ATS -- Index by Author (59 [6])

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Index by Author: Volume 59, Issue 6 (June 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Akhter, Mohammed [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Amundsen, Susan M. [Abstract] [Full Text]; Anderson, Mark B. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Timothy M. [Abstract] [Full Text]; Ando, Akio [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Aoki, Mitsuru [Abstract] [Full Text]; Arabia, Francisco A. [Abstract] [Full Text]; Attar, Safuh [Abstract] [Full Text]
B: Babatasi, Gerard [Abstract] [Full Text]; Banerjee, Amit [Full Text]; Baron, Olivier [Abstract] [Full Text]; Barron, David J. [Abstract] [Full Text]; Bavinck, Johannus H. [Abstract] [Full Text]; Becker, Anton E. [Abstract] [Full Text]; Belboul, Ali [Abstract] [Full Text]; Bennett, Mark K. [Abstract] [Full Text]; Bernstein, Daniel [Abstract] [Full Text]; Berreklouw, Eric [Abstract] [Full Text]; Berry, Gerald J. [Abstract] [Full Text]; Bhoyroo, Satar [Abstract] [Full Text]; Bonow, Robert O. [Full Text]; Brawn, William J. [Abstract] [Full Text]; Bredée, Johan J. [Abstract] [Full Text]; Broniec, Ruth [Abstract] [Full Text]; Brown, Michael R. [Abstract] [Full Text]; Buffington, Charles W. [Abstract] [Full Text]; Bufkin, Bradley L. [Abstract] [Full Text]; Burch, Michael [Abstract] [Full Text]
C: Caes, Frank L. [Abstract] [Full Text]; Cerfolio, Robert J. [Abstract] [Full Text]; Cheeran, David [Abstract] [Full Text]; Chin, Clifford [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Abstract] [Full Text]; Clark, Richard E. [Abstract] [Full Text]; Coenye, Kenneth E. [Abstract] [Full Text]; Cohn, William E. [Abstract] [Full Text]; Coles, John G. [Full Text]; Commeau, Philippe [Abstract] [Full Text]; Connery, Cliff P. [Abstract] [Full Text]; Conyers, Robert A. J. [Abstract] [Full Text]; Cooper, David K. C. [Full Text]; Copeland, Jack G. [Abstract] [Full Text]; Corris, Paul A. [Abstract] [Full Text]; Coto, Jorge A. [Abstract] [Full Text]; Cramer, Stewart F. [Abstract] [Full Text]; Craver, Joseph M. [Abstract] [Full Text]
D: Dang, Collin R. [Abstract] [Full Text]; Dark, John H. [Abstract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; de Bock, Marcel [Abstract] [Full Text]; De Giovanni, Joseph V. [Abstract] [Full Text]; Deal, Cedric W. [Abstract] [Full Text]; Deanfield, John E. [Abstract] [Full Text]; Dernevik, Leif [Abstract] [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Despins, Philippe [Abstract] [Full Text]; Dollery, Claire [Abstract] [Full Text]; Downey, Francis X. [Abstract] [Full Text]; Duveau, Daniel [Abstract] [Full Text]
E: Edis, Brian D. [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Ellis, F. Henry, Jr [Abstract] [Full Text]; Embrey, Richard P. [Abstract] [Full Text]; Ercan, Hüsamettin [Abstract] [Full Text]; Everts, Peter A. M. [Abstract] [Full Text]
F: Ferson, Peter F. [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Floten, H. Storm [Abstract] [Full Text]; Freedman, John [Abstract] [Full Text]; Frohlich, Edward D. [Abstract] [Full Text]
G: Galvin, Jeffrey R. [Abstract] [Full Text]; Gately, Hugh L. [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Gerard, Jean-Louis [Abstract] [Full Text]; Gibb, S. Peter [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Guererro, Rafael [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Hankins, John R. [Abstract] [Full Text]; Harmoinen, Aimo [Abstract] [Full Text]; Hasaniya, Nahidh W. M. A. [Abstract] [Full Text]; Heatley, Gerald M. [Abstract] [Full Text]; Hoffmann, Johannes J. [Abstract] [Full Text]; Hornstein, Adriana [Abstract] [Full Text]; Horowitz, Marc [Abstract] [Full Text]; Hoshino, Shuichi [Abstract] [Full Text]
