ATS -- Index by Author (60 [2])

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Index by Author: Volume 60, Issue 2 (August 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abdelnoor, Michel [Abstract]; Abe, Toshio [Abstract]; Aiello, Marco L.; Akins, Cary W. [Abstract]; Al-Fagih, Mohammed R. [Abstract]; Aldrich, Francois [Abstract]; Alfieri, Ottavio [Abstract]; Aliprandi, Giovanni [Abstract]; Åm Holen, Einfrid [Abstract]; Anderson, Timothy M. [Abstract]; Andrus, Charles H. [Abstract]; Asakura, Teiji [Abstract]; Atsumi, Naotaka [Abstract]; Aufiero, Thomas X. [Abstract]
B: Basta, Lofty L. [Abstract]; Bavaria, Joseph E. [Abstract]; Benatar, Avram A.; Bennink, Ger B.W.E.; Bernard, Sheilah [Abstract]; Bittner, Hartmuth B. [Abstract]; Black, Michael D. [Abstract]; Boeckxstaens, Christiane J. [Abstract]; Brann, Stacey [Abstract]; Braun, Richard A. [Abstract]; Brawn, William J. [Abstract]; Brosstad, Frank [Abstract]; Brown, James M.; Bucari, Santé [Abstract]; Buchmiller, Terry L. [Abstract]; Bukhari, Emad A. [Abstract]; Burns, Paul G. [Abstract]; Burt, Michael E. [Abstract]
C: Cabrera Fischer, Edmundo I. [Abstract]; Cambria, Richard P. [Abstract]; Campbell, David N.; Canvasser, David A. [Abstract]; Carpenter, Jeffrey P. [Abstract]; Carpentier, Alain F. [Abstract]; Carrier, Michel [Abstract]; Chachques, Juan-Carlos [Abstract]; Chagpar, Anees [Abstract]; Chen, Edward P. [Abstract]; Christen, Alejandra I. [Abstract]; Cohn, Lawrence H. [Abstract]; Coletti, Giuseppe [Abstract]; Collard, Jean-Marie [Abstract]; Conant, Patricia [Abstract]; Conlan, A. Alan; Cordeiro, Celso O. [Abstract]; Couraud, Louis [Abstract]; Couto, Wilson J. [Abstract]; Crawford, Fred A., Jr [Abstract]; Crawford, Fred A., Jr. [Abstract]
D: d'Udekem, Yves [Abstract]; da Silva, Samuel S. [Abstract]; Daenen, Wim J. [Abstract]; Daggett, Willard M. [Abstract]; Davis, Michael [Abstract]; Davis, Robert D. [Abstract]; de Aquino, Walace K. [Abstract]; de Groot, Mark [Abstract]; de Leval, Marc R. [Abstract]; De Vol, Edward [Abstract]; Deanfield, John E. [Abstract]; Deitrick, John E. [Abstract]; Delaney, David J. [Abstract]; Delius, Ralph E. [Abstract]; Della Valle, Antonio [Abstract]; Dervanian, Patrice [Abstract]; Despotis, George J. [Abstract]; Devoe, Kim [Abstract]; Dietl, Charles A. [Abstract]; Duran, Carlos M.G. [Abstract]
E: Economopoulos, George; Evora, Paulo R.B. [Abstract]
F: Faes, Farid C. [Abstract]; Faulk, Elizabeth A. [Abstract]; Fell, Stanley C.; Ferguson, T. Bruce, Jr [Abstract]; Ferraro, Pasquale [Abstract]; Flameng, Willem J. [Abstract]; Flameng, Willem J. [Abstract]; Folliguet, Thierry A. [Abstract]; Frist, William H. [Abstract]; Fukuda, Hirotsugu [Abstract]; Fulletton, David A.
