ATS -- Index by Author (59 [1])

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Index by Author: Volume 59, Issue 1 (January 1995) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Acar, Christophe [Full Text]; Acland, Robert D. [Abstract] [Full Text]; Actis Dato, Guglielmo M. [Full Text]; Akasaka, Takashi [Abstract] [Full Text]; Alauzen, Michel [Abstract] [Full Text]; Allen, Mark S. [Full Text]; Almassi, G. Hossein [Full Text]; Alpert, Bruce S. [Abstract] [Full Text]; Alsoufiev, Alexander L. [Abstract] [Full Text]; Anderson, David R. [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Arheart, Kristopher L. [Abstract] [Full Text]; Aufiero, Thomas X. [Full Text]
B: Bachet, Jean [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Baldet, Pierre [Abstract] [Full Text]; Banfi, Carlo [Full Text]; Baumgartner, Fritz [Full Text]; Baumgartner, William A. [Abstract] [Full Text]; Bavaria, Joseph E. [Abstract] [Full Text]; Bellows, Charles F. [Abstract] [Full Text]; Bensaïd, Julien [Full Text]; Bernabei, Alvise [Abstract] [Full Text]; Berndt, Suliko [Full Text]; Bert, Arthur A. [Abstract] [Full Text]; Bhatnagar, Narendra Kumar [Full Text]; Blackbourne, Lorne H. [Abstract] [Full Text]; Blackbourne, Lorne H. [Abstract] [Full Text]; Blanche, Carlos [Full Text]; Bloechle, Christian [Abstract] [Full Text]; Bobbio, Paolo [Full Text]; Body, Simon C. [Abstract] [Full Text]; Boldt, Joachim [Abstract] [Full Text]; Bonnetblanc, Jean Marie [Full Text]; Bonney, Sharon L. [Abstract] [Full Text]; Brodaty, Denis [Full Text]; Brodman, Richard F. [Abstract] [Full Text]; Brown, Marion F. [Abstract] [Full Text]; Brown, W. Morris, III [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Büket, Suat [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Cameron, Duke E. [Abstract] [Full Text]; Cameron, Duke E. [Abstract] [Full Text]; Campbell, Colin S. [Full Text]; Carbognani, Paolo [Full Text]; Carey, Joseph S. [Abstract] [Full Text]; Cartier, Paul C. [Abstract] [Full Text]; Cattaneo, Stephen M. [Abstract] [Full Text]; Cattelani, Leonardo [Full Text]; Chan, Christopher L. H. [Abstract] [Full Text]; Chassignolle, Jean-François [Abstract] [Full Text]; Chitwood, W. Randolph, Jr [Full Text]; Chiu, Ray C.-J. [Abstract] [Full Text]; Chomka, Eva V. [Abstract] [Full Text]; Christakis, George T. [Full Text]; Christidès, Constantin [Full Text]; Claudel, Jean-Philippe [Abstract] [Full Text]; Clausnizer, Bernd [Abstract] [Full Text]; Cloutier, Alain [Abstract] [Full Text]; Cohn, Lawrence H. [Abstract] [Full Text]; Colson, Michael [Abstract] [Full Text]; Cornu, Elisabeth [Full Text]; Coselli, Joseph S. [Abstract] [Full Text]; Cosgrove, Delos M., III [Full Text]; Costes, Valérie [Abstract] [Full Text]; Cukingnan, Ramo A. [Abstract] [Full Text]
D: Daly, D. T. [Full Text]; Dato, Alberto Actis [Full Text]; de Jesus, Ramon A. [Abstract] [Full Text]; de Vega, Norberto G. [Full Text]; Deiraniya, Abdul K. [Full Text]; Dekkers, Rene J. [Abstract] [Full Text]; Delisle, George [Abstract] [Full Text]; Depoix, Jean-Pol [Abstract] [Full Text]; Deslauriers, Jean [Abstract] [Full Text]; Despotis, George J. [Abstract] [Full Text]; Di Rosa, Elio [Full Text]; di Summa, Michele [Full Text]; DiSesa, Verdi J. [Abstract] [Full Text]; DiSessa, Thomas G. [Abstract] [Full Text]; Djukanovic, Bosco [Abstract] [Full Text]; Drossos, George [Abstract] [Full Text]; Dumont, Pascal [Abstract] [Full Text]
