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Index by Author: Volume 60, Issue 3 (September 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Acar, Christophe [Abstract] [Full Text]; Actis Dato, Guglielmo M. [Full Text]; Adelstein, David J. [Abstract] [Full Text]; Aguinaga, Miguel [Abstract] [Full Text]; Aisner, Seena C. [Abstract] [Full Text]; Albelda, Steven M. [Abstract] [Full Text]; Albertos, Jose [Abstract] [Full Text]; Albin, Robert J. [Abstract] [Full Text]; Alboliras, Ernerio T. [Abstract] [Full Text]; Alper, Steven A. [Abstract] [Full Text]; Ambrogi, Vincenzo [Abstract] [Full Text]; Amin, Kunjlata M. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Timothy M. [Abstract] [Full Text]; Angelini, Gianni D. [Full Text]; Arbenz, Urs [Abstract] [Full Text]; Arcas, Ramon [Abstract] [Full Text]; Arcidi, Joseph M. [Abstract] [Full Text]
B: Backer, Carl L. [Abstract] [Full Text]; Ballerini, Luigi [Abstract] [Full Text]; Balmes, Michel [Abstract] [Full Text]; Bastida, Emilia [Abstract] [Full Text]; Becker, Ronald M. [Full Text]; Benfield, John R. [Full Text]; Bengur, A. Resai [Abstract] [Full Text]; Beyersdorf, Friedhelm [Abstract] [Full Text]; Bhan, Anil [Abstract] [Full Text]; Birdi, Inderpaul [Full Text]; Bizekis, Costas [Abstract] [Full Text]; Black, Michael D. [Abstract] [Full Text]; Bobadilla, Jaime F. [Abstract] [Full Text]; Boldrini, Renata [Abstract] [Full Text]; Bolman, R. Morton, III [Full Text]; Bosman, Cesare [Abstract] [Full Text]; Boyev, Paul [Abstract] [Full Text]; Brink, Charles [Abstract] [Full Text]; Brown, James M. [Abstract] [Full Text]; Bryan, Alan J. [Full Text]; Buche, Michel [Abstract] [Full Text]; Buckberg, Gerald D. [Abstract] [Full Text]; Budd, G. Thomas [Abstract] [Full Text]; Bulder, Eisso R. [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Buth, Karen J. [Abstract] [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Cameron, Duke E. [Full Text]; Carotti, Adriano [Abstract] [Full Text]; Carpentier, Alain F. [Abstract] [Full Text]; Chapelier, Alain R. [Abstract] [Full Text]; Chenu, Patrick [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Cintron, John R. [Abstract] [Full Text]; Cleveland, Joseph C., Jr [Abstract] [Full Text]; Cohen, Neri M. [Abstract] [Full Text]; Cohen, Richard A. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Copin, Marie-Christine [Abstract] [Full Text]; Cordell, A. Robert [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]
D: D'Annunzio, Erminio [Abstract] [Full Text]; Dabbagh, Ahmad [Abstract] [Full Text]; Damiano, Ralph J., Jr [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; Dartevelle, Philippe G. [Abstract] [Full Text]; Das, Dipak K. [Abstract] [Full Text]; Davis, J. Terrance [Abstract] [Full Text]; Deaton, David W. [Abstract] [Full Text]; Denizot, Yves [Full Text]; Desmidt, Angélique [Abstract] [Full Text]; Despotis, George J. [Abstract] [Full Text]; Devine, William A. [Abstract] [Full Text]; di Carlo, Duccio [Abstract] [Full Text]; Di Giammarco, Gabriele [Abstract] [Full Text]; di Summa, Michele [Full Text]; Domergue, Jacques [Abstract] [Full Text]; Donegani, Enrico [Full Text]; Drossos, George [Abstract] [Full Text]; Dumont, Pascal [Abstract] [Full Text]
E: Ecker, Roger R. [Full Text]; Edwards, William D. [Abstract] [Full Text]; Eijsman, León [Abstract] [Full Text]; Elshami, Ashraf A. [Abstract] [Full Text]; Endo, Masahiro [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]; Eucher, Philippe M. [Abstract] [Full Text]
