ATS -- Index by Author (58 [6])

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Index by Author: Volume 58, Issue 6 (December 1994) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abel, James G. [Abstract]; Adams, Francis V. [Abstract]; Allen, Bradley S. [Abstract]; Allen, Mark S. [Abstract]; Allmendinger, Philip D. [Abstract]; Andersen, John R. [Abstract]; Anderson, Benjamin O. [Abstract]; Anna, Joao R.M.Sant [Abstract]; Antretter, Herwig; Aps, Chris; Armitage, John M. [Abstract]; Arom, Kit V.; Arom, Kit V. [Abstract]
B: Bailey, Colin [Abstract]; Balaguer, Jorge M. [Abstract]; Barbour, Galen [Abstract] [Full Text]; Baumann, F.Gregory [Abstract]; Belleisle, Janice [Abstract]; Belz, Michael; Black, John J.M.; Blanche, Carlos [Abstract]; Block, Michael [Abstract]; Blumenthal, James A. [Abstract]; Bobbio, Paolo; Böcker, Dirk [Abstract]; Borioni, Raoul; Breithardt, Günter [Abstract]; Burt, Michael E. [Abstract]
C: Caes, Frank L.; Carey, Robert W. [Abstract]; Carofalo, Mariano; Carter, Thomas L. [Abstract]; Chang, Chau-Hsiung [Abstract]; Chang, Jen-Ping [Abstract]; Chang, Jou-Chen [Abstract]; Chassin, Mark R. [Abstract]; Chen, Jin-Jer [Abstract]; Chiang, Karl S. [Abstract]; Chiariello, Luigi; Chitwood, W.Randolph, Jr [Abstract]; Choi, Noah C. [Abstract]; Christakis, George T. [Abstract]; Clark, Richard E. [Abstract]; Clark, Richard E. [Abstract]; Clarke, David R.; Col, Richard H.Dal [Abstract]; Coleman, Mary [Abstract]; Coles, John G. [Abstract]; Colvin, Stephen B. [Abstract]; Cooper, Joel D. [Abstract]; Cooper, Joel D. [Abstract]; Cox, James L.; Croughwell, Narda D. [Abstract]; Cummings, Robin G. [Abstract]; Czer, Lawrence S.C. [Abstract]
D: Daley, Jennifer [Abstract]; Daley, Jennifer [Abstract]; Daley, Jennifer; Daly, Mary [Abstract]; Dapunt, Otto E.; Dato, Guglielmo M.Actis; Dauber, Ira [Abstract]; DaValle, Michael J. [Abstract]; De Gevigney, Guy Durand [Abstract]; Deaton, David W. [Abstract]; del Nido, Pedro J. [Abstract]; Delahaye, François [Abstract]; Dent, John M. [Abstract]; Deschamps, Claude [Abstract]; Deslauriers, Jean; Dorwarth, Uwe [Abstract]; Dziuban, Stanley W., Jr [Abstract]
E: Ebert, Paul A. [Abstract] [Full Text]; Edwards, Fred H. [Abstract]; Edwards, Fred H. [Abstract]; Eishi, Kiyoyuki [Abstract]; Eker, Armand [Abstract]; Ellison, Lee H. [Abstract]; Emery, Robert W. [Abstract]; Engelman, Richard M. [Abstract]; Erickson, Nicholette L. [Abstract]
F: Faber, L.Penfield [Abstract]; Fechner, Robert E. [Abstract]; Filho, Raul I.Rossi [Abstract]; Flack, Joseph E., III; Flack, Joseph E., III [Abstract]; Frasco, Peter E. [Abstract]; Freedom, Robert M. [Abstract]; Freimark, Dov [Abstract]; Fremes, Stephen E. [Abstract]; Fricker, F.Jay [Abstract]; Fry, Willard A.; Fujii, Yoshitaka [Abstract]; Fukushima, Norihide [Abstract]; Fyfe, Billie S. [Abstract]
G: Geiger, Armin [Abstract]; Glassman, Lawrence R. [Abstract]; Glower, Donald D. [Abstract]; Goldman, Bernard S. [Abstract]; Goldman, Bernard S.; Graziano, Stephen L. [Abstract]; Griepp, Randall B. [Abstract]; Griffith, Bartley P. [Abstract]; Griffith, Bartley P.; Grillo, Hermes C. [Abstract]; Groh, Mark A. [Abstract]; Grover, Frederick L.; Grover, Frederick L. [Abstract]; Grover, Frederick L. [Abstract]; Gu, Y.J.
