ATS -- Index by Author (56 [3])

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Index by Author: Volume 56, Issue 3 (September 1993) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abdel-Aleem, Salah [Abstract]; Acuff, Tea E. [Extract] [Full Text]; Acuff, Tea E. [Abstract]; Acuff, Tea E. [Abstract]; Acuff, Tea E. [Extract] [Full Text]; Acuff, Tea E. [Abstract]; Acuff, Tea E. [Abstract]; Acuff, Tea E. [Abstract]; Acuff, Tea E. [Extract] [Full Text]; Addonizio, Linda J. [Abstract]; Albanese, Sonia-Bernadette [Abstract]; Allen, Mark S. [Abstract]; Almond, Carl H. [Abstract]; Amitay, Moshe [Abstract]; Anderson, Richard P.; Anstadt, Mark P. [Abstract]; Arom, Kit V.; Asamura, Hisao [Abstract]; Astudillo, Rafael [Abstract]; Auer, James E. [Abstract]; Auer, James E. [Abstract]
B: Baciewicz, Frank A. [Abstract]; Barner, Hendrick B.; Barr, Mark L. [Abstract]; Baumgartner, William A. [Abstract]; Bavaria, Joseph E. [Abstract]; Bell, Timothy J. [Abstract]; Benckart, Daniel H. [Abstract]; Berry, William R. [Abstract]; Bianco, Richard W. [Abstract]; Bobechko, Walter P. [Abstract]; Bolton, Joe W.R. [Abstract]; Bond, Sheldon J. [Abstract]; Bonvicini, Marco [Abstract]; Braimbridge, Mark V. [Abstract]; Burns, Stephanie A. [Abstract]; Bynoe, Raymond P. [Abstract]; Byrne, Paul J. [Abstract]
C: Cameron, Duke E. [Abstract]; Cannon, Annatina [Abstract]; Cannon, Walter B. [Extract] [Full Text]; Cannon, Walter B. [Abstract]; Celerier, Michel [Abstract]; Chadburn, Amy [Abstract]; Chang, Paul A. [Abstract]; Chen, Jonathan M. [Abstract]; Cheng, Tsung O.; Chiu, Ray C.-J. [Abstract]; Christlieb, Ignacio Y. [Abstract]; Claes, Göran [Abstract]; Clarke, John P.; Cleveland, David C.; Cohen, Amram J. [Abstract]; Cohen, Marc [Abstract]; Collard, Jean-Marie [Abstract]; Collard, Jean-Marie [Abstract]; Cooper, Joel D. [Extract] [Full Text]; Cooper, Joel D. [Extract] [Full Text]; Coosemans, Willy [Abstract]; Costa, Robert [Abstract]; Cox, James L. [Abstract]; Cox, James L.; Crain, Barbara J. [Abstract]; Crawford, Fred A. [Abstract]; Creswell, Lawrence L. [Abstract]; Crumbley, Arthur J. [Abstract]
D: D'Hoore, André [Abstract]; Daly, Richard C. [Abstract]; Daniel, Thomas M. [Extract] [Full Text]; Daniel, Thomas M. [Abstract]; Daniel, Thomas M. [Extract] [Full Text]; DeLeon, Serafin Y. [Abstract]; Deschamps, Claude [Abstract]; Dobell, Anthony R.C. [Abstract]; Dorman, B. Hugh [Abstract]; Dowling, Robert D. [Abstract]; Dowling, Robert D. [Abstract]; Dowling, Robert D. [Abstract]; Downey, Francis X. [Abstract]; Drinkwater, Davis C. [Abstract]; Drott, Christer [Abstract]
E: Edwards, Brooks S. [Abstract]; Ekroth, Rolf [Abstract]; Ellis, F. Henry [Abstract]; End, Adelheid [Abstract]; Ergin, M. Arisan [Abstract]