F: Fabre, Jean-Michel [Abstract] [Full Text]; Fasnacht, Margrit S. [Abstract] [Full Text]; Fino, Carlo [Abstract] [Full Text]; Flack, Joseph E., III [Abstract] [Full Text]; Flisser, Adam [Abstract] [Full Text]; Fonger, James D. [Abstract] [Full Text]; Formigari, Roberto [Abstract] [Full Text]; Freeman, Scott M. [Full Text]; Freitag, Lutz [Abstract] [Full Text]; Furuse, Akira [Abstract] [Full Text]
G: Galloway, Aubrey C. [Abstract] [Full Text]; Garrido, Pilar [Abstract] [Full Text]; Genoni, Michele [Abstract] [Full Text]; Giannopoulos, Nicholas [Abstract] [Full Text]; González Santos, Jose M. [Abstract] [Full Text]; Goto, Hirohisa [Abstract] [Full Text]; Greenwald, Joshua [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]
H: Haas, Gary S. [Abstract] [Full Text]; Hammermeister, Karl E. [Full Text]; Hammon, John W., Jr [Full Text]; Hammon, John W., Jr [Abstract] [Full Text]; Harada, Yorikazu [Abstract] [Full Text]; Hardesty, Robert L. [Abstract] [Full Text]; Harken, Alden H. [Abstract] [Full Text]; Hartman, J. Craig [Abstract] [Full Text]; Haudenschild, Christian C. [Abstract] [Full Text]; Haxhe, Jean-Paul [Abstract] [Full Text]; Hayashida, Nobuhiko [Abstract] [Full Text]; Herlong, J. René [Abstract] [Full Text]; Hervé, Philippe [Abstract] [Full Text]; Hess, Michael L. [Abstract] [Full Text]; Hibi, Michiaki [Abstract] [Full Text]; Hiraishi, Satoshi [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Holland, Fred W., II [Abstract] [Full Text]; Hwang, Harry C. [Abstract] [Full Text]
I: Iacono, Aldo T. [Abstract] [Full Text]; Ikonomidis, John S. [Abstract] [Full Text]; Iwase, Jinichi [Abstract] [Full Text]; Iyer, Krishna S. [Abstract] [Full Text]; Izzat, Mohammad Bashar [Full Text]
J: Jacobs, Jeffrey P. [Abstract] [Full Text]; Jansen, Piet G. M. [Abstract] [Full Text]; Jessen, Michael E. [Abstract] [Full Text]; Johnson, Howard D. [Abstract] [Full Text]; Johnson, Mark C. [Abstract] [Full Text]; Joyce, Frederic S. [Abstract] [Full Text]; Julsrud, Paul R. [Abstract] [Full Text]
K: Kaiser, Larry R. [Abstract] [Full Text]; Kalfin, Reni [Abstract] [Full Text]; Kallfelz, Hans C. [Abstract] [Full Text]; Karanikolas, Menelaos [Abstract] [Full Text]; Kasahara, Shingo [Abstract] [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kawada, Masaaki [Abstract] [Full Text]; Kawai, Akihiko [Abstract] [Full Text]; Kawamura, Mitsuo [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Kessler, Romain [Abstract] [Full Text]; Kilpatrick, Lucienne L. [Abstract] [Full Text]; Kirby, Thomas J. [Abstract] [Full Text]; Kirvassilis, George V. [Abstract] [Full Text]; Kitamura, Masaya [Abstract] [Full Text]; Kohno, Tadasu [Abstract] [Full Text]; Koka, Anuradha [Abstract] [Full Text]; Konishi, Heroaki [Abstract] [Full Text]; Kothari, Shyam S. [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kucharczuk, John C. [Abstract] [Full Text]; Kukreja, Rakesh C. [Abstract] [Full Text]; Kumar, Krishna [Abstract] [Full Text]; Kumar, Ravi [Abstract] [Full Text]; Kupilik, Natascha [Abstract] [Full Text]; Kuus, Anne [Abstract] [Full Text]