H: Ham, Jongwok [Abstract]; Hammel, Dieter [Abstract]; Hammermeister, Karl E. [Abstract]; Hammermeister, Karl E. [Abstract]; Hammermeister, Karl E.; Hammermeister, Karl E. [Abstract]; Hammon, John W., Jr [Abstract]; Hanafy, Hanafy M. [Abstract]; Hann, Mindy [Abstract]; Hannan, Edward L. [Abstract]; Harken, Alden H.; Hartz, Renee S. [Abstract]; Haspect, Anne [Abstract]; Hatter, Jeffrey [Abstract]; Hattler, Brack G.; Hendry, Paul J. [Abstract]; Hilgenberg, Alan D. [Abstract]; Hill, J.Donald; Hirooka, Kazunobu [Abstract]; Hoffmann, Ellen [Abstract]; Hopkins, Henry R. [Abstract]; Horan, Thomas A. [Abstract]; Hosoda, Hiroshi [Abstract]; Hsi, Charles [Abstract]; Hsieh, Hung-Chang [Abstract]; Hsieh, Ming-Jang [Abstract]; Hudspeth, Dudley A. [Abstract]; Humphrey, Chester B. [Abstract]; Hurwitz, Barrie J. [Abstract]
I: Iezzoni, Lisa I. [Abstract]; Ilstrup, Duane M. [Abstract]; Ingemansson, Richard [Abstract]
J: Jegaden, Olivier [Abstract]; Jencks, Stephen F. [Abstract]; Jennings, Alison [Abstract]; Jensik, Robert J. [Abstract]; Jikuya, Tomoaki; Johnson, Randall R. [Abstract]; Jones, Robert H. [Abstract]; Jones, Robert H. [Abstract]; Joyce, Lyle D. [Abstract]
K: Kaan, Gilles L.; Kalil, Renato A.K. [Abstract]; Kaneko, Mamoru [Abstract]; Kaneko, Mitsunori [Abstract]; Kanemoto, Shinya; Karl, Tom R.; Kaulbach, Hans [Abstract]; Kawashima, Yasunaru [Abstract]; Kawazoe, Kouhei [Abstract]; King, R.Michael [Abstract]; Kito, Yoshitsugu [Abstract]; Kittle, C.Frederick [Abstract]; Knight, Simon R. [Abstract]; Knight, Simon R. [Abstract]; Kohman, Leslie J. [Abstract]; Kosakai, Yoshio [Abstract]; Koza, Michael J. [Abstract]; Kumar, Dinesh [Abstract]
L: Lacquet, Leon K.; Lamberti, John J. [Abstract]; Lanza, Louis A. [Abstract]; Laurie, A. [Abstract]; Lee, Eileen [Abstract]; Leone, Bruce J. [Abstract]; Lewis, Julia B. [Abstract]; Lichtenstein, Samuel V. [Abstract]; Lien, Wen-Pin [Abstract]; Lin, Fang-Yue [Abstract]; Lin, Jiunn-Lee [Abstract]; Lin, Pyng Jing [Abstract]; Lindberg, Lars [Abstract]; Ling, Hilton [Abstract]; Liu, Hui-Ping [Abstract]; Logan, Diana L. [Abstract]; Lowe, James E.; Lucchese, Fernando A. [Abstract]
M: Maciocco, Marco [Abstract]; Mai, Ryan [Abstract]; Mainwaring, Richard D. [Abstract]; Markewitz, Andreas [Abstract]; Marshall, Guillermo [Abstract]; Martin, Paul G. [Abstract]; Masters, Roy G. [Abstract]; Mathisen, Douglas J. [Abstract]; Matsuda, Hikaru [Abstract]; Matsuda, Hikaru [Abstract]; Matsumiya, Goro [Abstract]; Matsuzaki, Kanji; Mattke, Sören [Abstract]; McDonald, Monica L. [Abstract]; McGee, D.Scott [Abstract]; McIlduff, Joseph B. [Abstract]; McKneally, Martin F.; McLean, Richard F. [Abstract]; Mehra, Arun P.; Michaels, Marian [Abstract]; Mikaeloff, Philippe H. [Abstract]; Miller, Stuart J. [Abstract]; Minami, Masato [Abstract]; Mintz, Paul D. [Abstract]; Mitsui, Toshio; Miyagawa, Shuji [Abstract]; Miyagishima, Robert T. [Abstract]; Molin, Lisa J. [Abstract]; Moncure, Ashby C. [Abstract]; Montagna, Pietro [Abstract]; Moran, John M. [Abstract]; Mosca, Ralph S. [Abstract]; Mueller, Ludwig C.; Munver, Ravi [Abstract]
N: Nair, Unikrishnan [Abstract]; Naka, Yoshifumi [Abstract]; Nakahara, Kazuya [Abstract]; Nakanishi, Katsuhiko [Abstract]; Nakanishi, Norifumi [Abstract]; Nakano, Susumu [Abstract]; Nakata, Seizou [Abstract]; Naylor, C.David [Abstract]; Nesralla, Ivo A. [Abstract]; Newman, Mark F. [Abstract]; Newton, Kenneth [Abstract]; Nicoloff, Demétre M. [Abstract]; Nooten, Guido J.Van; Noyez, Luc; Nugent, William C. [Abstract]
