ATS -- Index by Author (59 [5])

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Index by Author: Volume 59, Issue 5 (May 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Åberg, Torkel [Abstract] [Full Text]; Acuff, Tea E. [Abstract] [Full Text]; Akhter, Mohammed [Full Text]; Akimoto, Takehide [Abstract] [Full Text]; Akimoto, Takehide [Abstract] [Full Text]; Alamanni, Francesco [Abstract] [Full Text]; Albes, Johannes M. [Abstract] [Full Text]; Allen, Hugh D. [Abstract] [Full Text]; Alwan, Kifah [Abstract] [Full Text]; Amodeo, Antonio [Abstract] [Full Text]; Angelini, Gianni D. [Full Text]; Aomi, Shigeyuki [Abstract] [Full Text]; Aomi, Shigeyuki [Abstract] [Full Text]; Aprahamian, Charles [Abstract] [Full Text]; Asimacopoulos, Panayiotis J. [Abstract] [Full Text]
B: Bain, Hugh H. [Abstract] [Full Text]; Baker, Andrew J. [Abstract] [Full Text]; Banerjee, Amit [Full Text]; Barner, Hendrick B. [Abstract] [Full Text]; Bartoli, Stefano [Abstract] [Full Text]; Bartorelli, Antonio L. [Abstract] [Full Text]; Baue, Arthur E. [Abstract] [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Ben-Yishay, Ari [Abstract] [Full Text]; Benaroia, Mark [Abstract] [Full Text]; Blauth, Christopher I. [Abstract] [Full Text]; Blumenthal, James A. [Abstract] [Full Text]; Blumenthal, James A. [Full Text]; Blumenthal, James A. [Abstract] [Full Text]; Bourge, Robert C. [Abstract] [Full Text]; Brink, Charles [Abstract] [Full Text]; Brodman, Richard F. [Full Text]; Brown, William R. [Abstract] [Full Text]; Buche, Michel [Abstract] [Full Text]; Buchman, Timothy G. [Abstract] [Full Text]
C: Carotti, Adriano [Abstract] [Full Text]; Catanese, Katharine A. [Abstract] [Full Text]; Ccp, [Abstract] [Full Text]; Challa, Venkata R. [Abstract] [Full Text]; Chambers, David J. [Abstract] [Full Text]; Chang, Frederic C. [Abstract] [Full Text]; Chen, Jonathan M. [Abstract] [Full Text]; Chen, Ray Huang-Tsang [Abstract] [Full Text]; Chikugo, Fumio [Abstract] [Full Text]; Chocron, Sidney [Abstract] [Full Text]; Chua, Yeow L. [Abstract] [Full Text]; Clement, François [Abstract] [Full Text]; Cohen, Daniel M. [Abstract] [Full Text]; Collard, Edith [Abstract] [Full Text]; Cooley, Denton A. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cordier, Anne [Abstract] [Full Text]; Cousins, Claire [Abstract] [Full Text]; Croughwell, Narda D. [Abstract] [Full Text]; Croughwell, Narda D. [Abstract] [Full Text]
D: Dacumos, Guillermo C. [Abstract] [Full Text]; Dagenais, François [Abstract] [Full Text]; Damiano, Ralph J., Jr [Abstract] [Full Text]; David, Tirone E. [Full Text]; Davis, J. Terrance [Abstract] [Full Text]; Davis, R. Duane, Jr [Abstract] [Full Text]; de Chaumaray, Thierry du Roy [Abstract] [Full Text]; de Montpreville, Vincent [Abstract] [Full Text]; De Simone, Raffaele [Full Text]; Deiraniya, Abdul K. [Abstract] [Full Text]; Demertzis, Stefanos [Abstract] [Full Text]; DeRosa, Carolyn M. [Abstract] [Full Text]; Déry, Renée [Abstract] [Full Text]; Discigil, Berent [Abstract] [Full Text]; Doyle, Shannon E. [Abstract] [Full Text]; Dresler, Carolyn M. [Abstract] [Full Text]; Düber, Christoph [Full Text]; Duff, Diana S. [Abstract] [Full Text]
E: Ebels, Tjark [Abstract] [Full Text]; Egan, Jim [Abstract] [Full Text]; Ellenbogen, Kenneth A. [Abstract] [Full Text]; Etievent, Joseph-Philippe [Abstract] [Full Text]; Eucher, Philippe M. [Abstract] [Full Text]; Evora, Paulo R. B. [Abstract] [Full Text]