F: Feins, Richard H. [Abstract]; Feins, Richard H. [Extract] [Full Text]; Ferguson, Mark K. [Abstract]; Ferguson, Mark K. [Extract] [Full Text]; Ferguson, Mark K. [Abstract]; Ferraris, Victor A. [Abstract]; Ferson, Peter F. [Abstract]; Ferson, Peter F. [Abstract]; Ferson, Peter F. [Abstract]; Fetch, Michael C. [Abstract]; Fisher, Elizabeth A. [Abstract]; Fourquier, Pierre [Abstract]; Frascaroli, Guido [Abstract]; Freeman, Jenny E. [Abstract]; Frizzera, Glauco [Abstract]; Fullerton, David A. [Abstract]
G: Galla, Jan D. [Abstract]; Galvin, Ivor F. [Abstract]; Gargiulo, Gaetano [Abstract]; Gates, Richard N. [Abstract]; Gealow, Kendra K. [Abstract]; Gillinov, A. Marc [Abstract]; Ginsberg, Robert J.; Ginsberg, Robert J. [Abstract]; Gossot, Dominique [Abstract]; Göthberg, Gunnar [Abstract]; Graeber, Geoffrey M. [Abstract]; Graeber, Geoffrey M. [Abstract]; Graeber, Geoffrey M. [Extract] [Full Text]; Griepp, Randall B. [Abstract]; Grignani, Fabrizio [Abstract]; Grimm, Michael [Abstract]; Grover, Frederick L. [Abstract]; Gustafson, Robert A. [Abstract]; Guzzetta, Philip C. [Abstract]
H: Halff, Glenn; Hallhagen, Stefan [Abstract]; Hannah, Hamner [Abstract]; Harris, Gary J. [Abstract]; Hartl, Sylvia [Abstract]; Hauptman, Eli [Abstract]; Hazelrigg, Stephen R. [Extract] [Full Text]; Hazelrigg, Stephen R. [Abstract]; Hazelrigg, Stephen R. [Abstract]; Hazelrigg, Stephen R. [Extract] [Full Text]; Hazelrigg, Stephen R. [Abstract]; Hazelrigg, Stephen R. [Abstract]; Hazelrigg, Stephen R. [Abstract]; Hazelrigg, Steven R. [Abstract]; Hegde, Sanjay S. [Abstract]; Heindl, Werner [Abstract]; Herskowitz, Ahvie [Abstract]; Hill, Ronald C. [Abstract]; Hirata, Nobuaki [Abstract]; Hollingsed, Michael J. [Abstract]; Horswell, Jeffrey L. [Abstract]; Hunt, James B. [Abstract]
J: Jonas, Richard A. [Abstract]; Jones, David R. [Abstract]; Jones, David R. [Abstract]; Jones, Robert H. [Abstract]
K: Kaczer, Elias M. [Abstract]; Kaiser, Larry R. [Extract] [Full Text]; Kaiser, Larry R. [Abstract]; Kaneko, Mitunori [Abstract]; Katsura, Hiroshi [Abstract]; Keane, John F. [Abstract]; Keenan, Robert J. [Abstract]; Keenan, Robert J. [Abstract]; Keenan, Robert J. [Abstract]; Kendall, Simon W.H. [Abstract]; Kendall, Simon W.H. [Abstract]; Kestens, Paul Jacques [Abstract]; Kestens, Paul-Jacques [Abstract]; Khian Ha, Victor Lin [Abstract]; Kirby, Thomas J. [Abstract]; Kitamura, Soichiro [Abstract]; Klepetko, Walter [Abstract]; Klingman, Robert R. [Abstract]; Knowles, Daniel M. [Abstract]; Kondo, Haruhiko [Abstract]; Konno, Hidehiko [Abstract]; Krasna, Mark J. [Abstract]; Krasna, Mark J. [Extract] [Full Text]; Krasna, Mark J. [Extract] [Full Text]; Kratz, John M. [Abstract]; Kupferschmid, John P. [Abstract]
