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Index by Author: Volume 62, Issue 6 (December 1996) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aaron, Benjamin L. [Abstract] [Full Text]; Abolhoda, Amir [Abstract] [Full Text]; Accola, Kevin D. [Abstract] [Full Text]; Acuff, Tea E. [Full Text]; Adatia, Ian [Abstract] [Full Text]; Allen, Keith R. [Abstract] [Full Text]; Allen, Mark S. [Full Text]; Altorki, Nasser K. [Abstract] [Full Text]; Alyono, David [Abstract] [Full Text]; Amato, Joseph J. [Abstract] [Full Text]; Andrade-Alegre, Rafael [Full Text]; Argenziano, Michael [Abstract] [Full Text]; Arnaudov, Dimitri [Abstract] [Full Text]; Atz, Andrew M. [Abstract] [Full Text]
B: Bacha, Emile A. [Abstract] [Full Text]; Baldeyrou, Pierre [Abstract] [Full Text]; Baldeyrou, Pierre [Full Text]; Balkhy, Husam H. [Abstract] [Full Text]; Banic, Andrej [Abstract] [Full Text]; Bapuraj, J. Rajiv [Abstract] [Full Text]; Baquey, Charles [Abstract] [Full Text]; Baronos, Eleftherios S. [Abstract] [Full Text]; Baruah, Amarjyoti [Abstract] [Full Text]; Bauer, Erwin P. [Abstract] [Full Text]; Bayazit, Kemal [Abstract] [Full Text]; Becker, Ronald M. [Full Text]; Bélisle, Sylvain [Abstract] [Full Text]; Bélisle, Sylvain [Abstract] [Full Text]; Bélisle, Sylvain [Full Text]; Bélisle, Sylvain [Abstract] [Full Text]; Benfield, , JR [Full Text]; Benillan, Nathalie [Abstract] [Full Text]; Bentley, Michael J. [Abstract] [Full Text]; Bergsland, Jacobs [Full Text]; Bertani, Aldo [Abstract] [Full Text]; Bhan, Anil [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Biswas, Shankha S. [Abstract] [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Blanche, Carlos [Abstract] [Full Text]; Blitz, Arie [Abstract] [Full Text]; Bogden, John D. [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Boujoukos, Arthur [Abstract] [Full Text]; Boyle, Edward M., Jr [Abstract] [Full Text]; Bricker, Donald L. [Abstract] [Full Text]; Brown, Ivan W., Jr [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Brunelli, Alessandro [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Caversaccio, Marco [Abstract] [Full Text]; Cerny, Andreas [Abstract] [Full Text]; Chan, Anthony T. C. [Abstract] [Full Text]; Chandra, Mukul [Abstract] [Full Text]; Chang, Paul A. [Abstract] [Full Text]; Chapelier, Alain R. [Abstract] [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Chen, Ming-Fong [Abstract] [Full Text]; Cheng, Sheng-Xi [Abstract] [Full Text]; Childs, Keith.F. [Abstract] [Full Text]; Chou, Nai-Kuan [Abstract] [Full Text]; Chu, Shu-Hsun [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Cohen, Amram J. [Abstract] [Full Text]; Cohen, Andrew S. [Full Text]; Collins, John P. [Abstract] [Full Text]; Conyers, Robert A. J. [Abstract] [Full Text]; Cooper, Graham J. [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Copeland, Jack G., III [Abstract] [Full Text]; Cornejo, Carol J. [Abstract] [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Czer, Lawrence S. C. [Abstract] [Full Text]