I: Iannettoni, Mark D. [Abstract] [Full Text]; Ikeda, Shuhei [Abstract] [Full Text]; Ikezawa, Teruo [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Inaba, Hirotaka [Full Text]; Ishihara, Kazuaki [Abstract] [Full Text]; Iwatsuka, Yasushi [Abstract] [Full Text]
J: Jackson, Mark [Abstract] [Full Text]; Jagtap, Ranjit [Abstract] [Full Text]; Jahnke, Andres W. [Abstract] [Full Text]; Jamali, Iyad N. [Abstract] [Full Text]; Jamieson, Morgan P. G. [Abstract] [Full Text]; Jamieson, Stuart W. [Abstract] [Full Text]; Johnson, Robert G. [Abstract] [Full Text]; Jones, Ellis L. [Abstract] [Full Text]
K: Kaiser, George C. [Full Text]; Kamiya, Tetsuro [Abstract] [Full Text]; Kapadia, Nandikishore [Abstract] [Full Text]; Kapelanski, David P. [Abstract] [Full Text]; Karl, Tom R. [Abstract] [Full Text]; Katsura, Atsushi [Full Text]; Katsuyama, Kazuhiko [Full Text]; Katsuyama, Kazuhiko [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Khanna, Sudershan K. [Full Text]; Khayat, André [Abstract] [Full Text]; Kimmel, Wendy A. [Abstract] [Full Text]; Kimura, Atsushi [Abstract] [Full Text]; Kirsh, Marvin M. [Abstract] [Full Text]; Koldewijn, Evert L. [Abstract] [Full Text]; Kraatz, Ernst G. [Abstract] [Full Text]; Krasna, Mark J. [Abstract] [Full Text]; Kress, David C. [Abstract] [Full Text]; Kriett, Jolene M. [Abstract] [Full Text]; Kuntz, Richard E. [Abstract] [Full Text]
L: La Hei, Erik R. [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Langley, Lesley [Abstract] [Full Text]; Larson, Göran [Abstract] [Full Text]; Leyh, Rainer G. [Abstract] [Full Text]; Lick, Scott D. [Abstract] [Full Text]; Link, Kerry M. [Full Text]; Liu, Bo [Full Text]; Liu, Bo [Abstract] [Full Text]; Livesey, Steven A. [Abstract] [Full Text]; Lust, Robert M. [Abstract] [Full Text]; Lytle, Bruce W. [Full Text]
M: MacArthur, Kenneth J. D. [Abstract] [Full Text]; Machii, Masato [Abstract] [Full Text]; Magara, Tatsuo [Full Text]; Martin, Randolph P. [Abstract] [Full Text]; Martin, Tomas D. [Abstract] [Full Text]; Massetti, Massimo [Abstract] [Full Text]; Matsuno, Shuichi [Abstract] [Full Text]; Mazer, C. David [Abstract] [Full Text]; McClure, Linda L. [Abstract] [Full Text]; McFadden, P. Michael [Abstract] [Full Text]; McKay, Charles R. [Abstract] [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; Metsä-Ketelä, Timo [Abstract] [Full Text]; Michaud, Jean-Luc [Abstract] [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Miller, Joseph I., Jr [Abstract] [Full Text]; Missault, Luc H. [Abstract] [Full Text]; Miyairi, Takeshi [Full Text]; Mizuno, Akira [Full Text]; Mori, Atsumi [Abstract] [Full Text]; Moriura, Shigeaki [Abstract] [Full Text]
N: Nadolny, Edward [Abstract] [Full Text]; Naiki, Kenichi [Abstract] [Full Text]; Nakajima, Yasuhiko [Abstract] [Full Text]; Nayak, Vijaya M. [Full Text]; Neri, Eugenio [Abstract] [Full Text]; Niinami, Hiroshi [Abstract] [Full Text]; Nishikawa, Tadao [Full Text]; Nojima, Takehisa [Full Text]; Nojima, Takehisa [Abstract] [Full Text]; Nordback, Isto [Abstract] [Full Text]; Norton, Terry O. [Abstract] [Full Text]
O: O'Brien, Mark F. [Full Text]; Ochsner, John L. [Abstract] [Full Text]; Onoe, Masahiko [Abstract] [Full Text]; Ophuis, Ton Oude [Abstract] [Full Text]; Orringer, Mark B. [Abstract] [Full Text]; Orringer, Mark B. [Full Text]; Otaki, Masaki [Abstract] [Full Text]
P: Paajanen, Hannu [Abstract] [Full Text]; Pairolero, Peter C. [Abstract] [Full Text]; Paradis, Irvin L. [Abstract] [Full Text]; Pass, Harvey I. [Abstract] [Full Text]; Pathi, Vivek [Abstract] [Full Text]; Pawade, Ash [Abstract] [Full Text]; Pisarenko, Oleg I. [Abstract] [Full Text]; Pollock, James C. S. [Abstract] [Full Text]; Prenger, Kees B. [Abstract] [Full Text]; Pridjian, Ara K. [Abstract] [Full Text]
