ATS -- Index by Author (59 [2])

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Index by Author: Volume 59, Issue 2 (February 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abanoz, Mustafa [Full Text]; Abe, Yoshinobu [Abstract] [Full Text]; Adebonojo, Samuel A. [Full Text]; Agrifoglio, Marco [Abstract] [Full Text]; Aisner, Seena C [Abstract] [Full Text]; Al-Ebrahim, Khalid [Full Text]; Al-Fadley, Fadel [Abstract] [Full Text]; Al-Halees, Zohair [Abstract] [Full Text]; Al-Halees, Zohair [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir [Abstract] [Full Text]; Allada, Vivek [Abstract] [Full Text]; Allegreto, Michael [Abstract] [Full Text]; Allen, Simon M. [Abstract] [Full Text]; Altés, Albert [Abstract] [Full Text]; Amato, Joseph J. [Abstract] [Full Text]; Anderson, Betty J. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Andou, Akio [Abstract] [Full Text]; Angelillo-Mackinlay, Tomás [Abstract] [Full Text]; Arena, Vincenzo [Abstract] [Full Text]; Armitage, John M. [Abstract] [Full Text]; Armstrong, Victoria M. [Abstract] [Full Text]; Ates, Azman [Full Text]; Atsumi, Naotaka [Abstract] [Full Text]
B: Bagwell, Charles E. [Abstract] [Full Text]; Bailly, Patrick [Abstract] [Full Text]; Barner, Hendrick B. [Abstract] [Full Text]; Barnett, Mark G. [Abstract] [Full Text]; BasoGlu, Ahmet [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bayazit, Kemal [Full Text]; Becker, Ronald M. [Full Text]; Benatar, Avram A. [Full Text]; Bennink, Ger B. W. E. [Full Text]; Bernard, Sheilah [Abstract] [Full Text]; Biagini, Andrea [Abstract] [Full Text]; Biglioli, Paolo [Abstract] [Full Text]; Bonser, Robert S. [Abstract] [Full Text]; Borsh, Judith A. [Abstract] [Full Text]; Bosco, Giovanni [Abstract] [Full Text]; Boylan, Mary J. [Abstract] [Full Text]; Brazzalotto, Isabelle [Abstract] [Full Text]; Brown, A. Hedley [Full Text]; Brown, Robin P. [Abstract] [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Cámara, Maria Lluisa [Abstract] [Full Text]; Cameron, Duke E. [Abstract] [Full Text]; Camilleri, Lionel [Abstract] [Full Text]; Canver, Charles C. [Abstract] [Full Text]; Capuani, Athos [Abstract] [Full Text]; Carey, John A. [Abstract] [Full Text]; Casas, Juan-Ignacio [Abstract] [Full Text]; CerrahoGlu, Mustafa [Full Text]; Ceviz, Münacettin [Full Text]; Chang, Greg [Abstract] [Full Text]; Chaux, Aurelio [Abstract] [Full Text]; Chen, Chang-zhi [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Full Text]; Cho, Peter W. [Abstract] [Full Text]; Cho, Peter W. [Abstract] [Full Text]; Chu, Shu-Hsun [Abstract] [Full Text]; Clark, Richard E. [Full Text]; Cohen, Amram J. [Abstract] [Full Text]; Cooper, Graham J. [Abstract] [Full Text]; Cosgrove, Delos M., III [Abstract] [Full Text]; Crawford, Fred A., Jr [Abstract] [Full Text]; Cuadrado, Angel G. [Abstract] [Full Text]
D: D'Ambra, Michael N. [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; Das, Dipak K. [Abstract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; de Riberolles, Charles [Abstract] [Full Text]; Deaton, David W. [Abstract] [Full Text]; Deleuze, Philippe H. [Abstract] [Full Text]; Denton, Timothy A. [Abstract] [Full Text]; Detterbeck, Frank C. [Abstract] [Full Text]; Di Giammarco, Gabriele [Abstract] [Full Text]; Drant, Stacey [Abstract] [Full Text]; Duran, Carlos M. G. [Abstract] [Full Text]; Duran, Carlos M. G. [Abstract] [Full Text]; Dzavik, Vlad [Abstract] [Full Text]