L: Lamberti, John J. [Full Text]; Lappas, Demetrios G. [Abstract] [Full Text]; Lasley, Robert D. [Abstract] [Full Text]; Lefer, Allan M. [Abstract] [Full Text]; Lefer, Allan M. [Abstract] [Full Text]; Lenert, Jeffrey T. [Abstract] [Full Text]; Leppink, Douglas M. [Abstract] [Full Text]; Leyland, Steven A. [Abstract] [Full Text]; Li, Jennifer S. [Abstract] [Full Text]; Lin, Zon Bo [Abstract] [Full Text]; Litzky, Leslie A. [Abstract] [Full Text]; Louagie, Yves A. G. [Abstract] [Full Text]; Lust, Robert M. [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Mackenzie, James W. [Full Text]; Maddestra, Nicola [Abstract] [Full Text]; Mainwaring, Richard D. [Full Text]; Marquette, Charles Hugo [Abstract] [Full Text]; Marra, Sebastiano [Full Text]; Marty-Ané, Charles-Henri [Abstract] [Full Text]; Mary, Henri [Abstract] [Full Text]; Massard, Gilbert [Abstract] [Full Text]; Masters, Thomas N. [Abstract] [Full Text]; Matloff, Jack M. [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mayumi, Hisanori [Abstract] [Full Text]; Mazmanian, Guy-Michel [Abstract] [Full Text]; McCoy, Karen S. [Abstract] [Full Text]; McKneally, Martin F. [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; McLoughlin, David E. [Abstract] [Full Text]; Meng, Xianzhong [Abstract] [Full Text]; Mensier, Eric [Abstract] [Full Text]; Mentzer, Robert M., Jr [Abstract] [Full Text]; Mihaljevic, Tomislav [Full Text]; Miller, Joseph I., Jr [Abstract] [Full Text]; Mineo, Tommaso Claudio [Abstract] [Full Text]; Mitchell, Ian M. [Full Text]; Mohl, Werner [Abstract] [Full Text]; Moidl, Reinhard [Abstract] [Full Text]; Moisa, Robbin Bura [Abstract] [Full Text]; Morand, Georges [Abstract] [Full Text]; Morgan, Marc S. [Abstract] [Full Text]; Moritz, Anton [Abstract] [Full Text]; Muehrcke, Derek D. [Abstract] [Full Text]; Mull, David H. [Abstract] [Full Text]; Münkel, Brigitte [Abstract] [Full Text]; Murakami, Fumihiko [Abstract] [Full Text]
N: Nagatsu, Masayoshi [Abstract] [Full Text]; Naik, Surendra [Abstract] [Full Text]; Nakae, Seimei [Abstract] [Full Text]; Nakajima, Jun [Abstract] [Full Text]; Nakanishi, Ryoichi [Abstract] [Full Text]; Nathan, Nathalie [Full Text]; Nayak, Vijaya M. [Full Text]; Nelson, Jerald C. [Full Text]; Neptune, Wilford B. [Full Text]; Ng, Bruce [Abstract] [Full Text]; Nishida, Hiroshi [Abstract] [Full Text]; Normandin, Louis [Abstract] [Full Text]; Norton, Terry O. [Abstract] [Full Text]; Nunley, David R. [Abstract] [Full Text]
O: O'Marcaigh, Aengus S. [Abstract] [Full Text]; Odim, Jonah [Full Text]; Ohtsuka, Goro [Abstract] [Full Text]; Ohtsuka, Toshiya [Abstract] [Full Text]; Olencki, Thomas E. [Abstract] [Full Text]; Omata, Sadao [Abstract] [Full Text]; Ota, Yoshinori [Abstract] [Full Text]
P: Page, Richard L. [Abstract] [Full Text]; Pansini, Stefano [Full Text]; Paradis, Irvin L. [Abstract] [Full Text]; Pathi, Vivek [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Paul, Thomas [Abstract] [Full Text]; Paulus, Reggie [Abstract] [Full Text]; Pearson, F. Griffith [Abstract] [Full Text]; Peereboom, David [Abstract] [Full Text]; Peters, Richard M. [Full Text]; Pettersson, Gösta [Abstract] [Full Text]; Petyt, Laurent [Abstract] [Full Text]; Pfammatter, Jean-Pierre [Abstract] [Full Text]; Pond, Charles G. [Abstract] [Full Text]; Powell, Kimerly [Abstract] [Full Text]; Prudhome, Michel [Abstract] [Full Text]
R: Ramon, Philippe [Abstract] [Full Text]; Rao, Vivek [Abstract] [Full Text]; Rao, Vivek [Abstract] [Full Text]; Regnard, Jean-Francois [Full Text]; Regragui, Idriss A. [Full Text]; Rice, Thomas W. [Abstract] [Full Text]; Rich, Andrew A. [Full Text]; Robicsek, Francis [Abstract] [Full Text]; Rodriguez, Leonardo [Abstract] [Full Text]; Roeslin, Norbert [Abstract] [Full Text]; Rosenkranz, Eliot R. [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]; Rowe, Marc I. [Full Text]; Rowland, Robert T. [Abstract] [Full Text]; Ruberg, Robert L. [Abstract] [Full Text]