R: Rådberg, L. O. Göran [Abstract] [Full Text]; Ranucci, Marco [Full Text]; Reddy, D. Damodar [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Richards, Stephen M. [Abstract] [Full Text]; Richards, Stephen M. [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Roberts, Donald [Abstract] [Full Text]; Roberts, Donald [Full Text]; Robicsek, Francis [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robotin, Monica C. [Abstract] [Full Text]; Rock, David T. [Abstract] [Full Text]; Rosado, Luis J. [Abstract] [Full Text]; Rosenfeldt, Franklin L. [Abstract] [Full Text]; Rosenfeldt, Franklin L. [Full Text]; Rossi, Antoine [Abstract] [Full Text]; Rothfield, Kenneth P. [Abstract] [Full Text]
S: Sawatari, Kazuo [Abstract] [Full Text]; Schmahl, Terence M. [Abstract] [Full Text]; Schönberger, Jacques P. A. M. [Abstract] [Full Text]; Schönberger, Jacques P. A. M. [Abstract] [Full Text]; Seaworth, Barbara J. [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Sethi, Gulshan K. [Abstract] [Full Text]; Sethia, Babulal [Abstract] [Full Text]; Shah, Aamir S. [Abstract] [Full Text]; Shah, Vipul B. [Abstract] [Full Text]; Shanewise, Jack S. [Abstract] [Full Text]; Shen, Yannan [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Sievers, Hans-H. [Abstract] [Full Text]; Silove, Eric D. [Abstract] [Full Text]; Singer, Raymond L. [Abstract] [Full Text]; Sirois, Cheryl [Abstract] [Full Text]; Sisto, Tero [Abstract] [Full Text]; Sonett, Joshua R. [Abstract] [Full Text]; Spence, Paul A. [Abstract] [Full Text]; Sreeram, Narayanswami [Abstract] [Full Text]; Stark, Jaroslav [Full Text]; Steinberg, Seth M. [Abstract] [Full Text]; Streitz, John M., Jr [Abstract] [Full Text]; Stümper, Oliver F. W. [Abstract] [Full Text]; Sugita, Takaaki [Full Text]; Sugita, Takaaki [Abstract] [Full Text]; Sullivan, Ian D. [Abstract] [Full Text]; Sun, Jianping [Abstract] [Full Text]; Sun, You Su [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]
T: Tabata, Ryoko [Abstract] [Full Text]; Tanaka, Keita [Full Text]; Tarazi, Riyad [Abstract] [Full Text]; Tarkka, Matti [Abstract] [Full Text]; Tchervenkov, Christo I. [Full Text]; Tector, Alfred J. [Abstract] [Full Text]; Temeck, Barbara K. [Abstract] [Full Text]; Tengborn, Lilian [Abstract] [Full Text]; Thubrikar, Mano J. [Abstract] [Full Text]; Thurer, Robert L. [Abstract] [Full Text]; Trastek, Victor F. [Abstract] [Full Text]; Treasure, Robert L. [Abstract] [Full Text]; Turney, Stephen Z. [Abstract] [Full Text]
U: Uemura, Hideki [Abstract] [Full Text]; Umemori, Yoshiki [Abstract] [Full Text]; Uno, Koji [Abstract] [Full Text]
V: Van Belleghem, Yves V. [Abstract] [Full Text]; van Dantzig, Jan-Melle [Abstract] [Full Text]; van der Linden, Frits [Abstract] [Full Text]; van der Tweel, Ingeborg [Abstract] [Full Text]; Van Nooten, Guido J. [Abstract] [Full Text]; VanMeter, Clifford H. [Abstract] [Full Text]; Verwaal, Victor J. [Abstract] [Full Text]; Victor, Solomon [Full Text]
W: Waller, David A. [Abstract] [Full Text]; Watarida, Shoji [Abstract] [Full Text]; Watkins, James F. [Abstract] [Full Text]; Weintraub, Robert G. [Abstract] [Full Text]; Weintraub, Ronald M. [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Wexler, Leonard H. [Abstract] [Full Text]; Wiechmann, Robert J. [Abstract] [Full Text]; Wilcox, Benson R. [Abstract] [Full Text]; Wright, John G. C. [Abstract] [Full Text]
Y: Yagihara, Toshikatsu [Abstract] [Full Text]; Yamamoto, Rie [Abstract] [Full Text]; Yamashita, Katsushi [Abstract] [Full Text]; Yasuda, Ryuzabro [Full Text]; Yun, Kwok L. [Abstract] [Full Text]
Z: Zenati, Marco [Abstract] [Full Text]