O: Osimani, Daniel [Abstract]; Ossette, Jean [Abstract]; Owen, Clarence H. [Abstract]; Owen, Susannah G. [Abstract]
P: Pairolero, Peter C. [Abstract]; Palmer, Arthur S.; Park, Soon J. [Abstract]; Pasquini, Luciano; Patterson, G.Alexander [Abstract]; Patterson, G.Alexander [Abstract]; Pearson, F.Griffith [Abstract]; Pecirep, Dragan P. [Abstract]; Pekow, Penelope S. [Abstract]; Pellegrino, Antonio; Perry, Donna [Abstract]; Peters, Richard M.; Pickering, Ruth M. [Abstract]; Pifarré, Roque [Abstract]; Pohl, Mary S. [Abstract]; Pohl, Mary S. [Abstract]; Prates, Paulo Roberta [Abstract]
Q: Quintana, Cid S. [Abstract]
R: Racz, Michael [Abstract]; Ralph-Edwards, Anthony C. [Abstract]; Ranucci, Marco; Rebeyka, Ivan M. [Abstract]; Rebuffat, Carlo [Abstract]; Reichart, Bruno [Abstract]; Reves, Joseph G. [Abstract]; Reynolds, Marleta; Rice, Thomas W.; Rosengart, Todd K. [Abstract]; Ross, David B. [Abstract]; Rousou, John A. [Abstract]; Roviaro, Giancarlo [Abstract]
S: Sanders, Stephen P.; Sasako, Yoshikado [Abstract]; Sato, Masato; Satur, Christopher M.R. [Abstract]; Sawada, Stephen [Abstract]; Scalambra, Silvio Marco [Abstract]; Scheld, Hans H. [Abstract]; Schell, Randall M. [Abstract]; Schulman, Ira C. [Abstract]; Schults, William C. [Abstract]; Schwab, Steve J. [Abstract]; Schwartz, Marc [Abstract]; Schwartz, Marc [Abstract]; Sell, Timothy L. [Abstract]; Semer, Diane A. [Abstract]; Sharp, Thomas G. [Abstract]; Shirakura, Ryota [Abstract]; Shrager, Joseph B.; Shroyer, A.Laurie W. [Abstract]; Shroyer, W. [Abstract]; Shumacker, Harris B., Jr [Extract] [Full Text]; Shyu, Kou-Gi [Abstract]; Siu, Albert L. [Abstract]; Sjöberg, Trygve [Abstract]; Smallhorn, Jeffrey [Abstract]; Smith, Lloyd R. [Abstract]; Soller, Babs R. [Abstract]; Soto, Enrique [Abstract]; Spaggiari, Lorenzo; Spencer, Frank C. [Abstract]; Spotnitz, William D. [Abstract]; Stadlbauer, Thomas [Abstract]; Stahl, Russell F. [Abstract]; Stark, Jaroslav; Steen, Paul M. [Abstract]; Steen, Stig [Abstract]; Steen, Stig; Steinbeck, Gerhard [Abstract]; Steinberg, John B. [Abstract]; Stilwell, Moira E. [Abstract]; Sunamori, Makoto [Abstract]; Suzuki, Akio [Abstract]
T: Takeda, Shin-ichi [Abstract]; Terada, Yasushi; Terrell, Mark R. [Abstract]; Thompson, Christopher R. [Abstract]; Thyrum, Elizabeth A. [Abstract]; Trachietis, Gregory D. [Abstract]; Trachiotis, Gregery D. [Abstract]; Trantek, Victor F. [Abstract]; Trento, Alfredo [Abstract]; Trulock, Elbert P. [Abstract]; Trulock, Elbert P. [Abstract]; Trusler, George A. [Abstract]; Tsai, Chang-Her [Abstract]; Tseng, Yung-Zu [Abstract]
U: Urschel, John D. [Abstract]
V: Valenza, Mario [Abstract]; Van Oeveren, Willem; Vander Salm, Thomas J. [Abstract]; Varoli, Federico [Abstract]; Veit, Linda J. [Abstract]; Venn, Graham E.; Vergani, Contardo [Abstract]; Vinten-Johansen, Jakob [Abstract]
W: Wain, John C. [Abstract]; Walenga, Jeanine M. [Abstract]; Walker, Duncan R. [Abstract]; Wareing, Thomas H.; Warriner, C.Brian [Abstract]; Waters, Daniel J.; Webber, Steven A. [Abstract]; Weinhold, Christian [Abstract]; White, William D. [Abstract]; Williams, Bryn T.; Williams, J.Mark [Abstract]; Williams, Mark W. [Abstract]; Williams, William G. [Abstract]; Winkelmann, Jacqueline W. [Abstract]; Wolf, David J. [Abstract]; Wong, Bill I. [Abstract]; Wright, Cameron D. [Abstract]
Y: Yoshioka, Takao [Abstract]
Z: Zeri, Richard S. [Abstract]; Zhao, Zhi-Qing [Abstract]