G: Gaffney, Michelle [Abstract]; Gardner, Timothy J. [Abstract]; Gaudette, Glenn R. [Abstract]; Gazzoli, Fabrizio; Glotzer, John M.; Goldman, Allan P. [Abstract]; Goldstraw, Peter; Gonzalez-Lavin, Lorenzo [Abstract]; Goodnough, Lawrence T. [Abstract]; Graf, Debra [Abstract]; Graham, Thomas P., Jr [Abstract]; Grande, Antonino M.; Gregori, Francisco, Jr [Abstract]; Grillo, Hermes C. [Abstract]; Grinda, Jean-Michel [Abstract]; Grover, Frederick L.; Gunning, Alfred J. [Abstract]
H: Haas, Gary S. [Abstract]; Hadlow, Narelle C. [Abstract]; Hakimi, Mehdi [Abstract]; Hall, R. Alan [Abstract]; Hamilton, Stuart [Abstract]; Hartz, Arthur J. [Abstract]; Heltzer, James M. [Abstract]; Higano, Stuart T. [Abstract]; Hilgenberg, Alan D. [Abstract]; Hilgenberg, Alan D. [Abstract]; Hochwald, Steven N. [Abstract]; Hogue, Charles W., Jr [Abstract]; Horton, William C. [Abstract]; Hughes, Carolyn E. [Abstract]
I: Ichikawa, Hajime [Abstract]; Istad, Reidar [Abstract]; Itoh, Toshiaki [Abstract]
J: Jacquet, Luc [Abstract]; Jaggers, James; Janeira, Louis F. [Abstract]; Jikuya, Tomoaki [Abstract]; John, Lindsay C.H.; Johnson, W. Dudley [Abstract]; Jones, Stephen D.; Jougon, Jacques B. [Abstract]
K: Karmy-Jones, Riyad [Abstract]; Kayser, Kenneth L. [Abstract]; Kellovsky, Pavel [Abstract]; Kendall, Simon W.H. [Abstract]; Kessler, Randolph M. [Abstract]; Kestens, Paul-Jacques [Abstract]; Key, Steven P. [Abstract]; Khankhanian, Nayereh [Abstract]; Klein, Michael D. [Abstract]; Krasna, Mark J. [Abstract]; Krukenkamp, Irvin B. [Abstract]; Krukenkamp, Irvin B. [Abstract]; Kuhn, Evelyn M. [Abstract]; Kumar, Naresh [Abstract]; Kurkchubasche, Arlet G. [Abstract]
L: Lamb, Robert K. [Abstract]; Lazar, Harold L. [Abstract]; Levitsky, Sidney [Abstract]; Levitsky, Sidney [Abstract]; Lewis, Christopher T.; Lorenz, Christine H. [Abstract]; Lorusso, Roberto [Abstract]; Loyd, James E. [Abstract]; Lyons, Juanita M. [Abstract]
M: Macé, Loïc [Abstract]; Macrae, Duncan J. [Abstract]; Magee, Patrick G.; Malaise, Jacques [Abstract]; Matar, Fadi A. [Abstract]; Mathisen, Douglas J. [Abstract]; Matsuda, Hikaru [Abstract]; Matsushita, Shounosuke [Abstract]; McCully, James D. [Abstract]; McEnany, M. Terry [Abstract]; McGrath, Lynn B. [Abstract]; McGregor, Christopher G.A. [Abstract]; McKeown, Peter P. [Abstract]; McKneally, Martin F.; McKneally, Martin F.; McLaughlin, Joseph S. [Abstract]; Mehta, Sanjay M. [Abstract]; Merrill, Walter H. [Abstract]; Metras, Dominique; Meyns, Bart P. [Abstract]; Miller, Cynthia A. [Abstract]; Miller, Joseph I., Jr [Abstract]; Minzioni, Gaetano; Mitsui, Toshio [Abstract]; Moncure, Ashby C. [Abstract]; Moncure, Ashby C. [Abstract]; Morita, Shin [Abstract]; Mountain, Clifton F. [Abstract]; Mulder, David S.; Murase, Mitsuya [Abstract]