F: Felver, Kirt [Abstract] [Full Text]; Fields, Barry L. [Abstract] [Full Text]; Fiore, Andrew C. [Abstract] [Full Text]; Folbergrová, Jaroslava [Abstract] [Full Text]; Fremes, Stephen E. [Abstract] [Full Text]; Fukai, Ichirou [Abstract] [Full Text]; Fukumura, Yoshiaki [Abstract] [Full Text]; Furnary, Anthony P. [Abstract] [Full Text]; Furukawa, Robert D. [Abstract] [Full Text]
G: Gately, Hugh L. [Abstract] [Full Text]; Giamberti, Alessandro [Abstract] [Full Text]; Giannico, Salvatore [Abstract] [Full Text]; Glower, Donald D. [Abstract] [Full Text]; Goldstein, Daniel J. [Abstract] [Full Text]; Gonzalez, Manuel [Abstract] [Full Text]; Gopinath, Shankar P. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]
H: Hagl, Siegfried [Full Text]; Hake, Ulrich [Full Text]; Hamilton, J. R. Leslie [Abstract] [Full Text]; Han, Sung Koo [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Harris, Paul [Abstract] [Full Text]; Harrison, Michael J. G. [Abstract] [Full Text]; Hashimoto, Akimasa [Abstract] [Full Text]; Hashimoto, Akimasa [Abstract] [Full Text]; Hausen, Bernard [Abstract] [Full Text]; Hawkins, John A. [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Hervé, Philippe [Abstract] [Full Text]; Herzog, Tina M. [Abstract] [Full Text]; Hess, Kenneth R. [Abstract] [Full Text]; Hilker, Michael [Full Text]; Holman, William L. [Abstract] [Full Text]; Hori, Takaki [Abstract] [Full Text]; Hornick, Philip I. [Abstract] [Full Text]; Hunter, Steven M. [Full Text]
I: Ichihara, Toshihiko [Abstract] [Full Text]; Iliopoulos, Dimitrios C. [Abstract] [Full Text]; Iliopoulos, Dimitrios C. [Abstract] [Full Text]; Ingemansson, Richard [Abstract] [Full Text]; Iorio, Fiore S. [Abstract] [Full Text]; Itoh, Toshiaki [Abstract] [Full Text]; Iyer, Sriram S. [Abstract] [Full Text]
J: Jamart, Jacques [Abstract] [Full Text]; Jones, Christopher R. [Abstract] [Full Text]; Jones, T. Hugh [Full Text]; Jun, Tae Gook [Abstract] [Full Text]
K: Kaiser, George C. [Abstract] [Full Text]; Kaiser, George C. [Full Text]; Kaminishi, Yuichiro [Full Text]; Kantelip, Jean-Pierre [Abstract] [Full Text]; Katoh, Itsuo [Abstract] [Full Text]; Katsura, Ken-ichiro [Abstract] [Full Text]; Kaul, Tej K. [Abstract] [Full Text]; Kennedy, Peter [Abstract] [Full Text]; Keogh, Bruce E. [Abstract] [Full Text]; Kesler, Kenneth A. [Abstract] [Full Text]; Khanna, Sudarshan K. [Full Text]; Kim, Han [Abstract] [Full Text]; Kim, Joo Hyun [Abstract] [Full Text]; Kim, Young Whan [Abstract] [Full Text]; Kiriyama, Masanobu [Abstract] [Full Text]; Kirklin, James K. [Abstract] [Full Text]; Kitagawa, Tetsuya [Abstract] [Full Text]; Kitamura, Masaya [Abstract] [Full Text]; Kitamura, Masaya [Abstract] [Full Text]; Kobayashi, Yoshihiro [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]; Koyanagi, Hitoshi [Abstract] [Full Text]
L: Labat, Carlos [Abstract] [Full Text]; Lange, Rüdiger [Full Text]; Langley, Stephen [Full Text]; Lapointe, Réal [Abstract] [Full Text]; Large, Stephen R. [Full Text]; Lawton, Jennifer S. [Abstract] [Full Text]; Legault, Claudine [Abstract] [Full Text]; Leveque, Christopher M. [Abstract] [Full Text]; Levin, Howard R. [Abstract] [Full Text]; Li, Ren-Ke [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Loef, Bert G. [Abstract] [Full Text]; Longaker, Michael T. [Abstract] [Full Text]; Lorenz, H. Peter [Abstract] [Full Text]; Louagie, Yves A. G. [Abstract] [Full Text]; Lowry, Edward [Abstract] [Full Text]