D: D'Agostino, Richard S. [Abstract] [Full Text]; Daily, Pat O. [Abstract] [Full Text]; Dalton, Heidi J. [Abstract] [Full Text]; Daniel, Thomas M. [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; David, Jean-Louis [Abstract] [Full Text]; Davis, R. Duane [Abstract] [Full Text]; De L. Stanbridge, Rex [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; de Moerloose, Philippe [Abstract] [Full Text]; DeLima, Nuno F. [Abstract] [Full Text]; Dennewald, George [Abstract] [Full Text]; Denton, Timothy A. [Abstract] [Full Text]; Deslauriers, Jean [Abstract] [Full Text]; Détruit, Hélène [Abstract] [Full Text]; Diethrich, Edward B. [Abstract] [Full Text]; Dilling, Emery W. [Abstract] [Full Text]
E: Edelman, [Full Text]; Eley, J. William [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Esato, Kensuke [Abstract] [Full Text]; Ezra, Shaul [Abstract] [Full Text]
F: Feins, Richard H. [Abstract] [Full Text]; Fermanis, Gary G. [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Fianchini, Aroldo [Abstract] [Full Text]; Filaire, Marc [Abstract] [Full Text]; Fishbein, Michael C. [Abstract] [Full Text]; Fujii, Yutaka [Abstract] [Full Text]; Fujimura, Yoshihiko [Abstract] [Full Text]; Fukuda, Tomonobu [Abstract] [Full Text]; Furrer, Markus [Abstract] [Full Text]; Furuse, Akira [Abstract] [Full Text]
G: Gabbay, Shlomo [Abstract] [Full Text]; Gandara, [Full Text]; Gill, Shivender [Abstract] [Full Text]; Gilroy, Stephen J. [Abstract] [Full Text]; Ginsburg, Mark E. [Abstract] [Full Text]; Girard, Philippe [Full Text]; Girard, Philippe [Abstract] [Full Text]; Glazier, David B. [Abstract] [Full Text]; Gomi, Seigo [Full Text]; Gorenstein, Lyall A. [Abstract] [Full Text]; Goto, Hiraaki [Full Text]; Gott, John Parker [Abstract] [Full Text]; Grauhan, Onen [Abstract] [Full Text]; Greco, Franco [Abstract] [Full Text]; Greer, Kevin [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grover, Frederick L. [Full Text]; Grunenwald, Dominique [Abstract] [Full Text]; Grunenwald, Dominique [Full Text]; Gu, Mai [Abstract] [Full Text]; Guay, Joanne [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Hadjinikolaou, Leonidas [Full Text]; Hamano, Kimikazu [Abstract] [Full Text]; Hammond, Robert L. [Abstract] [Full Text]; Han, Shenggao [Abstract] [Full Text]; Hantler, Charles B. [Abstract] [Full Text]; Hardy, Jean-François [Abstract] [Full Text]; Hardy, Jean-François [Abstract] [Full Text]; Hardy, Jean-François [Full Text]; Hardy, Jean-François [Abstract] [Full Text]; Harrison, Lynn H., Jr [Abstract] [Full Text]; Hartstein, Gary [Abstract] [Full Text]; Hartstein, Gary [Abstract] [Full Text]; Hauptman, Eli [Abstract] [Full Text]; Hayashida, Nobuhiko [Abstract] [Full Text]; Heck, Herman A., Jr [Abstract] [Full Text]; Hervé, Philippe [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hisatomi, Kouichi [Abstract] [Full Text]; Hisatomi, Kouichi [Abstract] [Full Text]; Hix, William R. [Abstract] [Full Text]; Ho, Jonathan K. S. [Abstract] [Full Text]; Hoda, Syed [Abstract] [Full Text]; Hodakowski, George T. [Abstract] [Full Text]; Hofmeister, Josef [Abstract] [Full Text]; Hopkins, Richard A. [Abstract] [Full Text]; Horton, David A. [Abstract] [Full Text]; Hosoda, Yasuyuki [Abstract] [Full Text]; Hummel, Brian W. [Abstract] [Full Text]; Hummel, Manfred [Abstract] [Full Text]
I: Imoto, Yutaka [Abstract] [Full Text]; Inamura, Noboru [Abstract] [Full Text]; Ingemansson, Richard [Abstract] [Full Text]; Ishihara, Kazuaki [Abstract] [Full Text]; Isoda, Susumu [Abstract] [Full Text]; Isomura, Tadashi [Abstract] [Full Text]; Isomura, Tadashi [Abstract] [Full Text]; Ito, Hiroshi [Abstract] [Full Text]; Iwamura, Hiroshi [Abstract] [Full Text]; Iyer, Krishna S. [Full Text]; Iyer, Raju S. [Abstract] [Full Text]; Izumoto, Hiroshi [Abstract] [Full Text]