E: Edmunds, L. Henry, Jr [Abstract] [Full Text]; Ellis, Jennifer L. [Abstract] [Full Text]
F: Fabian, Timothy C. [Abstract] [Full Text]; Fanning, William J. [Abstract] [Full Text]; Feng, William C. [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Fernoux, Philippe [Abstract] [Full Text]; Fitzgerald, Daniel J. [Abstract] [Full Text]; Florentine, Michael S. [Abstract] [Full Text]; Forty, Jonathan [Full Text]; Frame, Rosemary [Abstract] [Full Text]; Fry, Willard A. [Abstract] [Full Text]; Fujiwara, Hiroshi [Abstract] [Full Text]
G: Gabrielson, Edward W. [Abstract] [Full Text]; Gamel, Ahmed El [Full Text]; Garcia-Civera, Roberto [Abstract] [Full Text]; Gardner, Timothy J. [Abstract] [Full Text]; Ghossein, Yahia [Full Text]; Gikakis, Nicolas [Abstract] [Full Text]; Gillinov, A. Marc [Abstract] [Full Text]; Ginzton, Leonard [Full Text]; Goodnough, Lawrence T. [Abstract] [Full Text]; Graham, Alastair N. J. [Full Text]; Greene, Peter S. [Abstract] [Full Text]; Grillo, Hermes C. [Abstract] [Full Text]; Guilmet, Daniel [Full Text]
H: Hall, R. Alan [Abstract] [Full Text]; Hazelrigg, Stephen R. [Full Text]; Head, Harold D. [Abstract] [Full Text]; Helou, Joe [Abstract] [Full Text]; Hempelmann, Gunter [Abstract] [Full Text]; Hercule, Christiane [Abstract] [Full Text]; Horikoshi, Noboru [Abstract] [Full Text]; Hosannah, Hilton O. [Abstract] [Full Text]; Houde, Christine [Abstract] [Full Text]; Hovaguimian, Hagop [Abstract] [Full Text]; Hvass, Ulrik [Abstract] [Full Text]
I: Inoue, Masakuni [Abstract] [Full Text]; Iwamoto, Isao [Abstract] [Full Text]; Izbicki, Jakob R. [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: John, Lindsay C. H. [Abstract] [Full Text]; Joiner-Maier, Diane [Abstract] [Full Text]; Joist, J. Heinrich [Abstract] [Full Text]; Joller-Jemelka, Helen I. [Abstract] [Full Text]
K: Kahn, Mark B. [Abstract] [Full Text]; Kaiser, Larry R. [Abstract] [Full Text]; Kan, Jean S. [Abstract] [Full Text]; Karg, Ortrud [Abstract] [Full Text]; Karlawish, Jason H. T. [Abstract] [Full Text]; Karp, Robert B. [Abstract] [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kawasuji, Michio [Abstract] [Full Text]; Keane, John F. [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kessler, Romain [Abstract] [Full Text]; Kim, Stephen S. [Abstract] [Full Text]; King, Douglas H. [Abstract] [Full Text]; Kirkorian, Gilbert [Abstract] [Full Text]; Kline, Gary M. [Abstract] [Full Text]; Knoefel, Wolfram T. [Abstract] [Full Text]; Koenigsberg, Robert A. [Abstract] [Full Text]; Koga, Yasunori [Abstract] [Full Text]; Kowalska, Maria Anna [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]
L: Langenburg, Scott E. [Abstract] [Full Text]; Langenburg, Scott E. [Abstract] [Full Text]; Lappas, Demetrios G. [Abstract] [Full Text]; Laub, Glenn W. [Abstract] [Full Text]; Lazou, Antigone [Abstract] [Full Text]; Lee, Paul C. [Abstract] [Full Text]; Lemmer, John H., Jr [Abstract] [Full Text]; Lenert, Jeffrey T. [Abstract] [Full Text]; Levine, Jami C. [Abstract] [Full Text]; Linke, Lars-Christoph [Abstract] [Full Text]; Liu, Mark C. [Abstract] [Full Text]; Low, Rick A. [Abstract] [Full Text]; Lust, Robert M. [Full Text]; Lyons, Gustavo [Abstract] [Full Text]