M: Mack, Michael J. [Abstract] [Full Text]; Madden, David J. [Abstract] [Full Text]; Mahanna, Elizabeth P. [Abstract] [Full Text]; Mahanna, Elizabeth P. [Abstract] [Full Text]; Marcelletti, Carlo [Abstract] [Full Text]; Marchandise, Baudouin [Abstract] [Full Text]; Masaoka, Akira [Abstract] [Full Text]; Maseki, Takashi [Abstract] [Full Text]; Massa, Giorgio [Abstract] [Full Text]; Matsuoka, Suguru [Abstract] [Full Text]; Matsuura, Akio [Abstract] [Full Text]; Mazer, C. David [Abstract] [Full Text]; Mazmanian, Guy-Michel [Abstract] [Full Text]; McAfee, Paul C. [Abstract] [Full Text]; McGiffin, David C. [Abstract] [Full Text]; Menasché, Philippe [Abstract] [Full Text]; Merrick, Scot H. [Abstract] [Full Text]; Mickle, Donald A. G. [Abstract] [Full Text]; Miles, Catherine M. [Abstract] [Full Text]; Mills, Stephen A. [Abstract] [Full Text]; Mitsui, Toshio [Full Text]; Miyahara, Ken [Abstract] [Full Text]; Moody, Dixon M. [Abstract] [Full Text]; Mori, Kazuhiro [Abstract] [Full Text]; Moroney, Debra A. [Abstract] [Full Text]; Moulton, Anthony L. [Full Text]; Mügge, Andreas [Abstract] [Full Text]; Mullen, John C. [Abstract] [Full Text]; Murase, Mitsuya [Abstract] [Full Text]; Murkin, John M. [Abstract] [Full Text]; Murkin, John M. [Full Text]; Murkin, John M. [Full Text]
N: Naser, Basem [Abstract] [Full Text]; Nassif, Edgard [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Newman, Mark F. [Abstract] [Full Text]; Newman, Stanton P. [Abstract] [Full Text]; Newman, Stanton P. [Full Text]; Niwa, Hiroshi [Abstract] [Full Text]; Nørgaard, Martin [Abstract] [Full Text]
O: Oelert, Hellmut [Full Text]; Olsen, Peter Skov [Abstract] [Full Text]; Ott, Mark J. [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pahlmark, Kerstin [Abstract] [Full Text]; Paramesh, Venki [Abstract] [Full Text]; Parry, Andrew J. [Abstract] [Full Text]; Parry, Andrew J. [Full Text]; Parums, Dinah [Abstract] [Full Text]; Patel, Ramesh L. [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Pearson, Paul J. [Abstract] [Full Text]; Perko, Mario J. [Abstract] [Full Text]; Petrossian, Edwin [Full Text]; Petruska, Paul J. [Abstract] [Full Text]; Pettersson, Gösta [Abstract] [Full Text]; Picardo, Sergio [Abstract] [Full Text]; Picetti, George [Abstract] [Full Text]; Pillai, Ravi [Abstract] [Full Text]; Planché, Claude [Abstract] [Full Text]; Pompilio, Giulio [Abstract] [Full Text]; Powers, Jean D. [Abstract] [Full Text]; Price, Alun [Full Text]
R: Rahman, Ali N. [Abstract] [Full Text]; Rainer, W. Gerald [Full Text]; Rajasinghe, Hiranya A. [Abstract] [Full Text]; Raskin, Steven A. [Abstract] [Full Text]; Ravagnani, Paolo [Abstract] [Full Text]; Reboussin, David M. [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Reed, William J. [Abstract] [Full Text]; Regan, John J. [Abstract] [Full Text]; Reul, George J. [Abstract] [Full Text]; Reves, Joseph G. [Abstract] [Full Text]; Rho, Joon Ryang [Abstract] [Full Text]; Riggins, Shefton L. [Abstract] [Full Text]; Ritter, Jon H. [Abstract] [Full Text]; Rohde, Roland [Abstract] [Full Text]; Rona, Paolo [Abstract] [Full Text]; Roper, Charles L. [Abstract] [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Roy, Tapan S. [Abstract] [Full Text]; Roye, G. Dean [Abstract] [Full Text]; Rumisek, John D. [Abstract] [Full Text]; Rummell, H. Mary [Abstract] [Full Text]