L: Laks, Hillel [Abstract]; Lal, Raj B.; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Extract] [Full Text]; Landreneau, Rodney J. [Extract] [Full Text]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Extract] [Full Text]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Abstract]; Landreneau, Rodney J. [Extract] [Full Text]; Lansman, Steven L. [Abstract]; Lazar, Harold L. [Abstract]; Leichter, Rhoda [Abstract]; Lengele, Benoît [Abstract]; Lerut, Toni E. [Extract] [Full Text]; Lerut, Toni E. [Abstract]; Lewis, Ralph J. [Abstract]; Lewis, William [Abstract]; Lincoln, Christopher [Abstract]; LoCicero, Joseph [Abstract]; LoCicero, Joseph [Extract] [Full Text]; LoCicero, Joseph [Abstract]; Lowe, James E. [Abstract]; Lowe, James E. [Abstract]
M: Machac, Josef [Abstract]; Maciocco, Marco [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J.; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Mack, Michael J. [Abstract]; Maeda, Masazumi [Abstract]; Magovern, George J. [Abstract]; Magovern, George J. [Abstract]; Magovern, James A. [Abstract]; Maher, Thomas D. [Abstract]; Mares, Peter [Abstract]; Martin, Paul G.; Matsuda, Hikaru [Abstract]; Matsuzawa, Yuji [Abstract]; McGregor, Christopher G.A. [Abstract]; McKneally, Martin F. [Extract] [Full Text]; McLaughlin, Joseph S. [Abstract]; McNabney, W. Kendall [Abstract]; Michler, Robert E. [Abstract]; Milano, Carmelo A. [Abstract]; Miller, Joseph I. [Abstract]; Miller, Joseph I. [Extract] [Full Text]; Miller, Joseph I. [Extract] [Full Text]; Miller, Joseph I. [Extract] [Full Text]; Miller, Joseph I. [Abstract] [Full Text]; Milstein, Benjamin B. [Abstract]; Mitchell, Ian M.; Mohri, Hitoshi [Abstract]; Moon, Marc R.; Mulder, David S. [Abstract]; Mulder, David S. [Abstract]; Mulder, David S. [Extract] [Full Text]; Murray, Gordon F. [Abstract]; Murton, Mark [Abstract]; Myerowitz, P. David [Abstract]
N: Nair, R. Unnikrishnan; Nakamoto, Kembu [Abstract]; Nakamura, Tadashi [Abstract]; Nakano, Susumu [Abstract]; Naruke, Tsuguo [Abstract]; Naunheim, Keith S. [Extract] [Full Text]; Naunheim, Keith S. [Extract] [Full Text]; Naunheim, Keith S. [Abstract]; Naunheim, Keith S. [Abstract]; Naunheim, Keith S. [Extract] [Full Text]; Niibori, Koki [Abstract]; Noishiki, Yasuharu; Nunchuck, Susan K. [Abstract]
O: Ohri, Sunil K.; Okada, Takahiro [Abstract]; Ostman-Smith, Ingagerd [Abstract]; Ostroff, James W. [Abstract]; Otte, Jean-Bernard [Abstract]; Otte, Jean-Bernard [Abstract]; Oturanlar, Derya [Abstract]; Ow, E. Phillip [Abstract]
P: Pairolero, Peter C. [Abstract]; Park, Sang B. [Abstract]; Patti, Marco [Abstract]; Pearl, Jeffrey M. [Abstract]; Pellegrini, Carlos A. [Abstract]; Pemberton, L. Beaty [Abstract]; Penkoske, Patricia A. [Abstract]; Perez-Tamayo, R. Anthony [Abstract]; Pierangeli, Angelo [Abstract]; Pifarré, Roque [Abstract]
Q: Quinones, Jose A. [Abstract]; Quintana, Cid S. [Abstract]