M: Martinelli, Luca [Full Text]; Martinez-Leon, Juan [Abstract] [Full Text]; Marty-Ané, Charles-Henri [Abstract] [Full Text]; Mary, Henri [Abstract] [Full Text]; Massard, Gilbert [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; Matsubara, Toshiki [Abstract] [Full Text]; Matsumoto, Yasushi [Abstract] [Full Text]; Matsuyama, Katsuhiko [Abstract] [Full Text]; Matsuzaki, Yasunori [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; Mauser, Jonathan F. [Abstract] [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mayer, John E., Jr [Abstract] [Full Text]; Mayumi, Hisanori [Abstract] [Full Text]; McFarland, James J. [Abstract] [Full Text]; McGuigan, James A. [Full Text]; McIrvin, David M. [Abstract] [Full Text]; McManus, Kieran G. [Full Text]; Mihaljevic, Tomislav [Abstract] [Full Text]; Miki, Shigehito [Abstract] [Full Text]; Milliken, Jeffrey [Full Text]; Misawa, Yoshio [Abstract] [Full Text]; Mitsui, Toshio [Full Text]; Miyamoto, Satoru [Abstract] [Full Text]; Morales, Mark [Abstract] [Full Text]; Morand, Georges [Abstract] [Full Text]; Morritt, Graham N. [Full Text]; Moss, R. Lawrence [Abstract] [Full Text]; Mostafavi, Hassan [Abstract] [Full Text]; Muehrcke, Derek D. [Abstract] [Full Text]; Muñoz, Manuel [Full Text]
N: Nakagawa, Ken [Abstract] [Full Text]; Nakajima, Toshifusa [Abstract] [Full Text]; Nakano, Eiichi [Abstract] [Full Text]; Nasu, Michihiro [Abstract] [Full Text]; Naunheim, Keith S. [Full Text]; Negri, Silvia [Full Text]; Nesbitt, Jonathan C. [Abstract] [Full Text]; Ng, Bruce [Abstract] [Full Text]; Niewiarowski, Stefan [Abstract] [Full Text]; Nishiuchi, Sunao [Abstract] [Full Text]; Novick, William M. [Abstract] [Full Text]
O: Obadia, Jean-François [Abstract] [Full Text]; Okada, Yukikatsu [Abstract] [Full Text]; Okazaki, Tsuyoshi [Abstract] [Full Text]; Okita, Yutaka [Abstract] [Full Text]; Onitsuka, Toshio [Abstract] [Full Text]; Oppell, Ulrich O. von [Full Text]; Osmer, Christoph [Abstract] [Full Text]; Otero-Coto, Eduardo [Abstract] [Full Text]
P: Pae, Walter E., Jr [Full Text]; Pairolero, Peter C. [Full Text]; Pak, Sang [Full Text]; Panagopoulos, Photis [Abstract] [Full Text]; Pansini, Stefano [Full Text]; Pantel, Klaus [Abstract] [Full Text]; Pape, Linda A. [Abstract] [Full Text]; Parsons, Richard E. [Abstract] [Full Text]; Passlick, Bernward [Abstract] [Full Text]; Pate, James W. [Abstract] [Full Text]; Pearson, F. Griffith [Full Text]; Pei, Patrick [Abstract] [Full Text]; Pensler, Jay M. [Abstract] [Full Text]; Perán, Salvador [Full Text]; Perier, Patrick [Abstract] [Full Text]; Perrault, Louis P. [Abstract] [Full Text]; Port, Jeffrey L. [Abstract] [Full Text]; Pujol, Jean-Louis [Abstract] [Full Text]
R: Rahman, Ali N. [Full Text]; Rao, Ivatury M. [Abstract] [Full Text]; Redmond, J. Mark [Abstract] [Full Text]; Reeder, Laurie B. [Abstract] [Full Text]; Regragui, Idriss A. [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Rescigno, Giuseppe [Abstract] [Full Text]; Reyes, Angelo T. [Abstract] [Full Text]; Rizzo, Robert J. [Abstract] [Full Text]; Robicsek, Francis [Full Text]; Roeslin, Norbert [Abstract] [Full Text]; Rollé, Florence [Full Text]; Rotenberg, Fred A. [Abstract] [Full Text]; Rumberger, John A. [Abstract] [Full Text]; Rusca, Michele [Full Text]