S: Safi, Hazim J. [Abstract] [Full Text]; Safi, Hazim J. [Abstract] [Full Text]; Sala, Andrea [Abstract] [Full Text]; Salati, Maurizio [Full Text]; Santoli, Carmine [Full Text]; Schäfers, Hans-Joachim [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Scheinman, Melvin M. [Abstract] [Full Text]; Schipman, Nicole [Abstract] [Full Text]; Schipper, Shirley A. [Abstract] [Full Text]; Schlueter, Jean M. [Abstract] [Full Text]; Schoevaerdts, Didier [Abstract] [Full Text]; Schoevaerdts, Jean-Claude [Abstract] [Full Text]; Schroeder, Torben V. [Abstract] [Full Text]; Scrofani, Roberto [Full Text]; Seccombe, John F. [Abstract] [Full Text]; Seldomridge, J. Alex [Abstract] [Full Text]; Seo, Jeong Wook [Abstract] [Full Text]; Serraf, Alain [Abstract] [Full Text]; Sett, Suvro S. [Abstract] [Full Text]; Shaibani, Aziz T. [Abstract] [Full Text]; Sharp, Thomas G. [Abstract] [Full Text]; Shim, Young Soo [Abstract] [Full Text]; Siesjö, Bo K. [Abstract] [Full Text]; Siesjö, Peter [Abstract] [Full Text]; Silen, Mark L. [Abstract] [Full Text]; Sjöberg, Trygve [Abstract] [Full Text]; Slooff, Maarten J. H. [Abstract] [Full Text]; Smith, Craig R. [Abstract] [Full Text]; Smith, Lloyd R. [Abstract] [Full Text]; Smith, Peter L. C. [Full Text]; Sotaniemi, Kyösti A. [Abstract] [Full Text]; Spillane, William [Abstract] [Full Text]; Spratt, John A. [Abstract] [Full Text]; Squitieri, Cosimo [Abstract] [Full Text]; Stambler, Bruce S. [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Steen, Stig [Abstract] [Full Text]; Stump, David A. [Abstract] [Full Text]; Stump, David A. [Full Text]; Stump, David A. [Abstract] [Full Text]; Sung, Sook Whan [Abstract] [Full Text]; Swartz, Marc T. [Abstract] [Full Text]
T: Taberlet, Christian [Abstract] [Full Text]; Tagusari, Osamu [Abstract] [Full Text]; Tagusari, Osamu [Abstract] [Full Text]; Talsma, Melle D. [Abstract] [Full Text]; Tanzeem, Ahmed [Full Text]; Taylor, Kenneth M. [Abstract] [Full Text]; Teasdale Scott, Sallie J. [Full Text]; Terada, Yasushi [Full Text]; Tolan, Michael J. [Full Text]; Toubin, Gérard [Abstract] [Full Text]; Trusler, George A. [Abstract] [Full Text]; Tumiati, Laura C. [Abstract] [Full Text]; Turley, Kevin [Full Text]; Turner, Steven W. [Abstract] [Full Text]
U: Urschel, Harold C., Jr [Full Text]
V: van der Linden, Jan [Abstract] [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Venn, Graham E. [Abstract] [Full Text]; Victor, Solomon [Full Text]
W: Wagner, Robert B. [Full Text]; Watanabe, Takashi [Abstract] [Full Text]; Waterbolk, Tjalling W. [Abstract] [Full Text]; Weber, Thomas R. [Abstract] [Full Text]; Wechsler, Andrew S. [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; White, William D. [Abstract] [Full Text]; White, William D. [Abstract] [Full Text]; Wick, Mark R. [Abstract] [Full Text]; Wilcox, Benson R. [Full Text]; Wood, Mark A. [Abstract] [Full Text]; Wyatt, David A. [Abstract] [Full Text]; Wyllie, Jonathan P. [Abstract] [Full Text]
Y: Yamakawa, Yosuke [Abstract] [Full Text]; Yasuura, Kenzo [Abstract] [Full Text]; Yawn, David H. [Abstract] [Full Text]; Yonan, Nizar A. [Abstract] [Full Text]; Yoo, Chul Gyu [Abstract] [Full Text]; Yoshimura, Yukihiro [Full Text]
Z: Zhang, Ji [Abstract] [Full Text]; Zhao, Qi [Abstract] [Full Text]