S: Santoro, Giuseppe [Abstract] [Full Text]; Sato, Hiroki [Abstract] [Full Text]; Saxena, Anita [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schaper, Jutta [Abstract] [Full Text]; Scheltinga, Marc R. M. [Abstract] [Full Text]; Schoevaerdts, Jean-Claude [Abstract] [Full Text]; Schwartz, Daniel S. [Abstract] [Full Text]; Scott, William C. [Abstract] [Full Text]; Seccombe, John F. [Abstract] [Full Text]; Sharma, Rajesh [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shirai, Toshizumi [Abstract] [Full Text]; Simon, Paul [Abstract] [Full Text]; Smythe, W. Roy [Abstract] [Full Text]; Spencer, Frank C. [Abstract] [Full Text]; Spray, Thomas L. [Abstract] [Full Text]; Sprengel, Udo [Abstract] [Full Text]; Steinberg, Bryan M. [Abstract] [Full Text]; Stewart, William J. [Abstract] [Full Text]; Strauss, Arnold W. [Abstract] [Full Text]
T: Takeuchi, Takamasa [Abstract] [Full Text]; Taylor, Marie E. [Abstract] [Full Text]; Tefft, Melvin [Abstract] [Full Text]; Templeton, Philip A. [Abstract] [Full Text]; Teodori, Giovanni [Abstract] [Full Text]; Thomas, James D. [Abstract] [Full Text]; Thurer, Richard J. [Abstract] [Full Text]; Tingleff, Jens [Abstract] [Full Text]; Tixier, Denis B. [Abstract] [Full Text]; Todd, Thomas R. J. [Abstract] [Full Text]; Tokunaga, Kouichi [Abstract] [Full Text]; Tomlinson, James S. [Abstract] [Full Text]; Tönz, Martin [Full Text]; Toshima, Yoshihiro [Abstract] [Full Text]; Triantafillou, Anastasios N. [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]; Turina, Marko I. [Full Text]; Turley, Kevin [Abstract] [Full Text]
U: Uemura, Hideki [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Ungerleider, Ross M. [Full Text]; Usui, Akihiko [Abstract] [Full Text]; Utley, Joe R. [Abstract] [Full Text]
V: Vallejo, Jose L. [Abstract] [Full Text]; Van Kirk, Marjorie A. [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Velthuis, Henk te [Abstract] [Full Text]; Venugopal, Panangipalli [Abstract] [Full Text]; Verrier, Edward D [Abstract] [Full Text]; Victor, Solomon [Full Text]; Vinten-Johansen, Jakob [Abstract] [Full Text]; Vinten-Johansen, Jakob [Full Text]; Vitolla, Giuseppe [Abstract] [Full Text]; Vogt, Paul R. [Abstract] [Full Text]; von Segesser, Ludwig K. [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wait, Michael A. [Abstract] [Full Text]; Waldman, J. Deane [Full Text]; Watson, Michael S. [Abstract] [Full Text]; Wechsler, Andrew S. [Full Text]; Wechsler, Andrew S. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weksler, Benny [Abstract] [Full Text]; Westaby, Stephen [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Weyant, Robert J. [Abstract] [Full Text]; White, Charles S. [Abstract] [Full Text]; Wihlm, Jean-Marie [Abstract] [Full Text]; Wilde, Edwin F. [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Witt, Christian [Abstract] [Full Text]; Wixon, Christopher L. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wright, Christopher C. [Abstract] [Full Text]
Y: Yagyu, Kuniyoshi [Abstract] [Full Text]; Yamaki, Fumitaka [Abstract] [Full Text]; Yang, Xi Ming [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yasumoto, Kosei [Abstract] [Full Text]; Yoshida, Katsuhiko [Abstract] [Full Text]; Yoshimura, Hirokuni [Abstract] [Full Text]
Z: Zales, Vincent R. [Abstract] [Full Text]; Zehr, Kenton J. [Full Text]; Zeldis, Steven M. [Abstract] [Full Text]; Zhang, Hong Bing [Abstract] [Full Text]; Zhao, Zhi-Qing [Abstract] [Full Text]; Ziemer, Gerhard [Abstract] [Full Text]