text]; Pompilio, Giulio [Abstract] [Full Text]; Ponn, Ronald B. [Abstract] [Full Text]; Porqueddu, Massimo [Abstract] [Full Text]; Puga, Francisco J. [Abstract] [Full Text]; Putnam, Joe B., Jr [Abstract] [Full Text]
R: Raht, [Abstract] [Full Text]; Rebeyka, Ivan M. [Abstract] [Full Text]; Régnard, Olivier [Abstract] [Full Text]; Reichart, Bruno [Abstract] [Full Text]; Rein, Joachim-Gerd [Abstract] [Full Text]; Replogle, Robert L. [Full Text]; Reul, George J., Jr [Abstract] [Full Text]; Rice, Thomas W. [Abstract] [Full Text]; Riordan, Christopher J. [Abstract] [Full Text]; Robert, John H. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Rodrigus, Inez E. [Full Text]; Rosengart, Todd K. [Abstract] [Full Text]; Ross, Howard M. [Abstract] [Full Text]; Rossoni, Giuseppe [Abstract] [Full Text]; Roth, Jack A. [Abstract] [Full Text]; Roughneen, Patrick T. [Abstract] [Full Text]; Rubay, Jean E. [Abstract] [Full Text]; Ruchat, Patrick [Abstract] [Full Text]; Ruffini, Enrico [Abstract] [Full Text]; Rupp, Wolfgang [Abstract] [Full Text]
S: Sala, Andrea [Abstract] [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salerno, Tomás A. [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salih, Orhan Kemal [Abstract] [Full Text]; San, Mustafa [Abstract] [Full Text]; Santamore, William P. [Abstract] [Full Text]; Santini, Francesco [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schain, Denise C. [Abstract] [Full Text]; Schoevaerdts, Jean-Claude [Abstract] [Full Text]; Schrump, David S. [Abstract] [Full Text]; Schwartz, Marc [Abstract] [Full Text]; Senbaklavaci, Ömer [Abstract] [Full Text]; Shapira, Oz M. [Abstract] [Full Text]; Sharma, Bal K. [Full Text]; Sharma, Mitesh [Full Text]; Sharma, Ramesh K. [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Sheppard, Barry B. [Abstract] [Full Text]; Shroyer, A. Laurie W. [Abstract] [Full Text]; Simansky, David A. [Abstract] [Full Text]; Sluysmans, Thierry [Abstract] [Full Text]; Smedira, Nicholas G. [Abstract] [Full Text]; Smedts, Frank M. [Abstract] [Full Text]; Smedts, Frank M. [Abstract] [Full Text]; Sniderman, Kenneth [Abstract] [Full Text]; Spampinato, Nicola [Abstract] [Full Text]; Splittgerber, Fred H. [Full Text]; Spotnitz, William D. [Abstract] [Full Text]; Spyt, Thomas J. [Full Text]; Stevens, John H. [Full Text]; Stumpe, Frank [Abstract] [Full Text]; Suma, Hisayoshi [Abstract] [Full Text]; Summers, Randy [Abstract] [Full Text]; Sundset, Arve [Abstract] [Full Text]; Suri, Rajendar K. [Full Text]; Suri, Rakesh M. [Abstract] [Full Text]
T: Tadjkarimi, Samad [Abstract] [Full Text]; Takach, Thomas J. [Abstract] [Full Text]; Takanashi, Yoshinori [Abstract] [Full Text]; Takeuchi, Seijiro [Abstract] [Full Text]; Tanaka, Satoshi A. [Abstract] [Full Text]; Tanner, Teresa M. [Abstract] [Full Text]; Tantengco, M. Victoria [Abstract] [Full Text]; Tevaearai, Hendrik T. [Abstract] [Full Text]; Tomida, Yasuhiro [Abstract] [Full Text]; Topcuoglu, Mehmet Sah [Abstract] [Full Text]; Tranbaugh, Robert F. [Full Text]; Tschernko, Edda [Abstract] [Full Text]; Tyers, G. Frank O. [Full Text]
U: Uchida, Tatsuo [Abstract] [Full Text]; Ulus, Tümer [Abstract] [Full Text]; Urayama, Hiroshi [Abstract] [Full Text]
V: van Son, Jacques A. M. [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Van Trigt, Peter, III [Abstract] [Full Text]; Van Trigt, Peter, III [Abstract] [Full Text]; Vanhoutte, Paul M. [Abstract] [Full Text]; Vaughn, Cecil C., III [Abstract] [Full Text]; Vaughn, Cecil C. [Abstract] [Full Text]; Vaughn, Paul L. [Abstract] [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Vilaine, Jean-Paul [Abstract] [Full Text]; Villafane, Juan [Abstract] [Full Text]; Villeneuve, Nicole [Abstract] [Full Text]; Vitullo, Dolores A. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Walia, Abhay [Full Text]; Walsh, Garrett L. [Abstract] [Full Text]; Walters, Henry L., III [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Wanke, Theo [Abstract] [Full Text]; Watanabe, Hideyo [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Weber, Fred [Full Text]; Welch, Ashley J. [Abstract] [Full Text]; Werczberger, Arye [Abstract] [Full Text]; West, Kevin [Full Text]; Wihlm, Jean-Marie [Full Text]; Williams, William G. [Abstract] [Full Text]; Wisser, Wilfried [Abstract] [Full Text]; Witt, Christian [Abstract] [Full Text]; Wolf, Randall K. [Abstract] [Full Text]; Wolfhard, Ulrich F. [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Woodson, Lee C. [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yakirevich, Vladimir [Abstract] [Full Text]; Yang, Cheng-Qin [Abstract] [Full Text]; Yashima, Masafumi [Abstract] [Full Text]; Ye, Jian [Abstract] [Full Text]; Yellin, Alon [Abstract] [Full Text]; Yoshida, Katsuhiko [Abstract] [Full Text]; Yoshitake, Michio [Abstract] [Full Text]
Z: Ziv, Yaakov Bar [Abstract] [Full Text]