J: Jacobs, Jeffrey P. [Abstract] [Full Text]; Janssens, Marc [Abstract] [Full Text]; Janssens, Marc [Abstract] [Full Text]; Janvier, Gérard [Abstract] [Full Text]; Janvier, Gérard [Abstract] [Full Text]; Jatene, Fabio Biscegli [Full Text]; Jellen, Patricia A. [Abstract] [Full Text]; Johnson, Keith [Abstract] [Full Text]; Johnstone, David W. [Abstract] [Full Text]; Jones, Ellis L. [Abstract] [Full Text]
K: Kabeer, Meerasahib [Full Text]; Kado, Hideaki [Abstract] [Full Text]; Kakadellis, John [Full Text]; Kanemoto, Shinya [Full Text]; Kaplitt, Martin J. [Abstract] [Full Text]; Kaplitt, Michael G. [Abstract] [Full Text]; Katoh, Hirohisa [Abstract] [Full Text]; Katoh, Tomoe [Abstract] [Full Text]; Kawaharada, Nobuyoshi [Abstract] [Full Text]; Kawata, Hiroaki [Abstract] [Full Text]; Kawazoe, Kohei [Abstract] [Full Text]; Kececioglu, Deniz [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Kemp, Francis W. [Abstract] [Full Text]; Kim, Joung Taek [Full Text]; Kim, Kwang Ho [Full Text]; Kim, Kwang Ho [Full Text]; Kimblad, Per Ola [Abstract] [Full Text]; Kinjyo, Tamahiro [Abstract] [Full Text]; Kishimoto, Hidefumi [Abstract] [Full Text]; Klein, Irwin L. [Abstract] [Full Text]; Klopfenstein, Claude E. [Abstract] [Full Text]; Klövekorn, Wolf-Peter [Abstract] [Full Text]; Komatsu, Sakuzo [Abstract] [Full Text]; Konertz, Wolfgang [Abstract] [Full Text]; Kosuga, Kenichi [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Full Text]; Kouretas, Peter C. [Abstract] [Full Text]; Krause, Tyrone J. [Abstract] [Full Text]; Krieger, KarlH. [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Küçükaksu, Süha D. [Abstract] [Full Text]; Kusajima, Katsuyuki [Abstract] [Full Text]; Kütük, Emine [Abstract] [Full Text]
L: Laks, Hillel [Abstract] [Full Text]; Lam, Lydia [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Lee, Jeong Ryul [Abstract] [Full Text]; Lee, Tak Wai [Abstract] [Full Text]; Lee, Tsung-Ming [Abstract] [Full Text]; Lee, Yuan-Teh [Abstract] [Full Text]; Lemermeyer, Gillian [Abstract] [Full Text]; Lemmer, John H., Jr [Abstract] [Full Text]; Levasseur, Philippe [Full Text]; Li, Juan [Abstract] [Full Text]; Li, Yuan-Jian [Abstract] [Full Text]; Liau, Chiau-Suong [Abstract] [Full Text]; Liebson, Philip R. [Full Text]; Lin, Yueh-Juh [Abstract] [Full Text]; Lindberg, Lars [Abstract] [Full Text]; Loebe, Matthias [Abstract] [Full Text]; Lu, Er-Xiong [Abstract] [Full Text]; Lu, Huiping [Abstract] [Full Text]; Lu, Qi [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]; Luketich, James D. [Abstract] [Full Text]
M: Macauley, R. John [Abstract] [Full Text]; MacDonald, Malcolm J. [Abstract] [Full Text]; Mack, Charles A. [Abstract] [Full Text]; Mack, Michael J. [Full Text]; Maddi, Rosemarie [Abstract] [Full Text]; Magovern, Christopher J. [Abstract] [Full Text]; Magovern, James A. [Full Text]; Makimura, Hideo [Abstract] [Full Text]; Mansour, Kamal A. [Full Text]; Mansour, Kamal A. [Full Text]; Markley, John G. [Abstract] [Full Text]; Marshall, William G., Jr [Abstract] [Full Text]; Maruyama, Hiroshi [Abstract] [Full Text]; Masuzawa, Toru [Abstract] [Full Text]; Matloff, Jack M. [Abstract] [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Matzinger, Frederick