E: Eijsman, Leon [Abstract] [Full Text]; Eker, Armand [Abstract] [Full Text]; Elkins, Ronald C. [Full Text]; Engelman, Daniel T. [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]
F: Faroqui, Mustafa H. [Abstract] [Full Text]; Ferson, Peter F. [Full Text]; Findlay, J. Max [Abstract] [Full Text]; Finegan, Barry A. [Abstract] [Full Text]; Fiore, Andrew C. [Abstract] [Full Text]; Flack, Joseph E., III [Abstract] [Full Text]; Fleming, William H. [Abstract] [Full Text]; Fontcuberta, Jordi [Abstract] [Full Text]; Fosburg, Richard G. [Full Text]; Foster, Andrew H. [Abstract] [Full Text]; Fraser, Ronald E. [Abstract] [Full Text]; Frazier, O. H. [Abstract] [Full Text]; Fujita, Tsuyoshi [Abstract] [Full Text]; Fukai, Ichiro [Abstract] [Full Text]; Furman, Seymour [Full Text]
G: Galbraith, Timothy A. [Abstract] [Full Text]; Gallo, Ricardo [Abstract] [Full Text]; Gari, Mercè [Abstract] [Full Text]; Garín, Rosa [Abstract] [Full Text]; Gates, Richard N. [Abstract] [Full Text]; Gaudin, Paul B. [Abstract] [Full Text]; Gillinov, A. Marc [Abstract] [Full Text]; Goddard, David B. [Abstract] [Full Text]; Gold, Michael R. [Abstract] [Full Text]; Goldstraw, Peter [Abstract] [Full Text]; Grant, Peter W. [Abstract] [Full Text]; Greene, Michael A. [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grillo, Hermes C. [Full Text]; Guidollet, Jeanine [Abstract] [Full Text]
H: Hamilton, Andrew [Abstract] [Full Text]; Harake, Bilal [Abstract] [Full Text]; Hasegawa, Junichi [Abstract] [Full Text]; Hauptman, Eli [Abstract] [Full Text]; Hawkins, John A. [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Hendry, Paul J. [Abstract] [Full Text]; Hennington, Mark H. [Abstract] [Full Text]; Herskowitz, Ahvie [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hird, R. Barry [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Hovaguimian, Hagop [Abstract] [Full Text]; Hruban, Ralph H. [Abstract] [Full Text]; Hutton, Peter [Abstract] [Full Text]
I: Ichikawa, Hajime [Abstract] [Full Text]; Iervasi, Giorgio [Abstract] [Full Text]; Ikeshita, Masatoshi [Abstract] [Full Text]; Ilstrup, Duane M. [Abstract] [Full Text]; Inoue, Hiroshi [Abstract] [Full Text]; Isobe, Fumitaka [Abstract] [Full Text]; Izumi, Sadanobu [Abstract] [Full Text]
J: Jahangiri, Marjan [Abstract] [Full Text]; Jegaden, Olivier [Abstract] [Full Text]
K: Kamei, Mitsuhiro [Abstract] [Full Text]; Kamiya, Tetsuro [Abstract] [Full Text]; Kandeel, Mohammad [Abstract] [Full Text]; Kaneko, Mitsunori [Abstract] [Full Text]; Kanter, Kirk R. [Abstract] [Full Text]; Kaplan, David K. [Abstract] [Full Text]; Karl, Tom R. [Full Text]; Karmy-Jones, Riyad [Abstract] [Full Text]; Karwande, Shreekanth V. [Abstract] [Full Text]; Katircioglu, Salih Fehmi [Full Text]; Katz, William E. [Abstract] [Full Text]; Kawachi, Kanji [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kawasuji, Michio [Abstract] [Full Text]; Kawata, Tetsuji [Abstract] [Full Text]; Kays, David W. [Abstract] [Full Text]; Keon, Wilbert J. [Abstract] [Full Text]; King, Douglas H. [Abstract] [Full Text]; Kishimoto, Hidefumi [Abstract] [Full Text]; Kitamura, Soichiro [Abstract] [Full Text]; Koçak, Hikmet [Full Text]; Koide, Shirosaku [Abstract] [Full Text]; Koshal, Arvind [Abstract] [Full Text]; Krasna, Mark J [Abstract] [Full Text]; Kücükaksu, Deniz Süha [Full Text]; Kulshrestha, Pankaj [Abstract] [Full Text]; Kumar, Naresh [Abstract] [Full Text]; Kumar, Naresh [Abstract] [Full Text]; Kumar, Pankaj [Abstract] [Full Text]; Kumar, Pankaj [Abstract] [Full Text]