S: Sakai, Tetsuro [Abstract] [Full Text]; Sakakibara, Naoki [Abstract] [Full Text]; Salas, Julián [Full Text]; Salim, Mubadda A. [Abstract] [Full Text]; Sanders, Stephen P. [Abstract] [Full Text]; Sanjuan, Rafael [Abstract] [Full Text]; Santoro, Samuel A. [Abstract] [Full Text]; Sarsam, Mazin A. [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schindler, Ehrenfried [Abstract] [Full Text]; Schmid, Edith R. [Abstract] [Full Text]; Schmid, Franz X. [Abstract] [Full Text]; Schönberger, Jacques P. A. M. [Full Text]; Sekiya, Ryo [Abstract] [Full Text]; Shah, Rosita M. [Abstract] [Full Text]; Shibata, Koichiro [Abstract] [Full Text]; Shields, Thomas W. [Full Text]; Shimizu, Kuniyoshi [Abstract] [Full Text]; Shinkai, Masahiko [Abstract] [Full Text]; Shomura, Toyo [Abstract] [Full Text]; Siddiqui, Aamir [Abstract] [Full Text]; Sinclair, Kimberly N. [Abstract] [Full Text]; Singer, Lavieen K. M. [Abstract] [Full Text]; Singh, Arun K. [Abstract] [Full Text]; Smith, Gardner W. [Abstract] [Full Text]; Smythe, W. Roy [Abstract] [Full Text]; Sono, Jun [Abstract] [Full Text]; Spaggiari, Lorenzo [Full Text]; Spevak, Philip J. [Abstract] [Full Text]; Stanford, William [Abstract] [Full Text]; Stark, Jaroslav [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Stertmann, Wolfgang-Amadeus [Abstract] [Full Text]; Stewart, James A. [Abstract] [Full Text]; Stuart, R. Scott [Abstract] [Full Text]; Swanson, Jeffrey S. [Abstract] [Full Text]; Symbas, Panagiotis N. [Abstract] [Full Text]
T: Tahata, Takafumi [Abstract] [Full Text]; Teja, Sandeep S. [Abstract] [Full Text]; Terada, Yasushi [Full Text]; Thetter, Olaf [Abstract] [Full Text]; Thibault, Claude [Abstract] [Full Text]; Thubrikar, Mano J. [Full Text]; Tokunaga, Shigehiko [Abstract] [Full Text]; Tönz, Martin [Abstract] [Full Text]; Toshima, Yoshihiro [Abstract] [Full Text]; Touboul, Paul [Abstract] [Full Text]; Triantafillou, Anastasios N. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Turina, Marko I. [Abstract] [Full Text]
U: Ueda, Mamoru [Abstract] [Full Text]; Ueda, Yuichi [Abstract] [Full Text]; Uthoff, Kay [Abstract] [Full Text]
V: Vaaler, Andrew K. [Abstract] [Full Text]; Vaghela, Shashi V. [Full Text]; van Son, Jacques A. M. [Full Text]; Vander Salm, Thomas J. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wagner, Robert B. [Abstract] [Full Text]; Walker, William A. [Abstract] [Full Text]; Waller, David A. [Full Text]; Walsh, Garrett L. [Abstract] [Full Text]; Warren, Sherwyn E. [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Watson, Donald C., Jr [Abstract] [Full Text]; Weksler, Benny [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; Whitman, Glenn J. R. [Abstract] [Full Text]; Wihlm, Jean-Marie [Abstract] [Full Text]; Williams, Thomas E., Jr [Abstract] [Full Text]; Williams, William G. [Full Text]; Wixon, Christopher L. [Full Text]
Y: Yamamoto, Tatsuo [Full Text]; Yamashita, Takashi [Abstract] [Full Text]; Yanagisawa, Akio [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yonan, Nizar A. [Full Text]; Yoshikawa, Junichi [Abstract] [Full Text]; Yoshioka, Makoto [Abstract] [Full Text]; Yoshitoshi, Mochikazu [Abstract] [Full Text]
Z: Zales, Vincent R. [Abstract] [Full Text]; Zehr, Kenton J. [Abstract] [Full Text]; Zehr, Kenton J. [Abstract] [Full Text]