R. [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Mazmanian, Guy-Michel [Abstract] [Full Text]; McCormick, John R. [Abstract] [Full Text]; Mehran, Reza J. [Abstract] [Full Text]; Meneshian, Avedis [Abstract] [Full Text]; Mitsui, Toshio [Full Text]; Moazami, Nader [Abstract] [Full Text]; Möllhoff, Thomas [Abstract] [Full Text]; Moor, Gordon F. [Abstract] [Full Text]; Morita, Satoru [Abstract] [Full Text]; Moriyama, Yukinori [Abstract] [Full Text]; Morton, Jeremy R. [Abstract] [Full Text]; Muhlbaier, Lawrence H. [Full Text]; Mullen, John C. [Abstract] [Full Text]; Murakami, Shinya [Abstract] [Full Text]; Murphy, Charles O. [Abstract] [Full Text]; Murphy, David P. [Abstract] [Full Text]; Muti, Mauro [Abstract] [Full Text]; Myers, Adam K. [Abstract] [Full Text]; Myers, Jeff L. [Abstract] [Full Text]
N: Nagata, Hideyuki [Abstract] [Full Text]; Nakada, Takeshi [Abstract] [Full Text]; Nakajima, Hidehiro [Abstract] [Full Text]; Nakajima, Hisako O. [Abstract] [Full Text]; Nakajima, Tohru [Abstract] [Full Text]; Nayak, Vijaya M. [Full Text]; Neumann, Deborah J. [Abstract] [Full Text]; Nicholson, Andrew G. [Abstract] [Full Text]; Nicolosi, Alfred C. [Abstract] [Full Text]; Ning, Xue-Han [Abstract] [Full Text]; Noon, George P. [Abstract] [Full Text]
O: O'Neil, Scott M. [Abstract] [Full Text]; Ochsner, John L. [Abstract] [Full Text]; Ogawa, Masaaki [Abstract] [Full Text]; Ohishi, Kiroku [Abstract] [Full Text]; Ohtsuka, Toshiya [Abstract] [Full Text]; Ojamaa, Kaie [Abstract] [Full Text]; Oka, Teruaki [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Oshinski, John N. [Abstract] [Full Text]; Oyama, Kotaro [Abstract] [Full Text]; Oyarzun, J. Rodrigo [Abstract] [Full Text]; Özdemir, Murat [Abstract] [Full Text]
P: Parekh, Vikas I. [Abstract] [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Pastorino, Ugo [Abstract] [Full Text]; Pathik, Shobhna [Abstract] [Full Text]; Pego-Fernandes, Paulo Manuel [Full Text]; Pellett, John R. [Abstract] [Full Text]; Peng, Chang-Fu [Abstract] [Full Text]; Pettigrew, Roderic I. [Abstract] [Full Text]; Pettit, Maria T. [Abstract] [Full Text]; Pinsky, David J. [Full Text]; Pohlman, Timothy H. [Abstract] [Full Text]
R: Ramasastry, Sai S. [Abstract] [Full Text]; Régnard, Jean-François [Full Text]; Reuthebuch, Oliver T. [Abstract] [Full Text]; Rich, Jeffrey B. [Abstract] [Full Text]; Richenbacher, Wayne E. [Full Text]; Riou, Peter J. [Abstract] [Full Text]; Ris, Hans-Beat [Abstract] [Full Text]; Rivard, Georges-Étienne [Abstract] [Full Text]; Roach M, , III [Full Text]; Robicsek, Francis [Abstract] [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Rosenfeldt, Franklin L. [Abstract] [Full Text]; Rosengart, Todd K. [Full Text]; Roth, Christian [Abstract] [Full Text]; Roth, Matthias [Abstract] [Full Text]
S: Saint-Maurice, Olivier [Abstract] [Full Text]; Salerno, Tomas A. [Full Text]; Salmons, Stanley [Abstract] [Full Text]; Samama, Marc [Abstract] [Full Text]; Samulski, Richard J. [Abstract] [Full Text]; Sarwal, Virendar [Abstract] [Full Text]; Sasaguri, Shiro [Abstract] [Full Text]; Sasson, Lior [Abstract] [Full Text]; Sato, Tohru [Abstract] [Full Text]; Sato, Toru [Abstract] [Full Text]; Schachner, Arie [Abstract] [Full Text]; Scheld, Hans H. [Abstract] [Full Text]; Schmid, Christof [Abstract] [Full Text]; Schmidt, Frank E., Jr [Abstract] [Full