N: Naunheim, Keith S. [Abstract]; Nechar, Antonio, Jr [Abstract]; Nesbitt, Jonathan C. [Abstract]; Neveux, Jean-Yves [Abstract]; Nimi, Takao [Abstract]; Nishimura, Rick A. [Abstract]
O: Ogawa, Yutaka [Abstract]; Ohashi, Takeki [Abstract]; Okamoto, Hiroshi [Abstract]; Otte, Jean-Bernard [Abstract]; Øvrum, Eivind [Abstract]; Øystese, Rolf [Abstract]
P: Pae, Walter E., Jr [Abstract]; Pagana, Timothy J. [Abstract]; Parker, Robert [Abstract]; Pearlstein, Daryl P. [Abstract]; Pearson, Paul J. [Abstract]; Pelletier, Guy B. [Abstract]; Pelletier, L. Conrad [Abstract]; Pierce, William S. [Abstract]; Pirk, Jan [Abstract]; Ponlot, Robert [Abstract]; Port, Jeffrey L. [Abstract]; Prabhakar, Ganga [Abstract]; Puleo, John A. [Abstract]; Putnam, Joe B., Jr [Abstract]
R: Raafat, Faro [Abstract]; Reed, Carolyn E.; Reines, H. David [Abstract]; Rice, Michael D. [Abstract]; Ringdal, Mari-Anne L. [Abstract]; Risk, Marcelo R. [Abstract]; Rivers, Samuel [Abstract]; Romagnoli, Renato [Abstract]; Roth, Jack A. [Abstract]; Rubay, Jean E. [Abstract]
S: Saad, Elias [Abstract]; Sakakibara, Yuzuru [Abstract]; Salmon, Anthony P. [Abstract]; Sawa, Yoshiki [Abstract]; Sawazaki, Masaru [Abstract]; Schaff, Hartzell V. [Abstract]; Schulman, Joshua J. [Abstract]; Sergeant, Paul T. [Abstract]; Shemin, Richard J. [Abstract]; Shimazaki, Yasuhisa [Abstract]; Shirakura, Ryota [Abstract]; Silen, Mark L. [Abstract]; Slavik, Zdenek [Abstract]; Sluysmans, Thierry [Abstract]; Smith, Rosie; Spinale, Francis G. [Abstract]; Spinale, Francis G. [Abstract]; Sreeram, Narayanswami [Abstract]; Steffenino, Giuseppe [Abstract]; Stewart, James R. [Abstract]; Swanson, Scott J. [Abstract]
T: Talit, Uzi [Abstract]; Tam, Stanley K.C. [Abstract]; Tangen, Geir [Abstract]; Temes, R. Thomas [Abstract]; Terada, Yasushi [Abstract]; Tinton, Nicolas [Abstract]; Torchiana, David F. [Abstract]; Tsukube, Takuro [Abstract]; Tuna, Ishik C. [Abstract]
V: Vallieres, Eric [Abstract]; van de Wal, Henry J.C.M.; van Son, Jacques A.M.; van Son, Jacques A.M. [Abstract]; Van Trigt, Peter, III [Abstract]; Velly, Jean-François [Abstract]; Verhofste, Marnix A. [Abstract]; Viganò, Mario; Vlahakes, Gus J. [Abstract]; von Oppell, Ulrich O. [Abstract]
W: Wain, John C. [Abstract]; Walker, Eloisa S. [Abstract]; Walker, Jennifer D. [Abstract]; Walsh, Garrett L. [Abstract]; Walters, Henry L., III [Abstract]; Wang, Hong-Yue [Abstract]; Webber, Steven A. [Abstract]; Wernly, Jorge A. [Abstract]; West, John C. [Abstract]; White, Michel [Abstract]; Whitesides, Thomas E. [Abstract]; Whittlesey, Grant C. [Abstract]; Wong, Rose S. [Abstract]; Woo, Y. Joseph [Abstract]; Wood, Alan J.; Worthington, Michael G. [Abstract]; Wright, Cameron D. [Abstract]
Y: Yasuura, Kenzo [Abstract]
Z: Zhang, X. [Abstract]