R: Randolph, Judson G. [Abstract]; Rebuffat, Carlo [Abstract]; Redmond, J. Mark [Abstract]; Reed, Carolyn E. [Abstract]; Regan, John J. [Abstract]; Reison, Dennis S. [Abstract]; Rice, Thomas W. [Abstract]; Richardson, Jonathan; Ritchie, Andrew J.; Robertson, Murray A. [Abstract]; Rodgers, Bradley M. [Abstract]; Rose, Eric A. [Abstract]; Rosenbloom, Michael [Abstract]; Rossi, Claudia [Abstract]; Roviaro, Giancarlo [Abstract]; Ryan, William H. [Abstract]
S: Sabanathan, Sabaratnam; Sade, Robert M. [Abstract]; Saito, Akira [Abstract]; Santordli, Maria-Cristina [Abstract]; Saunders, Nigel R.; Scalambra, Silvio Marco [Abstract]; Scallan, Michael [Abstract]; Schachner, Ari [Abstract]; Schenkel, Felicia A. [Abstract]; Schuessler, Richard B. [Abstract]; Sciacca, Robert R. [Abstract]; Seifert, Paul E. [Abstract]; Seifert, Paul E. [Abstract]; Shahian, David M. [Abstract]; Shaul, Ezra [Abstract]; Shennib, Hani [Extract] [Full Text]; Shennib, Hani [Abstract]; Shimazaki, Yasuhisa [Abstract]; Shinonaga, Mayumi [Abstract]; Shore, Darryl [Abstract]; Shulkin, Allan N. [Abstract]; Shumway, Sara J. [Abstract]; Siderys, Harry; Smith, L. Richard [Abstract]; Smith, Peter K. [Abstract]; Snider, John M. [Abstract]; Snyder, Matthew L. [Abstract]; Solien, Eric E. [Abstract]; Somberg, Kenneth [Abstract]; Sorensen, Thomas J. [Abstract]; Souma, Takahiro [Abstract]; Spevak, Phillip J. [Abstract]; Spinale, Francis G. [Abstract]; Streitz, John M. [Abstract]; Stroud, Martha R. [Abstract]; Stuart, R. Scott [Abstract]; Stullken, Edward [Abstract]; Suemasu, Keiichi [Abstract]; Sugarbaker, David J. [Abstract]; Sugarbaker, David J. [Extract] [Full Text]; Sugarbaker, David J. [Extract] [Full Text]; Sullivan, Henry J. [Abstract]
T: Tabayashi, Koichi [Abstract]; Takahashi, Toshiki [Abstract]; Takeno, Yoshihito [Abstract]; Tatebe, Shoh [Abstract]; Tedder, Mark [Abstract]; Tio, Fermin O. [Abstract]; Tomizawa, Yasuko; Trastek, Victor F. [Abstract]; Tsubota, Noriyuki [Abstract]; Tsuchida, Masanori [Abstract]; Tsuchiya, Ryosuke [Abstract]
U: Urschel, Harold C. [Abstract]; Urschel, Harold C. [Extract] [Full Text]; Urschel, John D. [Abstract]
V: van der Linden, Jan [Abstract]; Van Raemdonck, Dirk E.ML [Abstract]; Van Trigt, Peter [Abstract]; Varoli, Federico [Abstract]; Vergani, Contardo [Abstract]; Vierra, Mark A. [Abstract]; Vigneswaran, Wickii T. [Abstract]
W: Wain, John C. [Abstract]; Wain, John C. [Abstract]; Wakabayashi, Akio [Abstract]; Way, Lawrence [Abstract]; Welch, Robert W. [Abstract]; Wells, Francis C. [Abstract]; Wernovsky, Gil [Abstract]; Wesslén, Örjan [Abstract]; Westaby, Stephen [Abstract]; White, William D. [Abstract]; White, William D. [Abstract]; Williams, Elizabeth A. [Abstract]; Williamson, Warren A. [Abstract]; Winkelstein, Jerry A. [Abstract]; Wolner, Ernst [Abstract]
Y: Yamaguchi, Akira [Abstract]
Z: Zannini, Lucio [Abstract]; Zaragoza, Ana Maria [Abstract]; Zehr, Kenton J. [Abstract]