Text]; Schurr, Michael J. [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Shamji, Farid M. [Abstract] [Full Text]; Sharma, Om Prakash [Abstract] [Full Text]; Sharma, Rajesh [Full Text]; Shen, Yannen [Abstract] [Full Text]; Shikata, Hiroo [Abstract] [Full Text]; Shimokawa, Shinji [Abstract] [Full Text]; Shiraishi, Yuji [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Singhi, Pratibha [Abstract] [Full Text]; Sjöberg, Trygve [Abstract] [Full Text]; Smith, Peter K. [Full Text]; Smolich, Joseph J. [Abstract] [Full Text]; Sogliani, Franco [Full Text]; Sommers, K. Eric [Abstract] [Full Text]; Spaggiari, Lorenzo [Abstract] [Full Text]; Spaggiari, Lorenzo [Full Text]; Stark, Jaroslav [Abstract] [Full Text]; Steen, Stig [Abstract] [Full Text]; Steinglass, Kenneth M. [Abstract] [Full Text]; Stephenson, Larry W. [Abstract] [Full Text]; Strumpf, Robert K. [Abstract] [Full Text]; Su, Sheng-Fang [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sueshiro, Masafumi [Abstract] [Full Text]; Suma, Hisayoshi [Abstract] [Full Text]; Suri, Rajendar Krishan [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]
T: Taenaka, Yoshiyuki [Abstract] [Full Text]; Taira, Akira [Abstract] [Full Text]; Takahashi, Hiroki [Abstract] [Full Text]; Takano, Hisateru [Abstract] [Full Text]; Takkenberg, Johanna J. M. [Abstract] [Full Text]; Tarcan, Onurcan K. [Abstract] [Full Text]; Tasdemir, OGuz [Abstract] [Full Text]; Tatsumi, Eisuke [Abstract] [Full Text]; Terada, Yasushi [Full Text]; Thomas, Arthur N. [Full Text]; Thomas, Gregory A. [Abstract] [Full Text]; Thomashow, Byron [Abstract] [Full Text]; Toda, Koichi [Abstract] [Full Text]; Todd, Thomas R. J. [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Trachiotis, Gregory D. [Abstract] [Full Text]; Trento, Alfredo [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tric, Laurent [Abstract] [Full Text]; Tsuboi, Hidetoshi [Abstract] [Full Text]
U: Ueno, Takayoshi [Abstract] [Full Text]; Utoh, Junichi [Full Text]
V: Van Trigt, Peter, III [Abstract] [Full Text]; Venugopal, Panangipalli [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Victor, Solomon [Full Text]; Vigneswaran, Wickii T. [Abstract] [Full Text]; Vricella, Luca A. [Abstract] [Full Text]; Vural, Kerem M. [Abstract] [Full Text]
W: Wan, Innes Y. P. [Abstract] [Full Text]; Wang, Yining [Abstract] [Full Text]; Watanabe, Atsushi [Abstract] [Full Text]; Watanabe, Syunichi [Abstract] [Full Text]; Waters, Paul F. [Abstract] [Full Text]; Webb, Watts R. [Full Text]; Weber, Sharon M. [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Weng, Yuguo [Abstract] [Full Text]; Wessel, David L. [Abstract] [Full Text]; Weston, Jo S. [Abstract] [Full Text]; Wetstein, Lewis [Full Text]; Whitten, Charles W. [Abstract] [Full Text]; Williamson, Warren A. [Abstract] [Full Text]; Wizorek, Joseph J. [Abstract] [Full Text]
X: Xiao, Xiao [Abstract] [Full Text]
Y: Yagyu, Kuniyoshi [Abstract] [Full Text]; Yaku, Hitoshi [Abstract] [Full Text]; Yamamoto, Shin [Abstract] [Full Text]; Yamashita, Takuya [Abstract] [Full Text]; Yankah, Ekua [Abstract] [Full Text]; Yasuda, Hiroyuki [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yim, Anthony P. C. [Abstract] [Full Text]; Yim, Anthony P. C. [Full Text]; Yu, Sumei [Abstract] [Full Text]
Z: Zabeeda, Deeb [Abstract] [Full Text]; Zbären, Peter [Abstract] [Full Text]