L: Labib, Sherif B. [Abstract] [Full Text]; Laks, Hillel [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Langham, Max R., Jr [Abstract] [Full Text]; Lapenna, Domenico [Abstract] [Full Text]; Lazar, Harold L. [Abstract] [Full Text]; Leddy, Danielle [Abstract] [Full Text]; Lee, Paul C. [Abstract] [Full Text]; Lee, Tsung-Ming [Abstract] [Full Text]; Lee, Yuan-Teh [Abstract] [Full Text]; Legault, Benoit [Abstract] [Full Text]; Liang, Isabella Y.S. [Full Text]; Lilley, John P. [Abstract] [Full Text]; Loisance, Daniel Y. [Abstract] [Full Text]; Loop, Floyd D. [Abstract] [Full Text]; Lusson, Jean-René [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Marquis, Jean-Francois [Abstract] [Full Text]; Martino, Rodrigo [Abstract] [Full Text]; Masai, Takafumi [Abstract] [Full Text]; Masaoka, Akira [Abstract] [Full Text]; Masini, Silvano [Abstract] [Full Text]; Matloff, Jack M. [Abstract] [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Matsuki, Osamu [Abstract] [Full Text]; Matsuki, Osamu [Abstract] [Full Text]; Matsunaga, Yasuhiro [Abstract] [Full Text]; Matsuwaka, Ryousuke [Abstract] [Full Text]; McKenzie, Ian [Full Text]; McLaughlin, Joseph S [Abstract] [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; Meiling, Gregory A. [Abstract] [Full Text]; Mendeloff, Eric N. [Full Text]; Mentzer, Robert M., Jr [Abstract] [Full Text]; Mezzetti, Andrea [Abstract] [Full Text]; Mikaeloff, Philippe H. [Abstract] [Full Text]; Miller, Bruce E. [Abstract] [Full Text]; Milligan, Thomas W. [Abstract] [Full Text]; Minnesota, Rochester [Full Text]; Misaki, Takuro [Abstract] [Full Text]; Misaki, Takuro [Abstract] [Full Text]; Miyade, Yoshio [Abstract] [Full Text]; Miyama, Masatoshi [Abstract] [Full Text]; Miyamoto, Yuji [Abstract] [Full Text]; Molina, Paul L. [Abstract] [Full Text]; Montagna, Pietro [Abstract] [Full Text]; Morita, Ryuichi [Abstract] [Full Text]; Moschetti, Riccardo [Abstract] [Full Text]; Mukherjee, Rupak [Abstract] [Full Text]; Mullany, Charles J. [Abstract] [Full Text]; Murzi, Bruno [Abstract] [Full Text]; Muto, Emiko [Abstract] [Full Text]
N: Najm, Hani K. [Abstract] [Full Text]; Nakatani, Takeshi [Abstract] [Full Text]; Naunheim, Keith S. [Full Text]; Nichols, Ronald D. [Abstract] [Full Text]; Nikaidoh, Hisashi [Full Text]; Nishigaki, Kyoichi [Abstract] [Full Text]; Nishigaki, Kyouichi [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]; Niwa, Hiroshi [Abstract] [Full Text]
O: Ogawa, Jun-ichi [Abstract] [Full Text]; Ohtake, Hiroshi [Abstract] [Full Text]; Ohtake, Hiroshi [Abstract] [Full Text]; Olsen, Stephanie L. [Abstract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Ossette, Jean [Abstract] [Full Text]
P: Pagano, Domenico [Abstract] [Full Text]; Parolari, Alessandro [Abstract] [Full Text]; Patel, Ramesh L. [Abstract] [Full Text]; Penny, Dan [Full Text]; Pham, Si M. [Abstract] [Full Text]; Pompilio, Giulio [Abstract] [Full Text]; Poston, Robert S. [Abstract] [Full Text]; Prabhakar, Ganga [Abstract] [Full Text]; Proudfit, William [Abstract] [Full Text]; Puga, Francisco J. [Abstract] [Full Text]
R: Rao, Ivatury M. [Abstract] [Full Text]; Redmond, J. Mark [Abstract] [Full Text]; Reed, Carolyn E. [Abstract] [Full Text]; Reed, Jack R. [Full Text]; Renlund, Dale G. [Abstract] [Full Text]; Rich, Andrew A. [Full Text]; Richardson, David [Abstract] [Full Text]; Rivers, Samuel [Abstract] [Full Text]; Roberto, Maurizio [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Robinson, Lary A. [Full Text]; Robinson, Lary A. [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]
S: Saedi, Saed F. [Full Text]; Safi, Hazim J. [Full Text]; Sahin, Mahmut [Full Text]; Sakakibara, Naoki [Abstract] [Full Text]; Sano, Akemi [Abstract] [Full Text]; Sasaki, Eisaku [Abstract] [Full Text]; Sasson, Lior [Abstract] [Full Text]; Schachner, Arieh [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schwarz, G. Douglas [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Shemin, Richard J. [Abstract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Shoji, Tasuku [Abstract] [Full Text]; Speekenbrink, Ron G. H. [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Spirito, Rita [Abstract] [Full Text]; Stahl, Richard D. [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Steadland, Kevin M. [Abstract] [Full Text]; Stuart, R. Scott [Abstract] [Full Text]; Sutton, John P., III [Abstract] [Full Text]; Swain, Julie A. [Full Text]
T: Tada, Toyohiro [Abstract] [Full Text]; Takahashi, Masao [Abstract] [Full Text]; Takahashi, Masao [Abstract] [Full Text]; Talbert, James L. [Abstract] [Full Text]; Talwalkar, Nirupama G. [Abstract] [Full Text]; Tanaka, Shigeo [Abstract] [Full Text]; Tasdemir, Oguz [Full Text]; Taylor, David O. [Abstract] [Full Text]; Taylor, Paul C. [Abstract] [Full Text]; Templeton, Philip A [Abstract] [Full Text]; Teodori, Giovanni [Abstract] [Full Text]; Teramoto, Shigeru [Abstract] [Full Text]; Thubrikar, Mano J. [Full Text]; Topol, Eric J. [Full Text]; Treanor, Patrick [Abstract] [Full Text]; Tsang, Geoff M. K. [Abstract] [Full Text]; Tsunezuka, Yoshio [Abstract] [Full Text]; Tsunezuka, Yoshio [Abstract] [Full Text]
U: Uemura, Hideki [Abstract] [Full Text]; Uemura, Hideki [Abstract] [Full Text]; Uhlemann, Frank [Abstract] [Full Text]; Uthoff, Kay [Abstract] [Full Text]; Uthoff, Kay [Abstract] [Full Text]
V: Vaca, Kathy J. [Abstract] [Full Text]; Vallières, Eric [Abstract] [Full Text]; van de Wal, Henry J. C. M. [Full Text]; van Son, Jacques A. M. [Abstract] [Full Text]; Vanini, Vittorio [Abstract] [Full Text]; Verna, Anna Maria [Abstract] [Full Text]; Vial, Christian [Abstract] [Full Text]; Vincent, Robert N. [Abstract] [Full Text]; Vlahakes, Gus J. [Abstract] [Full Text]; Vogelsang, Georgia [Abstract] [Full Text]; Vonk, Alexander B. A. [Abstract] [Full Text]
W: Wada, Masanari [Abstract] [Full Text]; Wada, Masanari [Abstract] [Full Text]; Wang, Lun-Chieh [Abstract] [Full Text]; Watanabe, Go [Abstract] [Full Text]; Watanabe, Go [Abstract] [Full Text]; Watanabe, Masazumi [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Weng, Yuguo [Abstract] [Full Text]; White, Charles S [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Wilkins, Earle W., Jr [Full Text]; Windle, John R. [Full Text]; Winkelstein, Jerry A. [Abstract] [Full Text]; Wood, Robert E. [Abstract] [Full Text]
Y: Yagihara, Toshikatsu [Abstract] [Full Text]; Yagihara, Toshikatsu [Abstract] [Full Text]; Yamakawa, Yosuke [Abstract] [Full Text]; Yamamoto, Fumio [Abstract] [Full Text]; Yamamoto, Fumio [Abstract] [Full Text]; Yamauchi, Shigeo [Abstract] [Full Text]; Yekeler, Ibrahim [Full Text]; Yokoyama, Hitoshi [Abstract] [Full Text]; Yoshida, Yoshitsugu [Abstract] [Full Text]
Z: Zehr, Kenton J. [Abstract] [Full Text]; Zehr, Kenton J. [Abstract] [Full Text]; Zelen, Jonathan [Abstract] [Full Text]; Zucchelli, Gianfranco [Abstract] [Full Text]